The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4).

A system for determining a rounded value of an optical feature of an ophthalmic lens including determining a first test value and a first variation increment, performing a first trial of said subjective test wherein two first different optical situations are determined based on at least the first test value, determining a second test value based on the first test value, on the first variation increment and on the result of the first trial, performing a second trial of said subjective test wherein two second different optical situations are determined based on at least the second test value, determining an intermediary value based on the result of the first trial and on the result of the second trial, and determining said rounded value by rounding said intermediary value to a reference value, said rounding modifying the dioptric correction of said ophthalmic lens by less than a predetermined basic dioptric value.

The invention relates to a collimator for testing a camera (6), comprising a collimator housing (1), wherein the collimator housing (1) has a longitudinal wall (8, 9) and two end walls (10, 11), the first end wall (10) having a light source (2) and the second end wall (11) having a lens (5), a reticle (4) being disposed between the lens (5) and the light source, with the reticle (4) being disposed obliquely with respect to the lens (5) and/or obliquely with respect to the longitudinal wall (8, 9) in the collimator housing (1).

Embodiments described herein relate to an optical device metrology system including a light source to emit a light and a non-polarizing beam splitter to split the light into a first photodetector light path and an optical light path. A first photodetector is disposed in the first photodetector light path and measures a total power of the light. The optical device substrate is disposed in the optical light path and splits the light into a second and a third photodetector light path. A second photodetector is disposed in the second photodetector light path from the optical device substrate. The second photodetector measures a reflected power of the light. A third photodetector is disposed in the third photodetector light path. The third photodetector measures a transmitted power of the light. The controller receives measurements from the first, second, and third photodetectors to calculate a percentage light loss within the optical device substrate.

A method, a computer program product, and a system for determining an optical parameter of an optical lens, as well as a related method for producing the optical lens by adjusting the optical parameter are disclosed. The method includes: a) capturing an image picturing the optical lens by using a camera; and b) determining an optical parameter of the optical lens by processing the image, wherein the camera generates a signal related to a position of a focus, and the optical parameter of the optical lens is determined by using the signal related to the position of focus.

The method and the system allow determining the optical parameter of the optical lens in a direct fashion by applying the signal related to the position of the focus as generated by the camera as a measured value for the optical parameter of the optical lens.

The blocker described comprises: a lens illumination light source; a light transmission and reflection device to reflect/transmit the light; an image sensor to detect light reflected by the light transmission and reflection device and thereby obtain an lens image; a lens meter to detect the light that has passed through the light transmission and reflection device to thereby measure lens characteristics; and a blocking member to attach a leap block to the lens. The light transmission and reflection device comprises: a first reflection plate having a central hole; a first rotating cylinder to be coupled to and to rotate the first reflection plate; a second rotating cylinder located inside and to rotate the first rotating cylinder; a second reflection plate, adjusted by the second rotating cylinder and configured to open or block the central hole in the first reflection plate; and driving means configured to drive the second rotating cylinder.

An environmental testing laboratory includes a supply port allowing air-conditioned air at a predetermined temperature supplied through the supply port at a predetermined speed, a discharge port facing the supply port and allowing the air be discharged through the discharge port, a flow passage disposed between the supply port and the discharge port and allowing the air to pass through the flow passage part, an installation part disposed at a center of the flow passage and allowing a measurement target in the installation part, and a flow straightening member which is disposed between a sidewall surface of the flow passage part and the installation part and which is configured to straighten an airflow of the air-conditioned air. The sidewall surface of the flow passage part and the first flow straightening member are disposed in parallel with the airflow of the air-conditioned air from the supply port to the discharge port.

A structure for, and method of, forming a first optoelectronic circuitry that generates an optical signal, a second optoelectronic circuitry that receives an optical signal, and a loopback waveguide that connects the output from the first optoelectronic circuitry to the second optoelectronic circuitry on an interposer substrate are described. The connected circuits, together comprising a photonic integrated circuit, are electrically tested using electrical signals that are provided via probing contact pads on the PIC die. Electrical activation of the optoelectrical sending devices and the subsequent detection and measurement of the optical signals in the receiving devices, in embodiments, provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

A method and apparatus for measuring optical characteristics of an augmented reality device are disclosed. A method of measuring optical characteristics of an augmented reality device according to an exemplary embodiment of the present invention includes: taking a test image including a plurality of patterns that is output on a virtual plane by the augmented reality device, using at least one camera disposed around a predetermined measurement reference position; acquiring field of view information including information about the field of view of the at least one camera, and photographing system information including information about the arrangement of the at least one camera; and calculating the coordinates of a plurality of patterns with respect to the measurement reference position on the basis of a plurality of captured images taken by the at least one camera, field of view information, and photographing system information.

Method for determining a parameter of an optical equipment, the method comprising: an optical equipment positioning step, during which an optical equipment comprising a pair of optical lenses mounted on a spectacle frame is positioned in a first position, a portable electronic device positioning step, during which a portable electronic device comprising an image acquisition module is positioned in a second position determined and/or known relatively to the first position so as to acquire an image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position, a parameter determining step, during which at least one optical parameter of the optical equipment is determined based on the image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position.