An extinction ratio testing system (10) includes a microcontroller (102), an extinction ratio tester (104), and a thermostat (106). The microcontroller (102) controls the thermostat (106) to maintain an optical transceiver module (20) at a predetermined high temperature, and then the microcontroller (102) controls the extinction ratio tester (104) to test an extinction ratio of the optical transceiver module (20). If the extinction ratio is lower than a standard extinction ratio, the microcontroller (102) controls the optical transceiver module (20) to increase a laser operating current (212) of the optical transceiver module (20) to increase the extinction ratio.

A device that pulls out an optical fiber includes: a bobbin support that supports a bobbin rotatably about a rotation axis; a first pulling out unit that holds a first end of the optical fiber, pulls out a first portion of the optical fiber wound around the bobbin from a side of the first end in a state where the bobbin rotates in a predetermined direction, and returns a part of the first portion to the bobbin in a state where the bobbin rotates in a direction opposite to the predetermined direction; and a second pulling out unit that holds a second end of the optical fiber after the first pulling out unit pulls out the first portion from the side of the first end, and pulls out a second portion of the optical fiber wound around the bobbin from a side of the second end.

A system and method are provided for simulating circuits that transmit bidirectional signals between some ports using simulators designed originally for electrical circuits and systems, that eliminate the need for different port interfaces. The system and method can be applied to simulate photonic circuits either standalone or integrated with electrical circuits and systems. In one method implemented by the system potential and flow representations, available for example in Verilog-A simulators, are used to create bidirectional signals on a single bus line to transmit optical signals. In another method implemented by the system, the system auto-configures each optical port type as left or right at runtime or during a pre-simulation initialization to allow for bidirectional signals with a single port interface.

An extinction ratio testing system (10) includes a microcontroller (102), an extinction ratio tester (104), and a thermostat (106). The microcontroller (102) controls the thermostat (106) to maintain an optical transceiver module (20) at a predetermined high temperature, and then the microcontroller (102) controls the extinction ratio tester (104) to test an extinction ratio of the optical transceiver module (20). If the extinction ratio is lower than a standard extinction ratio, the microcontroller (102) controls the optical transceiver module (20) to increase a laser operating current (212) of the optical transceiver module (20) to increase the extinction ratio.

A fiber-optic interconnection stabilization apparatus for a measurement system is provided. The apparatus may comprise a main body comprising an enclosure and two openings. The enclosure may encase a fiber-optic cable within the main body in an organized manner. The two openings may fit connecting ends of the fiber-optic cable such that the connecting ends of may be exposed in order to connect two modular components of a measurement system and form a closed measurement loop. The main body, when in a closed configuration, may stabilizes the fiber-optic cable encased within from external conditions, such as mechanical, thermal, or other environmental conditions that may affect measurements.

An optical device cut from a wafer into a chip by dicing, on the wafer, the optical device includes a plurality of optical waveguides; an optical circuit connected to the optical waveguide; and of the plurality of optical waveguides, a testing optical waveguide that guides test light to the optical circuit to be tested, by bypassing a non-connected optical waveguide portion at a terrace for mounting an optical chip component.

A mode control system and method for controlling an output mode of a broadband radiation source including a photonic crystal fiber (PCF). The mode control system includes at least one detection unit configured to measure one or more parameters of radiation emitted from the broadband radiation source to generate measurement data, and a processing unit configured to evaluate mode purity of the radiation emitted from the broadband radiation source, from the measurement data. Based on the evaluation, the mode control system is configured to generate a control signal for optimization of one or more pump coupling conditions of the broadband radiation source. The one or more pump coupling conditions relate to the coupling of a pump laser beam with respect to a fiber core of the photonic crystal fiber.

The present embodiment relates to a method of directly measuring a leakage loss from a peripheral core in a MCF with a coating to the coating. In the measurement method, in a high refractive-index state in which the coating is present on an outer periphery of a common cladding, first transmission power of measurement light, which propagates through the peripheral core of the MCF, is measured. On the other hand, in a low refractive-index state in which a low-refractive-index layer with a lower refractive index than the common cladding is provided on the outer periphery of the common cladding, second transmission power of the measurement light, which propagates through the peripheral core of the MCF, is measured. The leakage loss LL from the peripheral core to the coating is calculated as a difference between the first transmission power and the second transmission power.

An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

A method for testing optical fibers includes using an optical testing instrument to measure a characteristic, such as clad non-circularity, of an optical fiber at a multiple angles of rotation of an optical fiber around its optical axis. From the measurements data points indicative of measured values of the characteristic at the respective angles of rotation are generated. A model is created of the optical fiber having the characteristic as a variable parameter, and from the model a functional relationship between an expected measured value of the characteristic and the angle of rotation and the variable parameter is generated. By varying the parameter a fit of the functional relationship to the data points is made according to one or more predetermined criteria, such as least-squares fit. The value of the characteristic can be found based on the fit. Instrumental parameters, such as fiber misalignment and cleave angle, can also be ascertained by the method.