A display device may include a display panel, a touch member disposed on the display panel and configured to sense a touch signal, a cover panel sheet disposed under the display panel and having an opening via which at least a part of the display panel is exposed, a first vibrating element disposed in the opening, a touch drive chip electrically connected to the touch member and configured to detect touch coordinates in response to the touch signal, a processor electrically connected to the touch drive chip and configured to receive the touch coordinates to generate a pattern signal corresponding to the touch coordinates, and a haptic drive chip electrically connected to the processor and configured to receive the pattern signal to control the first vibrating element. The first vibrating element may be operated differently for different periods of time.

Disclosed is a load cell having a frame that includes a first and a second mounting surface. Each mounting surface is arranged on a common horizontal plane symmetrically about a central vertical axis. First and second lateral surfaces are arranged perpendicular to the first and second mounting surfaces. One or more mounting fixtures are located on the load cell at the first and second mounting surfaces and configured to attach to a support structure or a loading fixture. One or more force sensors are arranged symmetrically about the central vertical axis. One or more cavities extend the width of the frame and are arranged between a mounting fixture and the force sensors.

A transducer structure for converting a deformation along an axis into a corresponding deformation on a plane orthogonal to the axis itself, including: two end plates facing each other and aligned along a common reference axis (X); connection members projecting radially from each end plate according to respective different directions; lateral bars connecting the end plates to one another through two connection members. The connection members are deformable within respective deformation planes to allow relative movements between the end plates and the lateral bars such as to convert an axial movement of mutual approach between the two end plates into a corresponding radial movement of the lateral bars away from the reference axis (X), and vice-versa.

Aspects of the subject disclosure include a pressure-sensing device consisting of a housing including a membrane and one or more piezoresistive elements disposed on the membrane to sense a displacement due to a deflection of the membrane. A first set of electrodes is disposed over the membrane, and a second set of electrodes is disposed on a permeable port of the device at a distance from the membrane. The first and second sets of electrodes form an electrostatic actuator to exert a repulsive force onto the membrane to reduce the deflection of the membrane.

The potential difference between a piezo-resistive portion and a shield film is to be reduced. A semiconductor device is provided, including: a semiconductor substrate having provided therein a hollowed portion, a piezo-resistive portion provided in a region of the semiconductor substrate above the hollowed portion; an insulating film provided above the piezo-resistive portion; and a conductive shield film provided above the piezo-resistive portion with the insulating film intervening therebetween, wherein two different parts of the shield film are connected to different potentials. In this manner, the potential difference between a piezo-resistive portion and a shield film can be reduced.

Microelectronic structure comprising at least one movable mass that is mechanically connected to a first mechanical element by a first mechanically linking connector and to a second mechanical element (24) by electrically conductive second mechanically linking connector, and a device for electrically biasing the second mechanically linking connector, the second mechanically linking connector being such that they are the seat of a thermo-piezoresistive effect, the second linking connector and the movable mass being placed with respect to each other so that a movement of the movable mass applies a mechanical stress to the second linking connector, wherein the electrically biasing device are DC voltage biasing device and form, with at least the second mechanically linking connector, a thermo-piezoresistive feedback electric circuit.

Systems and methods for assessing strain in structural components are disclosed. Structural component may have geometric patterns of grooves, with the grooves in the geometric pattern each having a groove width. The method may include illuminating the geometric pattern of grooves with a first light at a first wavelength that corresponds to the groove width to create diffraction when the first light hits the geometric pattern of grooves and corresponding changes in the wavelength of the light reflected from the geometric pattern of grooves indicating changes in the groove widths due to strain caused when the structural component is exposed to environmental conditions, detecting the wavelength of the light reflected from the geometric pattern of grooves, and correlating the detected wavelength of the light reflected from the geometric pattern of grooves to the strain in the structural components.

A deformation sensing apparatus comprises a propagation channel, a transmitter coupled to a first end of the propagation channel, a receiver coupled to a second end of the propagation channel, and a controller. The propagation channel is deformable and the controller instructs the transmitter to transmit a signal, instructs the receiver to capture one or more measurements of the transmitted signal, and determines a bend in the propagation channel based on the one or more measurements. In one embodiment, the transmitter is a light source, the propagation channel is an optical fiber, and the receiver is a photodiode. The propagation channel is made of a material that has a variation in a refractive index responsive to applied mechanical stress. The deformation sensing apparatus may also include a polarizer positioned between the transmitter and the propagation channel and a wave plate positioned between the propagation channel and the receiver.

a pressure sensor 1 according to the first aspect of the invention includes: a substrate 50; and a functional element 40 which is laid on the substrate 50 and is composed of functional titanium oxide including crystal grains of at least one of -phase trititanium pentoxide (-Ti.sub.3O.sub.5) and -phase trititanium pentoxide (-Ti.sub.3O.sub.5) and having the property that at least a portion of crystal grains of at least one of -phase trititanium pentoxide (-Ti.sub.3O.sub.5) and -phase trititanium pentoxide (-Ti.sub.3O.sub.5) change into crystal grains of titanium dioxide (TiO.sub.2) when the functional titanium oxide is heated to 350 C. or higher. The substrate 50 includes a substrate thin-film section 51 having a thin film form in which the thickness in the stacking direction of the substrate 50 and the functional element 40 is smaller than that in the other directions.

The present document describes methods and systems for the automatic inspection of material quality. A set of lights with a geometric pattern is cast on a material to be analyzed. Depending on the material being inspected, same may act as a mirror and the reflected image is captured by a capture device, or the light passes through the material being inspected and the image is captured by a capture device. Defects in the material can be detected by the distortion caused by same in the pattern of the reflected image or passing through. Finally, software is used to identify and locate these distortions, and consequently the defects in the material. This classification of defects is carried out using artificial intelligence techniques.