An optical adapter system may comprise a mounting plate. The mounting plate may include a set of magnets associated with: mechanically connecting the mounting plate and an optical adapter of the optical adapter system, and facilitating movement of the optical adapter between multiple positions associated with different optical fiber polishes. The optical adapter system may comprise the optical adapter. The optical adapter may include a set of structures associated with the set of magnets. The optical adapter may include an optical tip connector associated with mechanically connecting the optical adapter system and an optical cable.

A method of calibrating a collimating lens system includes transmitting, using an optical transmitter, a beam out of an optical fiber and through a collimating lens of the collimating lens system. The beam is reflected off a perfect flat mirror positioned at an output of the collimating lens and back towards the collimating lens, and received, via the collimating lens, at a power meter connected to the optical fiber. The method also includes adjusting a position of a tip of the optical fiber proximal to the collimating lens while tracking a power reading using the power meter, selecting a calibration position of the optical fiber corresponding to a highest power reading, and securing the optical fiber relative to the collimating lens using the calibration position.

An imaging device blemish detection test enclosure and techniques for an optical imaging device includes a mounting structure for mounting an optical imaging device, a first body with a concave surface, and a second body holding the mounting structure relative to the first body. The mounting structure and the second body may orient an optical axis of a lens of the optical imaging device towards the concave surface and locate the lens relative to the concave surface where the interface between the first and second bodies is outside of a lens field of view of the lens. The system may include a light source disposed in the second body and directed towards the concave surface of the of the first body providing an evenly illuminating the concave surface. The concave surface may include a surface of a spherical sector greater than a hemisphere.

A microscope may receive a fiber optic connector via a connector adapter of the microscope, wherein the connector adapter includes an opening and a shaped reflective surface surrounding the opening. The microscope may align a ferrule of the fiber optic connector with the opening of the connector adapter of the microscope, wherein the ferrule includes a ferrule endface. The microscope may transmit light onto the shaped reflective surface and may receive reflected light from the ferrule endface and with a camera of the microscope.

A microscope may receive a fiber optic connector via a connector adapter that includes an opening and may align a ferrule of the fiber optic connector with the opening of the connector adapter, where the ferrule includes a ferrule endface. The microscope may transmit light onto the ferrule endface and may receive reflected light, as an image of the ferrule endface, with a camera of the microscope. The microscope may determine intensities of brightness of the image and may create a topographical map of the intensities of the brightness of the image. The microscope may determine a radius and an apex of the ferrule endface based on the topographical map and may calculate an apex offset of the ferrule endface based on the radius and the apex of the ferrule endface. The microscope may perform one or more actions based on the apex offset of the ferrule endface.

An optical fiber including a plurality of embedded optical reflectors distributed periodically along the length of the fiber and a method of quantifying loss associated with an optical connector that is connected to optical fiber comprising a plurality of embedded optical reflectors distributed periodically along the length of the fiber. The method includes inserting an optical signal into the fiber through the optical connector; measuring a component of the optical signal reflected by at least one of the plurality of embedded optical reflectors, in which the component is received through the optical connector; calculating the difference in power level between the inserted and reflected signals; and quantifying, based on the calculated power level difference and the reflectivity of the embedded optical reflector, the loss associated with the optical connector.

An object is to provide an optical fiber route search method, an optical fiber route search device, and a program that can efficiently confirm a path of an optical fiber that is installed over a long distance or across a large range. The optical fiber route search method according to the present invention carries out optical measurement that performs distributed measurement of the state of an optical fiber while applying a disturbance to the optical fiber in a portion in which wires of the optical fiber are parallel to each other, branch out, or intersect with each other (a proximity portion), and determines that the position in which the number of singularities (peaks or intensity fluctuations) fluctuates (becomes plural) is the position of the proximity portion from a distribution diagram obtained through the optical measurement.

An inspection tool for allowing visual inspection of an end face of a fiber optic ferrule. The inspection tool includes a passage for allowing a camera to view the end face. The inspection tool also includes light directing structure for first directing ferrule illumination light axially along the inspection tool, and then reflecting the axial light across the end face of the fiber optic ferrule.

An intact semiconductor wafer (wafer) includes a plurality of die. Each die has a top layer including routings of conductive interconnect structures electrically isolated from each other by intervening dielectric material. A top surface of the top layer corresponds to a top surface of the wafer. Below the top layer, each die has a device layer including optical devices and electronic devices. Each die has a cladding layer below the device layer and on a substrate of the wafer. Each die includes a photonic test port within the device layer. For each die, a light transfer region is formed within the intact wafer to extend through the top layer to the photonic test port within the device layer. The light transfer region provides a window for transmission of light into and out of the photonic test port from and to a location on the top surface of the wafer.

A method of calibrating a collimating lens system includes transmitting, using an optical transmitter, a beam out of an optical fiber and through a collimating lens of the collimating lens system. The beam is reflected off a perfect flat mirror positioned at an output of the collimating lens and back towards the collimating lens, and received, via the collimating lens, at a power meter connected to the optical fiber. The method also includes adjusting a position of a tip of the optical fiber proximal to the collimating lens while tracking a power reading using the power meter, selecting a calibration position of the optical fiber corresponding to a highest power reading, and securing the optical fiber relative to the collimating lens using the calibration position.