Patent classifications
G01N3/303
Method for preparing silicon carbide wafer and silicon carbide wafer
A method for preparing a SiC ingot includes: disposing a raw material and a SiC seed crystal facing each other in a reactor having an internal space; subliming the raw material by controlling a temperature, a pressure, and an atmosphere of the internal space; growing the SiC ingot on the seed crystal; and collecting the SiC ingot after cooling the reactor. The wafer prepared from the ingot, which is prepared from the method, generates cracks when an impact is applied to a surface of the wafer, the impact is applied by an external impact source having mechanical energy, and a minimum value of the mechanical energy is 0.194 J to 0.475 J per unit area (cm.sup.2).
Method for preparing silicon carbide wafer and silicon carbide wafer
A method for preparing a SiC ingot includes: disposing a raw material and a SiC seed crystal facing each other in a reactor having an internal space; subliming the raw material by controlling a temperature, a pressure, and an atmosphere of the internal space; growing the SiC ingot on the seed crystal; and collecting the SiC ingot after cooling the reactor. The wafer prepared from the ingot, which is prepared from the method, generates cracks when an impact is applied to a surface of the wafer, the impact is applied by an external impact source having mechanical energy, and a minimum value of the mechanical energy is 0.194 J to 0.475 J per unit area (cm.sup.2).
Assembly for FOPS test
A falling-object protective structures (FOPS) test assembly for carrying a FOPS test of a wall of cab of a heavy vehicle is configured to releasably carry a test ball for the FOPS test above a predefined distance above wall. The FOPS test assembly defines a closed path for test ball from its housing position to wall, and includes a handling means configured to assume a first condition in which they do not interfere with the passage of test ball through the closed path when ball passes through closed path in a first direction and a second condition in which handling means lock and hold test ball within the closed path once test ball passes again through the closed path in a second direction opposite to the first direction.
Assembly for FOPS test
A falling-object protective structures (FOPS) test assembly for carrying a FOPS test of a wall of cab of a heavy vehicle is configured to releasably carry a test ball for the FOPS test above a predefined distance above wall. The FOPS test assembly defines a closed path for test ball from its housing position to wall, and includes a handling means configured to assume a first condition in which they do not interfere with the passage of test ball through the closed path when ball passes through closed path in a first direction and a second condition in which handling means lock and hold test ball within the closed path once test ball passes again through the closed path in a second direction opposite to the first direction.
GLOVE IMPACT RESISTANCE TESTING
An impact resistance test method of a glove having a protective material includes applying an impact force, with an impactor, to the glove at a plurality of locations on a section of the glove, measuring, with a load cell, a transferred impact force transferred through the section of the glove, and determining an impact resistance of the glove based on the measured transferred impact force. The impactor has a predetermined weight and is dropped from a predetermined height to apply the impact force to the section of the glove. An apparatus for carrying out the test method is also provided.
GLOVE IMPACT RESISTANCE TESTING
An impact resistance test method of a glove having a protective material includes applying an impact force, with an impactor, to the glove at a plurality of locations on a section of the glove, measuring, with a load cell, a transferred impact force transferred through the section of the glove, and determining an impact resistance of the glove based on the measured transferred impact force. The impactor has a predetermined weight and is dropped from a predetermined height to apply the impact force to the section of the glove. An apparatus for carrying out the test method is also provided.
Technique for Testing the Ball Dent Properties of a Sample
A method for testing a sample for ball dent properties is provided. The method comprises disposing a sample on a stage of a testing apparatus and moving a trigger assembly that contains a tip having a radiused terminus toward the sample such that the terminus impacts the sample one or more times.
Technique for Testing the Ball Dent Properties of a Sample
A method for testing a sample for ball dent properties is provided. The method comprises disposing a sample on a stage of a testing apparatus and moving a trigger assembly that contains a tip having a radiused terminus toward the sample such that the terminus impacts the sample one or more times.
Test apparatus for window drop
A window drop test apparatus includes a support protruding in a first direction from the prop, and a guide portion that defines a drop space together with the support, where a drop test is performed through the drop space.
Test apparatus for window drop
A window drop test apparatus includes a support protruding in a first direction from the prop, and a guide portion that defines a drop space together with the support, where a drop test is performed through the drop space.