Patent classifications
G01J3/42
Apparatus and method for performing gas analysis using optical absorption spectroscopy, such as infrared (IR) and/or UV, and use thereof in apparatus and method for performing dissolved gas analysis (DGA) on a piece of electrical equipment
An apparatus and associated a method are described for performing gas analysis on a gas sample. The method comprising exciting the gas sample with one or more electromagnetic energy sources and obtaining optical absorption signals associated with the gas sample prior to application of a catalytic process to the gas sample as well as during and/or after application of the catalytic process to the gas sample. The obtained optical absorption signals may then be processed using differential calculation approaches to derive information associated with the gas sample, which may include for example information conveying concentrations of certain specific gases in the gas sample. In some implementations, the optical absorption measurement system is configured to use the one or more electromagnetic energy sources to excite the gas sample to produce first optical absorption signals. The optical absorption measurement system is also configured to apply a catalytic process to the gas sample to derive a modified gas sample and to use the one or more electromagnetic energy sources to excite the modified gas sample to produce second optical absorption signals. Information may then be derived at least in part by processing the first optical absorption signals and second optical absorption signals. The apparatus and associated method may find practical uses in a variety of fields including, without being limited to, the field of dissolved gas analysis (DGA) for detecting/monitoring faults in liquid-insulated electrical equipment as well as equipment used for mine safety, particularly coal mines; equipment for analyzing gases that emerge from the bore hole during drilling for natural gas and oil and equipment for identifying gas leaks in underground natural gas lines as well as other areas.
Clutter avoidance in wide-band cavity ring-down data acquisition
Improved optical absorption spectroscopy of species having broad spectral features is provided by choosing frequencies to cover the spectral feature(s) of interest, where the frequencies are slightly adjusted as needed to avoid narrow spectral features from interfering chemical species (i.e., clutter). The resulting clutter avoidance provides improved optical spectroscopy of species having broad spectral features.
Clutter avoidance in wide-band cavity ring-down data acquisition
Improved optical absorption spectroscopy of species having broad spectral features is provided by choosing frequencies to cover the spectral feature(s) of interest, where the frequencies are slightly adjusted as needed to avoid narrow spectral features from interfering chemical species (i.e., clutter). The resulting clutter avoidance provides improved optical spectroscopy of species having broad spectral features.
SYSTEMS AND METHODS FOR AN ABSORBANCE DETECTOR WITH OPTICAL REFERENCE
Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.
SYSTEMS AND METHODS FOR AN ABSORBANCE DETECTOR WITH OPTICAL REFERENCE
Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.
OPTICAL DETECTOR FOR DETECTING GAS AND SUSPENDED MATTER
An optical detector (100, 200, 300) for detecting gas and suspended matter therein includes a test chamber (111, 113), at least one light source (12), a sensing object (131, 133), a test optical sensor (141) and a processor (19). The test chamber (111, 113) accommodates a gas to be analyzed. The at least one light source (12) emits an incident light that enters the test chamber (111, 113). The sensing object (131, 133) is exposed to gas in the test chamber (111, 113), receives the incident light, and reflects or transmits a portion of the incident light to form a test light. The test optical sensor (141) receives the test light and generates a detected spectral signal. The processor (19) receives the detected spectral signal and calculates a detection result according to the detected spectral signal.
OPTICAL DETECTOR FOR DETECTING GAS AND SUSPENDED MATTER
An optical detector (100, 200, 300) for detecting gas and suspended matter therein includes a test chamber (111, 113), at least one light source (12), a sensing object (131, 133), a test optical sensor (141) and a processor (19). The test chamber (111, 113) accommodates a gas to be analyzed. The at least one light source (12) emits an incident light that enters the test chamber (111, 113). The sensing object (131, 133) is exposed to gas in the test chamber (111, 113), receives the incident light, and reflects or transmits a portion of the incident light to form a test light. The test optical sensor (141) receives the test light and generates a detected spectral signal. The processor (19) receives the detected spectral signal and calculates a detection result according to the detected spectral signal.
SPECTROSCOPIC ANALYZER AND SPECTROSCOPIC ANALYSIS METHOD
A spectroscopic analyzer includes: an irradiator that irradiates a target measurement object with lights of a plurality of different wavelengths sequentially as a pre-irradiation, and, after the pre-irradiation, further irradiates the target measurement object with lights of a plurality of different wavelengths sequentially as a measurement-irradiation; a detector that, during the measurement-irradiation, detects reflected light, transmitted light, or a transmitted reflected light from the target measurement object at each of the plurality of different wavelengths of the measurement-irradiation and that outputs absorbance spectral data; a data analyzer that analyzes the absorbance spectral data; and a result display that displays analysis results related to components of the target measurement object.
SPECTROSCOPIC ANALYZER AND SPECTROSCOPIC ANALYSIS METHOD
A spectroscopic analyzer includes: an irradiator that irradiates a target measurement object with lights of a plurality of different wavelengths sequentially as a pre-irradiation, and, after the pre-irradiation, further irradiates the target measurement object with lights of a plurality of different wavelengths sequentially as a measurement-irradiation; a detector that, during the measurement-irradiation, detects reflected light, transmitted light, or a transmitted reflected light from the target measurement object at each of the plurality of different wavelengths of the measurement-irradiation and that outputs absorbance spectral data; a data analyzer that analyzes the absorbance spectral data; and a result display that displays analysis results related to components of the target measurement object.
SENSING DEVICE, DISPLAY DEVICE USING THE SENSOR DEVICE, AND CONTROL METHODS THEREOF
A display device includes a display, an illuminance sensor, an IR sensor disposed at a lower side of the display device, a memory to store correction data set by respective reflectance, and a processor. The processor is configured to calculate a reflectance of a floor surface, in an environment in which the display device is arranged, based on a sensing value of the IR sensor, obtain correction data corresponding to the calculated reflectance from stored correction data of the memory, correct an illuminance value sensed by using the illuminance sensor according to the obtained correction data, and control an operation of the display based on the corrected illuminance value.