A method of optical device metrology is provided. The method includes introducing a first type of light into a first optical device during a first time period, the first optical device including an optical substrate and an optical film disposed on the optical substrate, the first optical device further including a first surface, a second surface, and one or more sides connecting the first surface with the second surface; and measuring, during the first time period, a quantity of the first type of light transmitted from a plurality of locations on the first surface or the second surface during the first time period, wherein the measuring is performed by a detector coupled to one or more fiber heads positioned to collect the light transmitted from the plurality of locations.

Provided is an optical probe that includes an optical waveguide having a core layer and a cladding layer formed so as to cover the core layer, and a support member that supports an end portion of the optical waveguide. In the core layer, an optical waveguide core and a diffraction grating are provided. The diffraction grating is provided at an end of the optical waveguide core, has an input/output surface through which light is output to the outside or input from the outside, and converts the optical axis direction in a range between a light propagation direction in which light is propagated through the optical waveguide core and the input/output direction of light to/from the input/output surface. The support member supports the diffraction grating in such a manner that the input/output surface faces toward a predetermined direction.

An integrating sphere-equipped optical measurement device and optical connector polarity and type identification and loss measurement are provided. The optical measurement device receives one or more optical signals that respectively emanate from one or more optical fibers of a plurality of optical fibers of an optical fiber cable. The optical measurement device determines one or more respective positions where the one or more optical signals impinged on a sensor. The optical measurement device determines based on the one or more positions, one or more receiving positions of the one or more optical signals, respectively. The optical measurement device determines a polarity of the optical fiber cable based on both the one or more receiving positions and one or more or transmitting positions of the one or more optical signals, respectively.

A surface grating coupler for polarization splitting or diverse includes a planar layer and an array of scattering elements arranged in the planar layer at intersections of a first set of concentric elliptical curves crossing with a second set of concentric elliptical curves rotated proximately 90 or 180 degrees to form a two-dimensional (2D) grating. Additionally, the grating coupler includes a first waveguide in double-taper shape and a second waveguide in double-taper shape respectively for split or diverse an incident light into the 2D grating into two output light to two output ports with a same (either TE or TM) polarization mode or one output port with TE polarization mode and another output port with TM polarization mode. The polarization diverse grating coupler is required to test multiple polarization sensitive photonics components and can be used with other single polarization grating coupler via a fiber array to perform wafer-level testing.

Disclosed are a measuring device for a lateral optical fiber lens, the measuring device comprising an XZ movable platform and an XY movable platform, wherein a rotatable accommodating pipe is arranged on the XZ movable platform, an optical detection card is arranged on the XY movable platform, an optical power probe is arranged below the optical detection card, and the optical detection card has a height smaller than that of the accommodating pipe. The present application further provides a method for measuring a light emergence angle and a divergence angle of a lateral optical fiber lens by using the measuring device for a lateral optical fiber lens. By means of the measuring device for the lateral optical fiber lens provided in the present application, a light emergence angle and a divergence angle of a lateral optical fiber lens can be measured, a fiber lens can be rotated by means of the accommodating pipe, the position and the level of the fiber lens can be adjusted by means of the XZ movable platform, and therefore a light emergence direction of the fiber lens is changed. Then, by utilizing the characteristics of a high monochromaticity, high directivity etc. of a laser, a point of projection of a light spot is positioned by means of the optical detection card and the optical power probe, and the light emergence angle and the divergence angle are measured.

The present invention relates to a method and an apparatus for measuring the temperature of optical fibers during fusion splicing or thermal processing, said method comprising: a) measuring, using an interferometric method, a change in an optical path length in an optical fiber due to temperature dependent properties of the optical fiber during fusion splicing or thermal processing; and b) determining the temperature of the optical fiber based on the measured changes in the optical path length.

A system and method for tracing an optical communication cable and related traceable fiber optic cable are provided. The system includes a traceable optical communication cable that includes an elongate light emitting element extending along at least a portion of the length of the cable body configured to emit light radially outward from the cable body, and the light emitted from the light emitting element has a wavelength range. The cable body includes a plurality of spaced light transmitting windows separated from each other by a plurality of opaque fire-resistant sections. The system includes a viewing device having a light filtering element configured to pass light within the wavelength length range through the light filtering element and to block at least a portion of light having wavelengths outside of the wavelength range.

An integrating sphere-equipped optical measurement device and optical connector polarity and type identification and loss measurement are provided. The optical measurement device receives one or more optical signals that respectively emanate from one or more optical fibers of a plurality of optical fibers of an optical fiber cable. The optical measurement device determines one or more respective positions where the one or more optical signals impinged on a sensor. The optical measurement device determines based on the one or more positions, one or more receiving positions of the one or more optical signals, respectively. The optical measurement device determines a polarity of the optical fiber cable based on both the one or more receiving positions and one or more or transmitting positions of the one or more optical signals, respectively.

A surface grating coupler for polarization splitting or diverse includes a planar layer and an array of scattering elements arranged in the planar layer at intersections of a first set of concentric elliptical curves crossing with a second set of concentric elliptical curves rotated proximately 90 or 180 degrees to form a two-dimensional (2D) grating. Additionally, the grating coupler includes a first waveguide in double-taper shape and a second waveguide in double-taper shape respectively for split or diverse an incident light into the 2D grating into two output light to two output ports with a same (either TE or TM) polarization mode or one output port with TE polarization mode and another output port with TM polarization mode. The polarization diverse grating coupler is required to test multiple polarization sensitive photonics components and can be used with other single polarization grating coupler via a fiber array to perform wafer-level testing.

Optical gratings, such as those used in waveguide displays, may have large aspect ratios. For example, a grating characteristic (e.g., period, feature size, etc.) can be much smaller than the grating area. Variations in the grating characteristic over the grating area may appear like a secondary grating having a long grating period superimposed on a primary grating for which the optical grating was designed. Because variations responsible for the secondary grating occur over a long distance relative to the primary grating period, it may be difficult to locate and characterize these variations with testing methods designed for shorter distances. The present disclosure presents systems and methods to detect and characterize the secondary gratings quickly and efficiently.