Patent classifications
G01M11/0285
Method and System for Measuring Optical Characteristics of a Contact Lens
A method of determining the transmittance of a contact lens (200) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected by ocular surface (100) with an intensity measuring device (400), positioning the contact lens (200) in direct contact with the ocular surface (100), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the contact lens (200) that is reflected a region (110) of the ocular surface (100) that is covered by the contact lens (200) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.
Methods and systems for testing of eyeglasses
A methods and system for testing of eyeglasses using a background object are disclosed. The method includes obtaining an image of a background object, whereby in at least a part of the image the background object is captured as viewed through a lens of a pair of eyeglasses, and analyzing at least a part of the image showing the background object being captured through a lens of the eyeglasses, and identifying a property of the lens based on the analyzing.
OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD
An optical inspection device includes: a wafer support unit configured to support a wafer in which a plurality of Fabry-Perot interference filter portions are formed, each of the plurality of filter portions in which a distance between the first mirror portion and the second mirror portion facing each other varies by an electrostatic force, the wafer support unit configured to support the wafer such that a direction in which the first mirror portion and the second mirror portion face each other follows along a reference line; a light emission unit configured to emit light to be incident on each of the plurality of filter portions along the reference line; and a light detection unit configured to detect light transmitted through each of the plurality of filter portions along the reference line. The wafer support unit has a light passage region that allows light to pass along the reference line.
TESTING DEVICE FOR VARIABLE LIGHT TRANSMITTANCE WINDOW
The present invention relates to a testing device for a variable light transmittance window, and a testing device for a variable light transmittance window according to one embodiment of the present invention comprises: a light source unit for irradiating light to a variable light transmittance window to measure optical characteristics of a suspended particle device (SPD) film; a detection unit for detecting the light irradiated from the light source unit and transmitted through the variable light transmittance window and outputting an electrical signal by means of the detected light; an AC power supply unit for supplying AC power to the variable light transmittance window; and a terminal for calculating the optical characteristics of the light transmittance variable window by using the electrical signal output from the detection unit. According to the present invention, there is an effect that makes it possible to automatically measure a physical parameter for confirming the optical characteristics of the variable light transmittance window.
Inspection unit for photochromic ophthalmic lenses
An inspection unit (10) for photochromic lenses (84) has a housing (12) defining an interior (14). At least one ultraviolet light source (32a, 32b) provides ultraviolet radiation into the housing interior (14). An inspection platform (54) is movable into and out of the housing interior (14) via at least one slide assembly (56). The inspection platform (54) includes a light table (58) having a translucent viewing area (62) and at least one inspection light source (64) located under the translucent viewing area (62).
LIGHT LEAKAGE DETECTION IN EDGE SEALANTS OF OPTICAL DEVICES
Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.
In-Line Test System For A Holographic Optical Element
This application discloses an in-line system and method for measuring the optical performance of an HOE in motion during a roll-to-roll fabrication process.
SYSTEMS, DEVICES AND METHODS FOR A REPEATABLE AND QUANTIFIABLE MEASUREMENT OF THE HAZE PRESENT IN AN OPTICAL LENS
Systems, devices and methods to measure a haze value of a lens using a light proof box housing a stand, a light source and a camera. The stand has an orientation to position the lens to be flat, adjacent to the light source, and have the lens edge facing the light source. The light source is configured to emit a blue light into a lens edge of the lens. The camera is oriented to face a top surface of the lens, the camera is configured to measure blue light emitted from the top surface of the lens. A computing device coupled with the camera is configured to calculate the haze value of the lens based on the measured blue light.
METHODS AND APPARATUS FOR WAVEGUIDE METROLOGY
Embodiments described herein relate to apparatus for measuring and characterizing performance of augmented and virtual reality waveguide structures utilizing glass substrates. The waveguide performance measuring systems generally include a light source configured to direct light towards an incoupling grating area on waveguide and one or more light detectors configured to collect light from an outcoupling grating area on a second side of the waveguide. The light source and one or more light detectors are disposed on one or more adjustable stages positioned about the waveguide. In certain embodiments, the one or more adjustable stages are configured to move in a linear fashion or revolve and/or rotate around the waveguide in an orbital motion.
Light leakage detection in edge sealants of optical devices
Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.