A method for the quantitative and/or qualitative detection of particles in fluid, with which the fluid to be examined is introduced into a beam path of an optical device, between at least one light source and the image acquisition sensor with a matrix of light-sensitive cells. Pixel values of the cells are detected and the distribution of the pixel values is at least partly determined. The pixel value or values which have been determined most often are used as a value or average value for a background signal. A signal is outputted or the method is interrupted, on reaching a maximal permissible value for the background signal.

A sealing arrangement and method of a measuring device are disclosed, the measuring device having one or more measuring elements that have a surface in contact with a fluid being measured, a fluid chamber for the fluid being measured, and a seal to seal the joint between the fluid chamber and the measuring element. Flow channels have been formed in the measuring device to lead the rinsing fluid in contact with the seal.

A sealing arrangement and method of a measuring device are disclosed, the measuring device having one or more measuring elements that have a surface in contact with a fluid being measured, a fluid chamber for the fluid being measured, and a seal to seal the joint between the fluid chamber and the measuring element. Flow channels have been formed in the measuring device to lead the rinsing fluid in contact with the seal.

In situ dynamic protection of an optical element surface against degradation includes disposing the optical element in an interior of an optical assembly for the FUV/VUV wavelength range and supplying at least one volatile fluorine-containing compound (A, B) to the interior for dynamic deposition of a fluorine-containing protective layer on the surface. The protective layer (7) is deposited on the surface layer by layer via a molecular layer deposition process. The compound includes a fluorine-containing reactant (A) supplied to the interior in a pulsed manner. A further reactant (B) is supplied to the interior also in a pulsed manner. An associated optical assembly includes an interior in which a surface is disposed, and at least one metering apparatus (123) that supplies a reactant to the interior. The metering apparatus provides a pulsed supply of the compound as a reactant (A, B) for layer by layer molecular layer deposition.

A cleaning device for cleaning an outer portion of a sensor includes: a pump connected to an air supply line; a pressure accumulator connected to the pump in a housing of the cleaning device, which can be mounted on the sensor; and an exhaust air duct with a pressure-controlled valve connected to the pressure accumulator and connected to at least one nozzle which is aligned on the outer portion to be cleaned. The cleaning device is configured to perform pressure-surge cleaning operations in which air drawn in by the pump is compressed in the pressure accumulator, and the compressed air in the pressure accumulator is expelled as a pressure surge via the at least one nozzle when pressure exerted by the compressed air enclosed in the pressure accumulator exceeds a pressure value required to temporarily open the pressure-controlled valve.

A cleaning device for cleaning an outer portion of a sensor includes: a pump connected to an air supply line; a pressure accumulator connected to the pump in a housing of the cleaning device, which can be mounted on the sensor; and an exhaust air duct with a pressure-controlled valve connected to the pressure accumulator and connected to at least one nozzle which is aligned on the outer portion to be cleaned. The cleaning device is configured to perform pressure-surge cleaning operations in which air drawn in by the pump is compressed in the pressure accumulator, and the compressed air in the pressure accumulator is expelled as a pressure surge via the at least one nozzle when pressure exerted by the compressed air enclosed in the pressure accumulator exceeds a pressure value required to temporarily open the pressure-controlled valve.

A gas sensor has a light detector, a gas-tight support structure enclosing the light detector, a window positioned in said support structure, and a light source mounted to the support structure. A sample area is positioned in the support structure to receive a gas to be tested. The light source is aligned with the window, sample area, and the light detector to pass light from the light source through the gas in the sample area to the light detector. The sensor can be provided in a breadth sampling apparatus that has deflects gas to a bypass route so that only a portion of gas reaches the sensor.

A device and method for protecting an optical sensor of a vehicle are disclosed, wherein the sensor is protected from environmental pollutants which may adhere to an optical surface of the sensor if the sensor is exposed to them, and wherein the environmental pollutants are kept away from the sensor by an ultrasonic cleaning of the sensor surface using an ultrasonic field. The ultrasonic field of the ultrasonic cleaning is emitted by a protection device into the air to provide a protection zone around the optical surface of the sensor such that a contact of the optical surface with the environmental pollutants is avoided, wherein the environmental pollutants are moved and/or destroyed in the air away from the sensor if they enter the protection zone), and wherein the protection zone provides a contactless cleaning of the sensor.

A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transport arm configured to (i) detachably couple the cleaning member, (ii) move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and (iii) decouple the cleaning member.

A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transport arm configured to (i) detachably couple the cleaning member, (ii) move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and (iii) decouple the cleaning member.