Patent classifications
G01N2013/0241
CONTACT ANGLE MEASUREMENT WITH SONICATION
A contact angle measurement system includes a housing, a rock sample holder positioned within the housing, a fluid dropper attached to the housing, and a sonicator attached to the housing. The holder can support a rock sample whose contact angle is to be measured. The fluid dropper is positioned relative to the holder to drop a fluid droplet on the rock sample when the rock sample is supported by the holder. The housing can transmit the sound wave to the fluid droplet on the rock sample, and the sound wave can sonically remove the fluid droplet from the rock sample.
DYNAMIC CONTACT ANGLE MEASUREMENT
A contact angle measurement system includes a housing that can hold a volume of a first fluid having a first density, an adjustable rock sample holder positioned within the housing, a fluid dropper attached to the housing, an image capturing a device, and a computer system. The holder can support a rock sample. An orientation of the holder relative to the housing is adjustable such that an outer surface of the rock sample is at a non-zero angle relative to a lower wall of the housing. When the orientation of the holder relative to the housing is such that the outer surface of the rock sample is at the non-zero angle relative to the lower wall, the fluid droplet traverses the outer surface of the rock sample. The image capturing device can capture images of the fluid droplet as the fluid droplet traverses the outer surface of the rock sample.
WETTABILITY TESTER
There is provided a wettability tester using a test material in a molten state, including: a chamber; a vacuum exhaust section exhausting the chamber; a gas supply section supplying a predetermined gas into the chamber; a sample stage disposed in the chamber; and an observation section observing morphological change associated with a temperature distribution in the test material tapped onto the sample stage, wherein the vacuum exhaust section and the gas supply section establish a vacuum atmosphere, an inert gas atmosphere, a reducing atmosphere or an air atmosphere in the chamber. It is preferable to include: a melting section disposed above the sample stage and transforming the test material into a molten state; and a tapping control section causing the test material transformed into a molten state by the melting section to be tapped.
Determining physical parameters of a liquid with simulation
A method for determining physical parameters of an unknown liquid to be aspirated and/or dispensed by a laboratory automation device comprises: determining physical parameters of a pipette, the physical parameters including geometric parameters of the pipette, which at least include a tip radius of an orifice of the pipette; aspirating and/or dispensing the unknown liquid with a pipette of the laboratory automation device and measuring a measured pressure curve in the pipette during aspirating and/or dispensing; determining the physical parameters of the unknown liquid by minimizing an objective function depending on a difference between a simulated pressure curve and the measured pressure curve, wherein the simulated pressure curve simulates a pressure in the pipette during aspirating and/or dispensing and is calculated based on a physical model of the laboratory automation device including the physical parameters of the pipette.
Determining Physical Parameters of a Liquid
A method for determining physical parameters of a liquid to be aspirated and/or dispensed by a laboratory automation device comprises: picking up of a pipette with the laboratory automation device; lowering the pipette into a sample container with the laboratory automation device, the sample container containing the liquid; aspirating and dispensing air and liquid with the laboratory automation device in such a way, that a liquid level in the pipette solely rises in a first step and solely lowers in a second step, such that an interior surface of the pipette is wetted with liquid solely one time; and during aspirating and dispensing air and liquid, measuring a pressure curve in the pipette and determining the physical parameters from the pressure curve, the physical parameters comprising at least one of a surface tension, a wetting angle and a viscosity.
Instrument and method for accurate measurement of surface viscosity of viscous liquid
A method is provided for determining the surface viscosity of a liquid in which a thread is formed from a drop of the liquid. The thread is lengthened and its minimum radius h.sub.0 is determined at multiple times between the thread formation and thread pinch-off. The minimum radius and associated time values are used to determine a linear relationship of minimum radius and time, with the coefficient of the linear relationship, or the slope X of the line in the linear relationship, corresponding to the surface viscosity ?.sub.s of the liquid according to one of the following equations:
where B.sub.s0=?.sub.s/?R in which h.sub.0 is defined as above, R is the dimension of the feature on which the drop is provided and ? is the bulk viscosity of the liquid, or
Systems and methods for generation and observation of pendant droplets by preferential condensation
Systems and methods for droplet generation are suitable for use in connection with goniometers. Via preferential condensation, droplets of a variety of liquids may be formed at a variety of temperatures and pressures, eliminating the need for expensive and complex conventional droplet generation systems. Condensation and evaporation of a droplet may be controlled in order to evaluate advancing and receding contact angles in the goniometer.
METHOD OF MEASURING CONTACT ANGLE OF SILICON WAFER AND METHOD OF EVALUATING SURFACE CONDITION OF SILICON WAFER
A method of measuring the contact angle of a silicon wafer according to the present disclosure can detect differences in the severe hydrophilicity level of the silicon wafer surface, such differences not being detectable by contact angle measurement using pure water. The method of measuring a contact angle of a silicon wafer includes dripping a droplet on a surface of a silicon wafer, and measuring a contact angle of the surface of the silicon wafer from an image of the droplet. The droplet includes an aqueous solution having a surface tension greater than a surface tension of pure water.
Apparatus and method for measuring surface tension
The present invention relates to an apparatus and method for measuring surface tension. More particularly, the present invention relates an apparatus and method for measuring surface tension through an electrical scheme which is simpler and has improved accuracy compared to a conventional optical scheme.
Experimental device and method for testing foam fluid properties and defoaming separation effects
An experimental device and method for testing foam fluid properties and defoaming separation effects, the experimental device including a foam generation module configured to generate a foam fluid, an experimental loop configured to transport the foam fluid and enable the foam fluid to sufficiently develop in a loop, a foam property test module configured to test foam fluid properties, a foam separation processing module configured to separate foam from fluid and gas, and a defoaming result evaluation module configured to test and evaluate defoaming results. In the method, different foam fluids are generated in the foam generation module and are transported to the foam property test module and different foam separation processing modules through the experimental loop, and the foam properties of the foam fluids and defoaming separation effects are measured by the foam property test module and the defoaming result evaluation module connected to the foam separation processing module.