Patent classifications
G01J5/602
Characterizing tropospheric boundary layer thermodynamic and refractivity profiles utilizing selected waveband infrared observations
Apparatus and methods are disclosed utilizing selected infrared waveband observations to determine selected profiles of interest. A correlative system is constructed and installed at a processor. Thermal and refractivity profiles and structure in a waveband of interest are extracted from observed infrared spectrum single waveband observations received for processing at the processor by the correlative system. The output provides the selected profiles of interest in the waveband of interest. The apparatus includes an infrared receiver and means for measuring angular displacement of received emissions relative to a horizon. The processor converts received emission into equivalent Planck blackbody temperatures across the observations and correlates structure and vertical distribution of the temperatures to provide thermodynamic and refractivity profiles of interest.
MULTIPLE WAVELENGTH TEMPERATURE DETECTOR FOR RESISTIVE HEATING PROCESSES
A temperature sensing system for a resistive welding process for a tube performs repeatable temperature measurement using a camera to detect multiple distinct visible light wavelengths even as the ambient environment in the view path changes. Sensed colors in a field of view in the vicinity of a weld are output to a computing element that calculates a corresponding temperature and alerts an operator when the sensed color exceeds a preset color range.
Radiation temperature measuring device
A radiation temperature measuring device includes: an infrared sensor that detects a wavelength including an absorption band by atmosphere; an absorption rate calculation unit that calculates an absorption rate by the atmosphere when measuring a surface temperature of an object from output of the infrared sensor; an output storage unit that stores conversion information for converting the output of the infrared sensor into the surface temperature of the object; a surface temperature calculation correction unit that calculates the surface temperature of the object from the output of the infrared sensor, the absorption rate calculated by the absorption rate calculation unit, and the conversion information; and an absorption rate storage unit that stores in advance the absorption rate by the atmosphere when the conversion information is set, in which the calculated surface temperature of the object is corrected with the absorption rate stored in the absorption rate storage unit.
DETERMINATION OF RISK LEVEL FOR PARTICLES
A system for determining a risk level for particles moving along a path of movement from a first position to a second position includes a sensor arrangement and processing device. The sensor arrangement includes at least one set of sensing elements including at least two sensing elements arranged to co-operate with mutually separated sensing zones along the path of movement of the particles to detect a signal related to temperature of the particles. The processing device is arranged to: receive signals from the sensor arrangement; form signals from the sensing elements into a pulse train when a particle moves through field-of-view of the sensor arrangement; and based on the pulse train, determine a risk level for the particles. The processing device is arranged to adapt at least one parameter used in the determination of the risk level based on at least one property of the particles moving along the path of movement from the first position to the second position.
Infrared photodetection system
An infrared photodetection system is provided that is capable of measuring infrared light up to high-temperature regions while improving a temperature resolution for low-temperature regions without increasing image-acquisition time even if the measuring temperature range varies. The infrared photodetection system is set up to exhibit sensitivity spectrum SSP1 for high sensitivity (for low temperature use) and sensitivity spectrum SSP2 for low sensitivity (for high temperature use) in the transmission band of the bandpass filter when different voltages are applied to a quantum-dot infrared photodetector. The infrared photodetection system then integrates temperature data for the infrared light detected using sensitivity spectrum SSP1 and temperature data for the infrared light detected using sensitivity spectrum SSP2, in order to output a temperature distribution in a measurement region.
INFRARED DETECTION APPARATUS
Provided is an infrared detection apparatus without a bandpass filter and capable of reducing an error produced when a temperature of an object is calculated. A detection unit has a quantum-dot stacked structure. A first voltage and a second voltage are respectively provided for setting a first responsivity peak wavelength and a second responsivity peak wavelength to be used for detecting an infrared ray in the detection unit. The second responsivity peak wavelength is different from the first responsivity peak wavelength. A detector detects (i) a first photocurrent to be output from the detection unit when the first voltage is applied to the photoelectric conversion layer, and (ii) a second photocurrent to be output from the detection unit when the second voltage is applied to the photoelectric conversion layer. A calculator calculates a temperature of an object based on the first photocurrent and the second photocurrent detected by the detector.
Method of measuring temperature of an object to be measured, dust temperature and dust concentration
A first radiance meter is directed toward an object to be measured, radiance is measured through a space where dust is present with the use of at least two wavelengths by the first radiance meter, second radiance meters which are equal in number to one or more objects having temperatures different from that of the object to be measured are directed toward the objects, radiances are measured through the space with the use of at least two wavelengths by the second radiance meters respectively, and a temperature of the object to be measured, a temperature of the dust, and concentration of the dust are measured from the radiances measured by the first radiance meter and the second radiance meters.
Multispectral plasmonic thermal imaging device
A computer-implemented method and thermal imaging device includes a layer of plasmonic material and a processor. The layer of plasmonic material receive electromagnetic radiation from an object and generates radiance measurements of the electromagnetic radiation at a plurality of wavelengths. The processor determines an emissivity and temperature of the object from the radiance measurements and forms a thermal-based electronic image of the object from the determined emissivity and temperature.
Multispectral plasmonic thermal imaging device
A computer-implemented method of forming a thermal-based electronic image of an object that includes receiving electromagnetic radiation emitted by the object at an optically sensitive layer including a superpixel having a plurality of pixels. Each pixel of the plurality of pixels includes a plasmonic absorber having a characteristic resonance wavelength and that generates a radiance measurement of the electromagnetic radiation at its characteristic resonance wavelength. The method further provides for determining, at a processor, an emissivity and temperature for the electromagnetic radiation received at the superpixel using the radiance measurements obtained at the pixels of the superpixel. In addition, the method provides for forming an image of the object from the determined emissivity and temperature.
Multispectral plasmonic thermal imaging device
A computer-eimplemented thermal imaging device having an optically-sensitive layer that includes a superpixel having at least one pixel. The at least one pixel includes a plasmonic absorber configured to obtain radiance measurements of electromagnetic radiation emitted from an object at a plurality of wavelengths. The device further includes a processor configured to determine an emissivity and temperature for the electromagnetic radiation received at the plasmonic material from the object using the radiance measurements and to form an image of the object from the determined emissivity and temperature.