Patent classifications
G01J5/28
Plasmon-enhanced below bandgap photoconductive terahertz generation and detection
Disclosed are systems and methods for improving applications involving the generation and detection of electromagnetic radiation at terahertz (THz) frequencies. Embodiments of the systems and methods include the fabrication and use of plasmonic devices that enhance light-matter interaction at the nanometer scale by extreme focusing with nanostructured metals. This plasmonic enhancement is used to produce high efficiency THz photoconductive switches that combine the benefits of low-temperature grown GaAs while using mature 1.55 m femtosecond lasers operating with photon energy below the GaAs band-gap.
Plasmon-enhanced below bandgap photoconductive terahertz generation and detection
Disclosed are systems and methods for improving applications involving the generation and detection of electromagnetic radiation at terahertz (THz) frequencies. Embodiments of the systems and methods include the fabrication and use of plasmonic devices that enhance light-matter interaction at the nanometer scale by extreme focusing with nanostructured metals. This plasmonic enhancement is used to produce high efficiency THz photoconductive switches that combine the benefits of low-temperature grown GaAs while using mature 1.55 m femtosecond lasers operating with photon energy below the GaAs band-gap.
Spectral conversion element for electromagnetic radiation
A spectral conversion element for electromagnetic radiation includes Terahertz antennas and infrared antennas which are distributed in pixel zones. The Terahertz antennas and the infrared antennas which are in one same pixel zone are thermally coupled, and those which are in different pixel zones are uncoupled. Such an element enables the capture of images which are formed with Terahertz radiation, by using an infrared image detector.
Spectral conversion element for electromagnetic radiation
A spectral conversion element for electromagnetic radiation includes Terahertz antennas and infrared antennas which are distributed in pixel zones. The Terahertz antennas and the infrared antennas which are in one same pixel zone are thermally coupled, and those which are in different pixel zones are uncoupled. Such an element enables the capture of images which are formed with Terahertz radiation, by using an infrared image detector.
METHODS AND APPARATUSES FOR MEASURING OPTICAL RADIATION
Optical detectors and methods of forming them are provided. The detector includes: a controller, pump and probe laser generators that generate modulated pump laser and probe lasers, respectively, a microring cavity that receives the lasers, a microbridge, and a photodetector. The microring cavity includes covered and exposed portions. The microbridge is suspended above the exposed portion and interacts with an evanescent optical field. The wavelength and modulated power of the pump laser are controlled to generate the evanescent optical field that excites the microbridge to resonance. The microbridge absorbs optical radiation which changes the resonance frequency proportionately. The probe laser is modulated in proportion to a vibration amplitude of the microbridge to form a modulated probe laser which is provided to the photodetector. The controller receives data from the photodetector, determines a change in resonance frequency, and calculates the amount of absorbed radiation from the change in resonance frequency.
METHODS AND APPARATUSES FOR MEASURING OPTICAL RADIATION
Optical detectors and methods of forming them are provided. The detector includes: a controller, pump and probe laser generators that generate modulated pump laser and probe lasers, respectively, a microring cavity that receives the lasers, a microbridge, and a photodetector. The microring cavity includes covered and exposed portions. The microbridge is suspended above the exposed portion and interacts with an evanescent optical field. The wavelength and modulated power of the pump laser are controlled to generate the evanescent optical field that excites the microbridge to resonance. The microbridge absorbs optical radiation which changes the resonance frequency proportionately. The probe laser is modulated in proportion to a vibration amplitude of the microbridge to form a modulated probe laser which is provided to the photodetector. The controller receives data from the photodetector, determines a change in resonance frequency, and calculates the amount of absorbed radiation from the change in resonance frequency.
INFRARED DETECTION APPARATUS
A lens allows infrared light to pass therethrough. An infrared sensor includes infrared detection elements arranged in two or more columns. The infrared sensor is rotated around a scan rotation axis that passes through part of the lens to scan a detection range, and outputs an output signal indicating a thermal image of the detection range. At least two infrared detection elements in the infrared sensor are located at positions displaced from each other with respect to the scan rotation axis. Among the infrared detection elements, the number of first infrared detection elements having a smaller half-width of a point spread function in a scan direction than that in the direction of the scan rotation axis is larger than the number of second infrared detection elements having a larger half-width of a point spread function in the scan direction than that in the direction of the scan rotation axis.
INFRARED DETECTION APPARATUS
A lens allows infrared light to pass therethrough. An infrared sensor includes infrared detection elements arranged in two or more columns. The infrared sensor is rotated around a scan rotation axis that passes through part of the lens to scan a detection range, and outputs an output signal indicating a thermal image of the detection range. At least two infrared detection elements in the infrared sensor are located at positions displaced from each other with respect to the scan rotation axis. Among the infrared detection elements, the number of first infrared detection elements having a smaller half-width of a point spread function in a scan direction than that in the direction of the scan rotation axis is larger than the number of second infrared detection elements having a larger half-width of a point spread function in the scan direction than that in the direction of the scan rotation axis.
SUBSTRATE HEAT-TREATING APPARATUS USING LASER LIGHT-EMITTING DEVICE
The present disclosure discloses a substrate heat-treating apparatus including a process chamber in which a flat substrate to be heat treated is placed, the process chamber comprising a beam transmitting plate placed below the flat substrate and an infrared transmitting plate placed above the flat substrate; a beam irradiating module for irradiating a VCSEL beam having a single wavelength to a lower surface of the flat substrate through the beam transmitting plate; and an emissivity measuring configured to measure the laser beam reflected from the lower surface or an upper surface the flat substrate, thereby measuring the emissivity of the flat substrate.
APPARATUS FOR MEASURING TEMPERATURE USING DIAMOND NITROGEN-VACANCY CENTER SENSOR AND MANUFACTURING METHOD THEREFOR
The present disclosure relates to an apparatus for measuring temperature distribution in a wide area using a diamond nitrogen vacancy center sensor and a method for fabricating the same, and disclosed is a diamond nitrogen-vacancy center sensor capable of measuring a temperature in a wide area including: a plurality of diamond thin films that are provided at different positions on an insulator and are not connected to each other, and it will be possible to measure temperature distribution in a wide area using the same.