An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

An optical power meter unit includes a transmitting/receiving port configured to connect to a fiber under test. The optical power meter unit also includes a light source and an optical power meter. The optical power meter unit further includes an optical fiber extending between the transmitting/receiving port and the optical power meter. The optical fiber has a core size greater than a core size of the fiber under test.

A structure and method for the wafer level testing of interposer-based photonic integrated circuits is described that includes the formation of an upturned mirror structure and the method of utilizing the interposer-based mirror structure for electrical and optical testing of optoelectrical circuits that include emitting components such as lasers, detecting components such as photodetectors, and both emitting and detecting components. Electrical activation of the optoelectrical emitting or sending devices and the subsequent detection and measurement of the optical signals in detecting or receiving devices provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

Aspects of the present disclosure describe a method for estimating mode field distribution in optical fibers from guided acoustic-wave Brillouin scattering wherein light for which the optical mode-field distribution is determined remains in the optical fibers and the distribution is made for light inside the fiber, and not at a fiber/air interface or other perturbation points to the fiber resulting in a more accurate representation of the optical mode-field distribution in the fiber. Since light is always in the fiber during the determination, no complicated fiber preparation steps or procedures are required and the mode-field distribution is determined as an average distribution along the length of the fiber under test.

A multi-fiber connector fiber-optic measurement device identifies a polarity type and measures an optical power of a multi-fiber connector fiber-optic patch cord. The device includes: a beam splitter that splits light from the multi-fiber connector fiber-optic patch cord into a plurality of lights; a first optical sensor that receives one of the lights split by the beam splitter and outputs a first signal according to the received light; a second optical sensor that receives another of the lights split by the beam splitter and outputs a second signal according to the received light; and a signal processor that calculates the optical power based on the first signal and identifies the polarity type based on the second signal.

An optical fiber state detection system includes: a first light source that outputs a monitor-related light for monitoring a state of an optical fiber; a reflection mechanism that reflects the monitor-related light propagated through the optical fiber; a light receiving part that receives a reflected light reflected by the reflection mechanism; a tap coupler provided between the reflection mechanism and both the first light source and the light receiving part such that the first light source and the light receiving part are connected the tap coupler; and a control part. Further, when the control part detects that a received optical power of the reflected light is greater than 0 and lower than a predetermined threshold value, the control part outputs information on a decrease in the received optical power to outside.

A testing device includes a test port, a light source, a measurement element, and a controller. A method of testing an optical system with the testing device includes, and/or the testing device is configured for, measuring an unloaded reference signal when the testing device is not connected to the optical system and storing the unloaded reference signal in a memory of the testing device. The method and/or configuration also includes detecting a signal from the optical system after storing the unloaded reference signal. Based on the detected signal, it is determined that the optical system is connected to a test port of the testing device. A test of the optical system with the testing device is automatically initiated in response to determining that the optical system is connected to the test port of the testing device.

A system and method for detecting degradation of a fiber optic in a strap of a body-worn device that is removably attached to an appendage or other location of a person or animal. A fiber optic is embedded within the strap. A light source emits light energy through the optical interface and into the fiber optic and a light sensor receives and detects light energy from the fiber optic. If the light energy is not received and detected from the fiber optic, the light energy is increased until the light energy is received and detected or reaches a maximum light energy at which time tampering is declared. If the light energy reaches a pre-determined threshold which is less than the maximum light energy, it is declared that the body-worn device requires servicing.

A method of testing a photonics die at the wafer level includes providing a sacrificial waveguide and a grating coupler at least partially in a scribe line between dies of a wafer, performing one or more tests on the dies of the wafer via the sacrificial waveguide and grating coupler in the scribe line, and removing the sacrificial waveguide during separation of the dies of the wafer.

A system for sensing presence of an optical fiber is provided herein. The system may include a first illumination source configured to emit a first light beam along an optical path and a first detector. The first detector may be positioned off of the optical path and configured to detect a portion of the first light beam refracted through the optical fiber when the optical fiber is disposed perpendicular to the first illumination source and at a first position along the optical path between the first illumination source and the first detector. In some embodiments, the system for sensing the presence of an optical fiber may include a collecting lens. The collecting lens may also be configured to direct the portion of the first light beam refracted through the optical fiber to the first detector when the optical fiber is in the first position.