Optical computing devices may include capacitance-based nanomaterial detectors. For example, an optical computing device may include a light source that emits electromagnetic radiation into an optical train extending from the light source to a capacitance-based nanomaterial detector; a material positioned in the optical train to optically interact with the electromagnetic radiation and produce optically interacted light; and the capacitance-based nanomaterial detector comprising one or more nano-sized materials configured to have a resonantly-tuned absorption spectrum and being configured to receive the optically interacted light, apply a vector related to the characteristic of interest to the optically interacted light using the resonantly-tuned absorption spectrum, and generate an output signal indicative of the characteristic of interest.

According to an embodiment of the disclosure, there is provided an electronic device including: an optical element that is fixed and is configured to split incident light reflected from an object into two or more incident light beams traveling along two or more light paths; an optical sensor that is spaced a separation distance from the optical element such that the split incident light beams form an interference area on a light receiving surface and is configured to detect the incident light; and at least one processor configured to determine state information about the object based on similarity between a first spectrum acquired from the detected incident light and at least one reference spectrum.

Optical imaging or spectroscopy described can use laminar optical tomography (LOT), diffuse correlation spectroscopy (DCS), or the like. An incident beam is scanned across a target. An orthogonal or oblique optical response can be obtained, such as concurrently at different distances from the incident beam. The optical response from multiple incident wavelengths can be concurrently obtained by dispersing the response wavelengths in a direction orthogonal to the response distances from the incident beam. Temporal correlation can be measured, from which flow and other parameters can be computed. An optical conduit can enable endoscopic or laparoscopic imaging or spectroscopy of internal target locations. An articulating arm can communicate the light for performing the LOT, DCS, or the like. The imaging can find use for skin cancer diagnosis, such as distinguishing lentigo maligna (LM) from lentigo maligna melanoma (LMM).

Optical imaging or spectroscopy described can use laminar optical tomography (LOT), diffuse correlation spectroscopy (DCS), or the like. An incident beam is scanned across a target. An orthogonal or oblique optical response can be obtained, such as concurrently at different distances from the incident beam. The optical response from multiple incident wavelengths can be concurrently obtained by dispersing the response wavelengths in a direction orthogonal to the response distances from the incident beam. Temporal correlation can be measured, from which flow and other parameters can be computed. An optical conduit can enable endoscopic or laparoscopic imaging or spectroscopy of internal target locations. An articulating arm can communicate the light for performing the LOT, DCS, or the like. The imaging can find use for skin cancer diagnosis, such as distinguishing lentigo maligna (LM) from lentigo maligna melanoma (LMM).

A system for processing Raman scattering light from a sample is provided. The system includes a source, a digital mirror device (DMD), a detector, and an analyzer. The DMD is configured to reflect Raman scattering light and includes micromirrors selectively controllable between ON and OFF states. The detector is configured to detect Raman scattering light and to produce signals representative of the Raman scattering light. The analyzer is in communication with the light source, the DMD, the detector, and a memory storing instructions, which instructions when executed cause the processor to: a) control the light source to produce a beam of light for interrogating the sample; b) control the DMD to place in an ON or OFF state based on one or more known spectral shapes stored in the memory; and c) process the Raman scattering light reflected by the micromirrors in the ON state.

An identification apparatus 1000 includes a light collecting unit 20 configured to collect scattered light from a sample, spectroscopic elements 150l and 150h configured to disperse light from the light collecting unit 20, an imaging unit 170 that includes a plurality of light detection elements arrayed in a row direction 172r and a column direction 172c and to which optical spectra from the spectroscopic elements 150l and 150h are projected along the row direction 172r, and an acquisition unit 30 configured to acquire spectral information about the sample based on an output signal from the imaging unit 170. The optical spectra corresponding to the sample are projected to the imaging unit 170 discontinuously in at least one of the row direction 172r and the column direction 172c.

A small scale and low cost spectral sensing system designed primarily for multi-component fluids that provides a compact, low cost platform for analyzers or chemical sensors with limited number of optical and mechanical components featuring a light source, an optical interface with the sample, and a custom detector (multi-element). A single detector element has a specific wavelength, defined by a filter that can be used to select and measure specific chemical compounds. Multiple detector elements are combined to create a multi-channel detector capable of measuring a broad range of wavelengths from ultraviolet (UV) to near and mid-infrared wavelengths. The fabricated sensor can be configured for almost any class of material including gases, vapors, and liquids, with extension to solids. This is linked to the use of the custom detectors featuring filters tailored to specific substances in a broad spectral range from the UV to infrared.

A small scale and low cost spectral sensing system designed primarily for multi-component fluids that provides a compact, low cost platform for analyzers or chemical sensors with limited number of optical and mechanical components featuring a light source, an optical interface with the sample, and a custom detector (multi-element). A single detector element has a specific wavelength, defined by a filter that can be used to select and measure specific chemical compounds. Multiple detector elements are combined to create a multi-channel detector capable of measuring a broad range of wavelengths from ultraviolet (UV) to near and mid-infrared wavelengths. The fabricated sensor can be configured for almost any class of material including gases, vapors, and liquids, with extension to solids. This is linked to the use of the custom detectors featuring filters tailored to specific substances in a broad spectral range from the UV to infrared.

A photodetector includes: a semiconductor substrate; a mesa portion formed on a major surface of the semiconductor substrate to extend along an optical waveguide direction; a first contact layer; a second contact layer; a first electrode; and an air bridge wiring electrically connected to the first contact layer and the first electrode. When viewed in a direction perpendicular to the major surface of the semiconductor substrate, a length of the mesa portion in the optical waveguide direction is longer than a length of the mesa portion in a direction perpendicular to the optical waveguide direction. The air bridge wiring is led out from the first contact layer to one side in the direction perpendicular to the optical waveguide direction, and is bridged between the first contact layer and the first electrode.

A photodetector includes: a semiconductor substrate; a mesa portion formed on a major surface of the semiconductor substrate to extend along an optical waveguide direction; a first contact layer; a second contact layer; a first electrode; and an air bridge wiring electrically connected to the first contact layer and the first electrode. When viewed in a direction perpendicular to the major surface of the semiconductor substrate, a length of the mesa portion in the optical waveguide direction is longer than a length of the mesa portion in a direction perpendicular to the optical waveguide direction. The air bridge wiring is led out from the first contact layer to one side in the direction perpendicular to the optical waveguide direction, and is bridged between the first contact layer and the first electrode.