A system, method, and device for simulating an IR signature to test an IR detection device. At least one infrared LED display is provided. Each infrared LED display contains infrared LEDs that emit the desired IR signature. A reflector reflects the IR signature toward the IR detection device. The configuration of the reflector is dependent upon the configuration of the infrared LED display and whether or not some intermediate lens system is used. The IR signature is collimated as it travels to the IR detection device. The IR signature can be collimated by the reflector or by an added lens system. The IR signature fills the field of view associated with the IR detection system. The IR signature comes from a computer-controlled display. As such, the system can simulate various IR signatures and move those IR signatures throughout the field of view of the IR detection system.

A system, method, and device for simulating an IR signature to test an IR detection device. At least one infrared LED display is provided. Each infrared LED display contains infrared LEDs that emit the desired IR signature. A reflector reflects the IR signature toward the IR detection device. The configuration of the reflector is dependent upon the configuration of the infrared LED display and whether or not some intermediate lens system is used. The IR signature is collimated as it travels to the IR detection device. The IR signature can be collimated by the reflector or by an added lens system. The IR signature fills the field of view associated with the IR detection system. The IR signature comes from a computer-controlled display. As such, the system can simulate various IR signatures and move those IR signatures throughout the field of view of the IR detection system.

A machine for measuring the optical properties of a lens for a pair of eyeglasses includes a light emitting system for emitting a light beam; a receiver arranged for receiving the light beam; an alignment system configured to align the lens according to a predetermined measuring position; a gripping system configured to grip the eyeglasses; and a supporting system on which the eyeglasses or the single lens are positioned. The alignment system is arranged at a distance from the light emitting system so that at least a lower support element is not intercepted by the light beam. The gripping system is in a closed configuration after the alignment has been performed and then a subsequent shifting of the support structure is carried out to bring the lens under the light emitting system.

A machine for measuring the optical properties of a lens for a pair of eyeglasses includes a light emitting system for emitting a light beam; a receiver arranged for receiving the light beam; an alignment system configured to align the lens according to a predetermined measuring position; a gripping system configured to grip the eyeglasses; and a supporting system on which the eyeglasses or the single lens are positioned. The alignment system is arranged at a distance from the light emitting system so that at least a lower support element is not intercepted by the light beam. The gripping system is in a closed configuration after the alignment has been performed and then a subsequent shifting of the support structure is carried out to bring the lens under the light emitting system.

Disclosed is a plane grating calibration system, comprising an optical subsystem, a frame , first vibration isolator, a vacuum chuck, a workpiece stage, second vibration isolator, a base platform and a controller; the optical subsystem is mounted on the frame, and the frame is isolated from vibration by the first vibration isolator; the vacuum chuck is rotatably mounted on the workpiece stage, the workpiece stage is positioned on the base platform, and the base platform is isolated from vibration by the second vibration isolator. A displacement interferometer is integrated into the optical subsystem, the entire optical subsystem adopts a method of sharing a light source, thereby avoiding the problems of low wavelength precision and poor coherence of separate light sources.

Disclosed is a plane grating calibration system, comprising an optical subsystem, a frame , first vibration isolator, a vacuum chuck, a workpiece stage, second vibration isolator, a base platform and a controller; the optical subsystem is mounted on the frame, and the frame is isolated from vibration by the first vibration isolator; the vacuum chuck is rotatably mounted on the workpiece stage, the workpiece stage is positioned on the base platform, and the base platform is isolated from vibration by the second vibration isolator. A displacement interferometer is integrated into the optical subsystem, the entire optical subsystem adopts a method of sharing a light source, thereby avoiding the problems of low wavelength precision and poor coherence of separate light sources.

A support member for a precision device includes a vertical support element and a horizontal support element. The vertical support element extends along a vertical main direction of extent and includes a material with a low thermal expansion coefficient. The horizontal support element horizontally surrounds at least a portion of the vertical support element and is configured to horizontally support the vertical support element against tilting from the main direction of extent. The horizontal support element bounds a thermally insulating interior space in which the vertical support element is partially accommodated.

A support member for a precision device includes a vertical support element and a horizontal support element. The vertical support element extends along a vertical main direction of extent and includes a material with a low thermal expansion coefficient. The horizontal support element horizontally surrounds at least a portion of the vertical support element and is configured to horizontally support the vertical support element against tilting from the main direction of extent. The horizontal support element bounds a thermally insulating interior space in which the vertical support element is partially accommodated.

A level correction system includes a first adjustment device, a chuck device provided on the first adjustment device, a first reflective device provided on the chuck device, a second adjustment device, a carrying table provided on the second adjustment device, a second reflective device provided on the carrying table, a laser emitter configured to emit incident laser light, a laser receiver, and a controller. The first reflective device and the second reflective device are used to reflect the incident laser light to form a reflected laser light. The laser receiver is used to receive the reflected laser light. The controller is used to determine a height of the chuck device or the carrying table and whether a center point of a reflected light spot formed by the reflected laser light is offset from a center point of an incident light spot formed by the incident laser light.

A level correction system includes a first adjustment device, a chuck device provided on the first adjustment device, a first reflective device provided on the chuck device, a second adjustment device, a carrying table provided on the second adjustment device, a second reflective device provided on the carrying table, a laser emitter configured to emit incident laser light, a laser receiver, and a controller. The first reflective device and the second reflective device are used to reflect the incident laser light to form a reflected laser light. The laser receiver is used to receive the reflected laser light. The controller is used to determine a height of the chuck device or the carrying table and whether a center point of a reflected light spot formed by the reflected laser light is offset from a center point of an incident light spot formed by the incident laser light.