Patent classifications
G01J5/601
Cold stage actuation of optical elements including an optical light shield and a lenslet array connected to a cold finger
A cold stage actuation system employs an optical assembly having an adapter ring mounted to a flange connected to a cold finger which extends into a Dewar housing. The flange supports a detector array. A resilient cold shield extends from the adapter ring to a lens holder, the lens holder connected to the resilient cold shield distal from the adapter ring. The lens holder supports a lenslet array. An optical light shield extends from the lens holder oppositely from the resilient cold shield to proximate a window in the Dewar housing. A motor is supported within the Dewar housing. An insulating translation arm connects the motor to the optical light shield, whereby operation of the motor induces the insulating translation arm to extend or retract the optical assembly concentric with an optical axis.
Multi-spectral temperature measuring device based on adaptive emissivity model and temperature measuring method thereof
A multi-spectral temperature measuring device based on adaptive emissivity model and temperature measuring method thereof are provided, which is configured to measure the temperature of the surface of an object under a high temperature background. The present invention relates to the technical field of radiation temperature measurement. The present invention provides a multi-spectral temperature measurement device based on an adaptive emissivity model, includes a pyrometer, a radiation detector, a constant temperature furnace, a cooling cavity, a cold air inlet pipe, a cold air outlet tube, and a thermocouple and thermocouple acquisition card. In order to more accurately measure the surface temperature of the object in a high-temperature environment, a BP network is provided to adaptively find the emissivity model, and through pre-training the network, the network has a high degree of recognition, and then classifies the spectral curve to accurately output the corresponding emissivity model.
Systems and Methods for High-Speed, Spectroscopic, Gas-Phase Thermometry
Systems and methods for measuring temperature in an environment by creating a first beam having an energy of about 50 mJ/pulse, and a pulse duration of about 100 ps. A second beam is also created, having an energy of about 2.3 mJ/pulse, and a pulse duration of about 58 ps. The first beam and the second beam are directed into a probe region, thereby expressing an optical output. Properties of the optical output are measured at a sampling rate of at least about 100 kHz, and temperature measurements are derived from the measured properties of the optical output. Such systems and methods can be used to measure temperature in environments exhibiting highly turbulent and transient flow dynamics.
Method for spatially-localized gas-phase temperature measurements through ceramic materials
A method of measuring a temperature of a thermally-insulated, high temperature system. The method includes directing a first electromagnetic energy into the high temperature system so that the first electromagnetic energy may cause multi-photon ionization of a molecular or atomic species within the high temperature system. A second electromagnetic energy resulting from the multi-photon ionization is detected through a thermally-insulating wall of the high temperature system. The detected second electromagnetic energy is related to a temperature within the high temperature system.
Systems and methods for high-speed, spectroscopic, gas-phase thermometry
Systems and methods for measuring temperature in an environment by creating a first beam having an energy of about 50 mJ/pulse, and a pulse duration of about 100 ps. A second beam is also created, having an energy of about 2.3 mJ/pulse, and a pulse duration of about 58 ps. The first beam and the second beam are directed into a probe region, thereby expressing an optical output. Properties of the optical output are measured at a sampling rate of at least about 100 kHz, and temperature measurements are derived from the measured properties of the optical output. Such systems and methods can be used to measure temperature in environments exhibiting highly turbulent and transient flow dynamics.
Indicator device and method
An indicator device including a protective layer, an optically reflective layer, a polymeric material layer disposed between and coupling the protective layer to the optically reflective layer, and a dye disposed within the polymeric material layer, the dye being sensitive to external stimuli.
Tunable Infrared Pixels via Monolithically Integrated Dynamic Metasurfaces
A monolithically integrated, tunable infrared pixel comprises a combined broadband detector and graphene-enabled tunable metasurface filter that operate as a single solid-state device with no moving parts. Functionally, tunability results from the plasmonic properties of graphene that are acutely dependent upon the carrier concentration within the infrared. Voltage induced changes in graphene's carrier concentration can be leveraged to change the metasurface filter's transmission thereby altering the colors of light reaching the broadband detector and hence its spectral responsivity. The invention enables spectrally agile infrared detection with independent pixel-to-pixel spectral tunability.
RAPID TEMPERATURE MEASUREMENT BY WAVELENGTH MODULATION SPECTROSCOPY
Aspects of the present disclosure describe rapid temperature measurement by wavelength modulation spectroscopy (WMS) that determines gas temperature from 2 signals from two absorption lines by WMS methodologies even when the gas concentration is sufficiently high to saturate optical absorptions. In sharp contrast to the prior art, rapid temperature measurement by WMS according to aspects of the present disclosure employs both a 2 signal ratio and gas concentration determined from the 2 signal.
THERMAL DETECTOR AND THERMAL DETECTOR ARRAY
A wafer-level integrated thermal detector comprises a first wafer and a second wafer (W1, W2) bonded together. The first wafer (W1) includes a dielectric or semiconducting substrate (100), a dielectric sacrificial layer (102) deposited on the substrate, a support layer (104) deposited on the sacrificial layer or the substrate, a suspended active element (108) provided within an opening (106) in the support layer, a first vacuum-sealed cavity (110) and a second vacuum-sealed cavity (106) on opposite sides of the suspended active element. The first vacuum-sealed cavity (110) extends into the sacrificial layer (102) at the location of the suspended active element (108). The second vacuum-sealed cavity (106) comprises the opening of the support layer (104) closed by the bonded second wafer. The thermal detector further comprises front optics (120) for entrance of radiation from outside into one of the first and second vacuum-sealed cavities, aback reflector (112) arranged to reflect radiation back into the other one of the first and second vacuum-sealed cavities, and electrical connections (114) for connecting the suspended active element to a readout circuit (118).
COLD STAGE ACTUATION OF OPTICAL ELEMENTS
A cold stage actuation system employs an optical assembly having an adapter ring mounted to a flange connected to a cold finger which extends into a dewar. The flange supports a detector array. A resilient cold shield extends from the adapter ring to a lens holder, the lens holder connected to the resilient cold shield distal from the adapter ring. The lens holder supports a lenslet array. An optical light shield extends from the lens holder oppositely from the resilient cold shield to proximate a window in the dewar. A motor is supported within the dewar. An insulating translation arm connects the motor to the optical light shield, whereby operation of the motor induces the insulating translation arm to extend or retract the optical assembly concentric with an optical axis.