Embodiments herein describe techniques for testing optical components in a photonic chip using a testing structure disposed in a sacrificial region of a wafer. In one embodiment, the wafer is processed to form multiple photonic chips integrated into the wafer. While forming optical components in the photonic chips (e.g., modulators, detectors, waveguides, etc.), a testing structure can be formed in one or more sacrificial regions in the wafer. In one embodiment, the testing structure is arranged near an edge coupler in the photonic chip such that an optical signal can be transferred between the photonic chip and the testing structure. Moreover, the testing structure has a grating coupler disposed at or near a top surface of the wafer which permits optical signals to be transmitted into, or received from, the grating coupler when an optical probe is arranged above the grating coupler.

An inspection system includes a detection device arranged between a connector that couples a plurality of optical fibers to a port and the port; and a determination device that determines whether there is dart between the connector and the port, based on an output from the detection device, wherein the detection device includes a plurality of diodes that convert light that is output from each of the plurality of optical fibers to an electrical signal indicating intensity and distribution of the light, and the determination device includes a processor configured to determine whether there is dart between the connector and the port, based on the intensity and distribution of the light, which are indicated by the electrical signal.

An integrating sphere-equipped optical measurement device and optical connector polarity and type identification and loss measurement are provided. The optical measurement device receives one or more optical signals that respectively emanate from one or more optical fibers of a plurality of optical fibers of an optical fiber cable. The optical measurement device determines one or more respective positions where the one or more optical signals impinged on a sensor. The optical measurement device determines based on the one or more positions, one or more receiving positions of the one or more optical signals, respectively. The optical measurement device determines a polarity of the optical fiber cable based on both the one or more receiving positions and one or more or transmitting positions of the one or more optical signals, respectively.

An integrating sphere-equipped optical measurement device and optical connector polarity and type identification and loss measurement are provided. The optical measurement device includes at least two photodetectors that are optically responsive over different ranges of wavelengths. The optical measurement device receives one or more optical signals emanate from optical fibers of an optical fiber cable. The optical measurement device determines an optical intensity or loss of the one or more optical signals based on a measurement made by a corresponding photodetector whose responsivity range includes a wavelength of the one or more optical signals. The optical measurement device determines one or more respective positions where the one or more optical signals impinged on a sensor. The optical measurement device determines a polarity of the optical fiber cable based on both the one or more positions and one or more or transmitting positions of the one or more optical signals, respectively.

An optical fiber identifier apparatus and system are provided. The apparatus includes a housing forming a pathway at which an optical fiber is positionable. The housing forms a tip end that forms a bend of the optical fiber at the pathway. At least two lenses are positioned parallel to one another. Each lens defines an optical axis extended through the bend of the optical fiber and perpendicular to a longitudinal axis of the respective lens. A photo detector device is positioned to receive a beam of light from the optical fiber via the one or more lenses.

System and methods for optical power distribution to a large numbers of sample wells within an integrated device that can analyze single molecules and perform nucleic acid sequencing are described. The integrated device may include a grating coupler configured to receive an optical beam from an optical source and optical splitters configured to divide optical power of the grating coupler to waveguides of the integrated device positioned to couple with the sample wells. Outputs of the grating coupler may vary in one or more dimensions to account for an optical intensity profile of the optical source.

Aspects of the disclosure relate to an integrated optical probe card and a system for performing wafer testing of optical micro-electro-mechanical systems (MEMS) structures with an in-plane optical axis. On-wafer optical screening of optical MEMS structures may be performed utilizing one or more micro-optical bench components to redirect light between an out-of-plane direction that is perpendicular to the in-plane optical axis to an in-plane direction that is parallel to the in-plane optical axis to enable testing of the optical MEMS structures with vertical injection of the light.

Multi-core fibers are optical fibers each of which has a circular cross section. In each of the multi-core fibers, a plurality of cores are arranged at a prescribed interval, the peripheries thereof are covered by a cladding, and a resin coating is formed on the outer periphery of the cladding. In a cross section of this optical fiber ribbon, said cross section being orthogonal to the length direction, the multi-core fibers are arranged such that the cores of all of the multi-core fibers are all arranged in the same direction. The multi-core fibers are arranged such that central lines of the respective multi-core fibers, said central lines respectively linking three of the cores, all face the thickness direction of the optical fiber ribbon. Furthermore, in the optical fiber ribbon, the arrangement of the cores is substantially constant along the entire length of the optical fiber ribbon in the length direction.

A method for determining the refractive index profile of a preform is provided. The method involves: preparing the measured deflection angle distribution, including an extreme value determination of the deflection angle distribution, to obtain a prepared deflection angle distribution; transforming the prepared deflection angle distribution into a prepared refractive-index profile; evaluating the prepared refractive-index profile for the fixation of orientation values for the layer radius and for the layer refractive index of a hypothetical refractive index profile; generating a simulated deflection angle distribution on the basis of the hypothetical refractive-index profile with the orientation values, and transforming the deflection angle distribution into a simulated refractive-index profile; fitting the simulated refractive index profile to the prepared refractive-index profile by iterative adaptation of parameters to obtain a fitted, simulated refractive-index profile which is defined by adapted parameters, and obtaining the refractive index profile as the hypothetical refractive-index profile with the adapted parameters.

An inspection system includes a detection device arranged between a connector that couples a plurality of optical fibers to a port and the port; and a determination device that determines whether there is dart between the connector and the port, based on an output from the detection device, wherein the detection device includes a plurality of diodes that convert light that is output from each of the plurality of optical fibers to an electrical signal indicating intensity and distribution of the light, and the determination device includes a processor configured to determine whether there is dart between the connector and the port, based on the intensity and distribution of the light, which are indicated by the electrical signal.