A method for assessing the similarity between a power profile of a manufactured optic device and a nominal power profile upon which the power profile of the manufactured optic device is based. The method comprises measuring the power profile of manufactured optic device, identifying a region of interest from the measured power profile of manufactured optic device, and applying an offset to the measured power profile to substantially minimize a statistical quantifier for quantifying the similarity between the nominal power profile and the offset measured power profile. The method further comprises comparing the offset and the statistical quantifier to predefined quality control metrics, determining whether the measured power profile meets the predefined quality control metrics based, at least in part on the comparison. In exemplary embodiments, the method may further comprise determining whether to associate the manufactured optic device with another nominal power profile, if the measured power profile does not meet the predefined quality control metrics.

A laser eye surgery system focuses light along a beam path to a focal point having a location within a lens of the eye. The refractive index of the lens is determined in response to the location. The lens comprises a surface adjacent a second material having a second refractive index. The beam path extends a distance from the surface to the focal point. The index is determined in response to the distances from the surface to the targeted focal point and from the surface to the actual focal point, which corresponds to a location of a peak intensity of an optical interference signal of the focused light within the lens. The determined refractive index is mapped to a region in the lens, and may be used to generate a gradient index profile of the lens to more accurately place laser beam pulses for incisions.

The present invention provides an ellipsometry device and an ellipsometry method whereby measurement efficiency can be enhanced. In this method, an object is illuminated by spherical-wave-like illumination light Q linearly polarized at 45 (S1), and an object light O, being a reflected light, is acquired in a hologram I.sub.OR using a spherical-wave-like reference light R having a condensing point near the condensing point of the illumination light Q, and a hologram I.sub.LR of the reference light R is furthermore acquired using a spherical-wave reference light L having the same condensing point as that of the illumination light Q (S2). The holograms are separated into p- and s-polarized light holograms I.sup.K.sub.OR, I.sup.K.sub.LR, =p, s and processed to extract object light waves, and object light spatial frequency spectra G.sup.K(u, v), =p, s are generated (S3) (S4). Ellipsometric angles (), () are obtained for each incident angle from the amplitude reflection coefficient ratio =G.sup.p/G.sup.s=tan .Math.exp(i). Through use of numerous lights having different incident angles included in the illumination light Q, data of numerous reflection lights can be acquired collectively in a hologram and can be processed.

A lensmeter system may include a mobile device having a camera. The camera may capture a first image of a pattern through a lens that is separate from the camera, while the lens is in contact with a pattern. The mobile device may determine the size of the lens based on the first image and known features of the pattern. The camera may capture a second image of the pattern, while the lens is at an intermediate location between the camera and the pattern. The second image may be transformed to an ideal coordinate system, and processed determine a distortion of the pattern attributable to the lens. The mobile device may measure characteristics of the lens based on the distortion. Characteristics of the lens may include a spherical power, a cylinder power, and/or an astigmatism angle.

Provided are a refractive index measuring device and a refractive index measuring method. A detector (2) detects an intensity of a measuring beam transmitted through the sample. A camera (200) images a color image of the measuring beam which is dispersed into multiple colors by transmitting through the sample. A scanning processing portion (101) carries out scanning by changing an angle of receiving the measuring beam transmitted through the sample or an angle of the measuring beam incident on the sample. A wavelength specifying processing portion (102) specifies, based on the detected intensity of the detector (2) varying with the scanning by the scanning processing portion (101) and color information corresponding to a position of the measuring beam incident on the detector (2) in a color image which is imaged by the camera (200), the wavelength corresponding to each peak of the detected intensity.

The present invention discloses a method for making an aspheric vision correction lens with controlled peripheral defocus. The present invention also discloses a vision correction lens worn outside the eye, an orthokeratology lens and an intraocular lens made according to the method. The present invention further discloses a diagnosis and treatment method that utilizes myopic peripheral defocus to control and retard myopia growth.

The present invention relates to methods for identifying optical materials, and more specifically to methods employed to identify glass and other optical materials used in medical devices. The method includes the steps of (1) selecting refractive index liquids matching a given optical sample; (2) determining the matching points for the refractive index liquids; and (3) calculating the refractive indices and selecting best fit optical materials. The invention also relates to a system for identifying optical materials. The system is under the control and operation of a computing device which documents, displays and stores all the data.

An apparatus and a method for measuring individual data of spectacles arranged in a measurement position are disclosed. The spectacles have a left and/or a right spectacle lens. The apparatus has a display for displaying a test structure. The apparatus contains an image capture device for capturing the test structure with an imaging beam path which passing through the left spectacle lens and/or the right spectacle lens of the spectacles. Further, the apparatus includes a computer unit with a computer program for determining a refractive power distribution for at least a section of the left spectacle lens and/or the right spectacle lens from the image of the test structure captured by the image capture device and a known spatial orientation of the display relative to the image capture device. To measure individual data of spectacles, the spectacles are arranged in a measurement position.

Method for determining a parameter of an optical equipment, the method comprising: an optical equipment positioning step, during which an optical equipment comprising a pair of optical lenses mounted on a spectacle frame is positioned in a first position, a portable electronic device positioning step, during which a portable electronic device comprising an image acquisition module is positioned in a second position determined and/or known relatively to the first position so as to acquire an image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position, a parameter determining step, during which at least one optical parameter of the optical equipment is determined based on the image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position.

Methods of determining an optimal focus height are disclosed. In one arrangement, measurement data from a plurality of applications of the metrology process to a target are obtained. Each application of the metrology process includes illuminating the target with a radiation spot and detecting radiation redirected by the target. The applications of the metrology process include applications at different nominal focus heights. The measurement data includes, for each application of the metrology process, at least a component of a detected pupil representation of an optical characteristic of the redirected radiation in a pupil plane. The method includes determining an optimal focus height for the metrology process using the obtained measurement data.