A computer-implemented method for identifying mechanical parameters of an object subjected to mechanical stress is provided. The method comprises a step of acquiring, by an imaging means, images of the object taken before and during the application of the mechanical stress, three steps of calculating the effects due to the stress carried out either on the basis of the modeling of the recorded images or on the basis of a theoretical mechanical modeling of the stress, a step of defining a functional equal to the difference between the two models and a last step of minimizing said functional so that the experimental model is as close as possible to the theoretical mechanical model. Additional measurements make it possible to refine the method.

A system includes a stage, a detector and a measuring device. The stage is configured to hold a substrate. The substrate includes a plurality of tapered structures, and each of the plurality of tapered structures includes a tapered wall between first and second openings at opposite ends of the plurality of tapered structures. The detector is tilted at a first angle and configured to measure light reflected from the tapered wall at about 90 degrees to the tapered wall. The first angle depends at least in part a second angle between the tapered wall and a longitudinal axis running through the tapered structure. The measuring device is configured to determine a characteristic of the tapered wall and whether the characteristic of the tapered wall is above or below a threshold.

A non-destructive testing device includes a tubular housing including a proximal end and a distal end. A conduit section is arranged at the proximal end, and a bendable articulation section secured to the conduit section and arranged at the distal end. A plurality of actuation systems each includes a control cable extending along the tubular housing and arranged at a respective circumferential position within the bendable articulation section, and an actuator disposed at the proximal end of the tubular housing and secured to the control cable.

An example system for in-situ inspection of a composite structure includes a surface-strain imaging apparatus and a controller. The surface-strain imaging apparatus is configured to image an area of an outer surface of the composite structure while a temperature of the composite structure warms to thermal equilibrium with a surrounding environment and a temperature gradient exists within the composite structure. The controller includes a processor and a memory, and is configured to detect, using data received from the surface-strain imaging apparatus, an out-of-plane displacement of the outer surface in the area caused by the temperature gradient. The controller is also configured to determine that the out-of-plane displacement satisfies a threshold condition and, based on determining that the out-of-plane displacement satisfies the threshold condition, flag the area of the outer surface for further inspection.

Disclosed in an example embodiment herein is an airfield luminaire, comprising a housing, a light source in an interior of the housing, a sensor for sensing a condition associated with the housing, and control logic comprising a processor coupled with the light source and the sensor. The control logic is operable to obtain data from the sensor and determine a status of the airfield luminaire. In another example embodiment, a controller is operable to receive data representative of sensor data from the plurality of airfield lighting fixtures and determine the status of a selected one of the plurality if lighting fixtures based on the sensor data. In yet another example embodiment control logic that comprises a processor is operable to determine the present light output of a LED based on aging rate and amount of time the LED is operated at a plurality of temperatures.

A stress distribution image processing device including: a processing unit configured to: designate a normalization region which includes a portion of stress equal to or larger than a predetermined threshold value in a screen of a stress distribution image of a target object; and normalize pixels in the normalization region based on stress values in the normalization region to obtain a normalized image.

There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.

A shape measuring apparatus applies, to a light beam, a periodic pattern having periodicity in a direction perpendicular to an optical axis and displaceable in the direction perpendicular to the optical axis, relatively displaces a focal point of an objective lens in a direction parallel to the optical axis, and calculates, based on amplitude of intensity of the light beam detected by a photodetector, face shape data on the object to be measured. Then, a top surface measuring step of acquiring face shape data on a top surface of the object to be measured, and a bottom surface measuring step of acquiring face shape data on a bottom surface of the object to be measured by transmitting through the top surface of the object to be measured and aligning the focal point of the objective lens on the bottom surface of the object to be measured are performed.

A process for automated component inspection includes the steps of calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on the table, the coordinate measuring machine comprising a fixture coupled to an arm of the coordinate measuring machine; coupling a component to the fixture; acquiring an image of said component with said imaging device; registering a baseline dimensioned image to the component image; applying the baseline dimensioned image to a damage detection algorithm; and determining component damage by the damage detection algorithm.

An optical system and an imaging method are disclosed, wherein the optical system comprises a multifilament conductor and an optical diffuser for imaging an intensity pattern onto the multifilament conductor, the intensity pattern representing phase information of light emitted from one or more three-dimensional objects; wherein the multifilament conductor is configured to transmit the intensity pattern in the form of a plurality of pixels to an evaluation system, and wherein the evaluation system is configured to generate an image based on the intensity pattern transmitted by the multifilament conductor, the image representing the one or more three-dimensional objects.