System and method for performance characterization of multi configuration near eye displays includes: a mirror; a lamp; a beamsplitter; a collimating and reflective lens for collimating light reflected from the beamsplitter and reflecting it back towards an image sensor having a view finder; a field-of-view (FOV) aperture to project light from the lamp onto the DUT through the objective lens; a video viewfinder digital camera for capturing an virtual image of the DUT; a spectroradiometers for performing spectroradiometric measurements on a captured image of the defined measurement area to characterize the performance of the DUT; and a controller circuit for characterizing performance of the DUT based on the spectroradiometric measurements.

An optical mount system that may be adjusted by a variety of devices and methods. In some cases, a post collar assembly may be configured to engage a collar coupling surface of a post holder body such that the post collar engages the collar coupling surface in indexed and predetermined angular positions. In some cases, a base of a post holder body may be configured to accept a secondary base element in the form of a mounting adapter which may be releasably secured the base to provide additional stiffness for the mounting of the base to a reference surface.

An optical mount system that may be adjusted by a variety of devices and methods. In some cases, a post collar assembly may be configured to engage a collar coupling surface of a post holder body such that the post collar engages the collar coupling surface in indexed and predetermined angular positions. In some cases, a base of a post holder body may be configured to accept a secondary base element in the form of a mounting adapter which may be releasably secured the base to provide additional stiffness for the mounting of the base to a reference surface.

A support member for a precision device includes a vertical support element and a horizontal support element. The vertical support element extends along a vertical main direction of extent and includes a material with a low thermal expansion coefficient. The horizontal support element horizontally surrounds at least a portion of the vertical support element and is configured to horizontally support the vertical support element against tilting from the main direction of extent. The horizontal support element bounds a thermally insulating interior space in which the vertical support element is partially accommodated.

A support member for a precision device includes a vertical support element and a horizontal support element. The vertical support element extends along a vertical main direction of extent and includes a material with a low thermal expansion coefficient. The horizontal support element horizontally surrounds at least a portion of the vertical support element and is configured to horizontally support the vertical support element against tilting from the main direction of extent. The horizontal support element bounds a thermally insulating interior space in which the vertical support element is partially accommodated.

A test device for a lens module in respect of visible light and in respect of infrared light includes a test fixture and a display able to show both types of light in images captured. The test fixture supports the lens module. The display is configured to display pictures of test cards captured by the lens module. The display includes a display panel and a backlight module located on a side of the display panel. The backlight module includes a first light source and a second light source, the first light source emits visible light, and the second light source emits infrared light.

A test device for a lens module in respect of visible light and in respect of infrared light includes a test fixture and a display able to show both types of light in images captured. The test fixture supports the lens module. The display is configured to display pictures of test cards captured by the lens module. The display includes a display panel and a backlight module located on a side of the display panel. The backlight module includes a first light source and a second light source, the first light source emits visible light, and the second light source emits infrared light.

A precision tabletop for scientific instrumentation is described. The tabletop may be manufactured from as few as two pieces of material, include a honeycomb stiffening and vibration damping structure, be sealed from fluid ingress, include interior reinforcing structures, and permit accurate registration of machined features on all sides of the tabletop.

System and method for performance characterization of multi configuration near eye displays includes: a mirror; a lamp; a beamsplitter; a collimating and reflective lens for collimating light reflected from the beamsplitter and reflecting it back towards an image sensor having a view finder; a field-of-view (FOV) aperture to project light from the lamp onto the DUT through the objective lens; a video viewfinder digital camera for capturing an virtual image of the DUT; a spectroradiometers for performing spectroradiometric measurements on a captured image of the defined measurement area to characterize the performance of the DUT; and a controller circuit for characterizing performance of the DUT based on the spectroradiometric measurements.

A lensmeter includes a light emission portion configured to emit light so as to radiate the light onto a lens-to-be-inspected, and a light reception portion configured to receive the light transmitted through the lens-to-be-inspected to measure an optical characteristic of the lens-to-be-inspected. The light emission portion includes a measurement light source configured to emit green light or red light for measurement of refractive power of the lens-to-be-inspected, a first inspection light source configured to emit ultraviolet light, and a second inspection light source configured to emit blue light. The light reception portion is configured to selectively receive lights from the measurement light source, the first inspection light source and the second inspection light source respectively.