The present invention relates to an inspection system and more particularly to a system and method for inspection of wet ophthalmic lens, preferably in an automated lens manufacturing line. The inspection system provides for capturing multiple images of an ophthalmic lens using multiple cameras, each with a customized optical unit which may use wavelength filters, and the ophthalmic lens illuminated by multiple lighting modules each configured for a different wavelength, or a different polarization and triggered to strobe the illumination at the same instance or at different instances in the time domain. Suitable filters used in the optical module for each camera ensures appropriate images at different illuminating wavelength, especially when all the illuminations are strobed at the same time. Images captured and inspected by this configuration aids in improvement in method of inspection with enhanced degree of reliability and quality.

A computer implemented method for self-administrated testing of eyeglasses, the method comprising computer performed steps, the steps comprising: analyzing at least one image of a predefined pattern reflected from at least one lens of a pair of eyeglasses of a user, and identifying a property of the lens based on the analyzing.

Disclosed are a transmittance measuring method, which includes the following operations: acquiring the initial transmittance of a polarizer to be measured at a measuring point; acquiring a transmittance correction value corresponding to the measuring point; determining the transmittance of the polarizer to be measured according to the initial transmittance and the transmittance correction value corresponding to the measuring point.

A method is provided for determining an OPC model comprising: recording an aerial image by use of a mask inspection microscope, wherein the aerial image comprises at least one segment of a mask; simulating a plurality of aerial images which comprise at least the segment, proceeding from a mask design and from predefined parameters of an optical model which is part of the OPC model, wherein the parameters differ for each of the simulated aerial images of the plurality of aerial images; determining differences between the measured aerial image and the simulated aerial images; determining those parameters for which the differences between simulated aerial image and measured aerial image are the least. In addition, a mask inspection microscope for carrying out the method is provided.

A method of determining the transmittance of a contact lens (200) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected by ocular surface (100) with an intensity measuring device (400), positioning the contact lens (200) in direct contact with the ocular surface (100), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the contact lens (200) that is reflected a region (110) of the ocular surface (100) that is covered by the contact lens (200) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.

A methods and system for testing of eyeglasses using a background object are disclosed. The method includes obtaining an image of a background object, whereby in at least a part of the image the background object is captured as viewed through a lens of a pair of eyeglasses, and analyzing at least a part of the image showing the background object being captured through a lens of the eyeglasses, and identifying a property of the lens based on the analyzing.

Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.

A dispersion measurement apparatus includes a pulse forming unit, a correlation optical system, a beam splitter, an operation unit, an imaging unit, a spatial filter unit, and a photodetector. The pulse forming unit forms a light pulse train including light pulses having time differences and different center wavelengths. The beam splitter branches the light pulse train passed through a measurement object. The imaging unit disperses one light pulse train and images each light pulse. The spatial filter unit extracts light of a partial region of the other light pulse train. The correlation optical system outputs correlation light including a cross-correlation or an autocorrelation of the extracted light. The photodetector detects a temporal waveform of the correlation light. The operation unit estimates a wavelength dispersion amount in the measurement object based on a feature value of the temporal waveform.

A beam irradiation unit (a collimator unit, a processing head, and a nozzle) includes a plurality of optical components, and is configured to convert a laser beam, which is divergent light, to collimated light and then to condense the light to irradiate a sheet metal. A photodetection element (a photodiode) detects intensity of reflected light reflected by an inspected optical component that is one of the plurality of optical components. A control device (an NC device) controls irradiation of a pierced hole with the laser beam as inspection light, subsequently to piercing the portion of the sheet metal to be cut to manufacture a product, and compares, with a threshold, the intensity of the reflected light detected by the photodetection element during the irradiation with the inspection light, to detect whether the inspected optical component is deteriorated, or a degree of the deterioration.

A method of optical device metrology is provided. The method includes introducing a first type of light into a first optical device during a first time period, the first optical device including an optical substrate and an optical film disposed on the optical substrate, the first optical device further including a first surface, a second surface, and one or more sides connecting the first surface with the second surface; and measuring, during the first time period, a quantity of the first type of light transmitted from a plurality of locations on the first surface or the second surface during the first time period, wherein the measuring is performed by a detector coupled to one or more fiber heads positioned to collect the light transmitted from the plurality of locations.