Provided is a fixture applied to sticking a strain gauge on a Hopkinson square bar and a use method of the fixture. The invention is specially designed for a square waveguide bar, and the fixture further ensures consistency of the same group of strain gauges along a cross-section position of the bar. The fixture has important practical value in application in a dynamic true triaxial electromagnetic Hopkinson bar test, especially in a high-end material testing field requiring high-precision and high-reliability test data.

Provided is a fixture applied to sticking a strain gauge on a Hopkinson square bar and a use method of the fixture. The invention is specially designed for a square waveguide bar, and the fixture further ensures consistency of the same group of strain gauges along a cross-section position of the bar. The fixture has important practical value in application in a dynamic true triaxial electromagnetic Hopkinson bar test, especially in a high-end material testing field requiring high-precision and high-reliability test data.

Techniques are provided for current collector diagnosis. In one embodiment, the techniques involve determining that a current is flowing through a current collector of the battery cell, generating a mechanical excitation to the current collector, determining an amplitude of the voltage across the battery cell based on the mechanical excitation, and determining a presence of a tear or a separation of a foil of the current collector based on the amplitude of the voltage across the battery cell.

Techniques are provided for current collector diagnosis. In one embodiment, the techniques involve determining that a current is flowing through a current collector of the battery cell, generating a mechanical excitation to the current collector, determining an amplitude of the voltage across the battery cell based on the mechanical excitation, and determining a presence of a tear or a separation of a foil of the current collector based on the amplitude of the voltage across the battery cell.

A star infiltration device and method of measuring the gravitational acceleration and soil-bearing capacity of a star are provided. The infiltration device is multifunctional and has a variable ramming frequency intensity. It comprises an infiltrator in which a rammer is driven by solenoid coils to move up and down in a conducting pipe to cause the infiltrator to penetrate a layer of star soil. Planetary gravitational acceleration is measured while the infiltrator is in the penetration state, star soil softness is evaluated during the penetration process, and star soil thermal parameters and temperature fluctuations are measured after penetration.

A star infiltration device and method of measuring the gravitational acceleration and soil-bearing capacity of a star are provided. The infiltration device is multifunctional and has a variable ramming frequency intensity. It comprises an infiltrator in which a rammer is driven by solenoid coils to move up and down in a conducting pipe to cause the infiltrator to penetrate a layer of star soil. Planetary gravitational acceleration is measured while the infiltrator is in the penetration state, star soil softness is evaluated during the penetration process, and star soil thermal parameters and temperature fluctuations are measured after penetration.

The present invention relates to an in-situ micro-nano impact indentation testing instrument, falling within the technical field of material micromechanical testing. The instrument comprises a nitrogen generation module, an environmental chamber, a high/low temperature loading module, an optical-infrared in-situ monitoring module, an electromagnetic-piezoelectric coupling impact module, etc. After the nitrogen is introduced into the environmental chamber and the test area is determined by microscopic imaging, the electromagnetic-piezoelectric coupling impact module can drive an indenter to indent a specimen. An acoustic emission sensor embedded in the high/low temperature loading module can monitor the surface crack propagation of the specimen. The optical-infrared in-situ monitoring module can perform real-time high-speed optical imaging and infrared imaging on the impact indentation process. The present invention can perform micro-nano impact indentation testing on the material at high or low temperatures.

The present invention relates to an in-situ micro-nano impact indentation testing instrument, falling within the technical field of material micromechanical testing. The instrument comprises a nitrogen generation module, an environmental chamber, a high/low temperature loading module, an optical-infrared in-situ monitoring module, an electromagnetic-piezoelectric coupling impact module, etc. After the nitrogen is introduced into the environmental chamber and the test area is determined by microscopic imaging, the electromagnetic-piezoelectric coupling impact module can drive an indenter to indent a specimen. An acoustic emission sensor embedded in the high/low temperature loading module can monitor the surface crack propagation of the specimen. The optical-infrared in-situ monitoring module can perform real-time high-speed optical imaging and infrared imaging on the impact indentation process. The present invention can perform micro-nano impact indentation testing on the material at high or low temperatures.

The present invention provides a micro-nano impact indentation testing device and method based on cyclic refrigeration, and relates to the technical field of material property testing. The testing device comprises a pressure rod and a stage for low-temperature micro-nano impact indentation testing, and a refrigeration device for refrigerating and cooling the pressure rod and the stage, wherein the refrigeration device refrigerates the pressure rod and the stage by adopting an embedded channel, a cold conduction wire connected to the pressure rod and the stage and a refrigeration balancer in contact with the cold conduction wire are arranged between the pressure rod and the stage, and the temperature of the pressure rod and the temperature of the stage are stabilized at a common temperature point by the cold conduction wire and the refrigeration balancer together.

The present invention provides a micro-nano impact indentation testing device and method based on cyclic refrigeration, and relates to the technical field of material property testing. The testing device comprises a pressure rod and a stage for low-temperature micro-nano impact indentation testing, and a refrigeration device for refrigerating and cooling the pressure rod and the stage, wherein the refrigeration device refrigerates the pressure rod and the stage by adopting an embedded channel, a cold conduction wire connected to the pressure rod and the stage and a refrigeration balancer in contact with the cold conduction wire are arranged between the pressure rod and the stage, and the temperature of the pressure rod and the temperature of the stage are stabilized at a common temperature point by the cold conduction wire and the refrigeration balancer together.