An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.

A method is disclosed for selecting an optimal value for an adjustable parameter of a structured light metrology (SLM) system, for scanning an object. The SLM system performs test scans of the object to acquire a plurality of sets of measurements of the object, wherein a different value is used for the parameter for each test scan. For each test scan, a value of a quality metric is calculated, based on the set of measurements of the object associated with the test scan and simulation data representing a simulated scan of the object by the SLM system. A test scan is then identified that has a quality metric value that satisfies a specified optimization criterion; and a value of the adjustable parameter that was used for the identified test scan is selected as the optimal value of the adjustable parameter, for scanning the object.

An optical apparatus comprises an ultraviolet light source (100) configured to transmit the ultraviolet light to a sample (102), one or more wavelength dependent beam splitters (104) and at least two separate detectors (106, 108). Each beam splitter (104) receives, from the sample (102), a band of excitating ultraviolet light and at least one band of fluorescence associated with an interaction between the excitating ultraviolet light and the sample (102) in the optical path through the sample (102), directs the band of excitating ultraviolet light passed through the sample (102) towards a first detector (106), and directs the at least one band of the fluorescence towards at least one separate detector (108). The first detector (106) and the at least one separate detector (108) are simultaneously configured to form electrical signals carrying information on powers of the bands of the ultraviolet light and the fluorescence, respectively. The signal processing unit (110) configured to measure the at least one property of the sample (102) on the basis of a signal from the first detector (106) and each signal from the at least one separate detector (108).

A device for real-time analysis of airborne chemical, biological and explosive substances has at least a gas analysis sensor, a fluorescence/luminescence sensor and a sensor for determining the particle size and number of particles. Each of the sensors is connected to a multireflection cell (multipass laser cell) as an open measurement path. In addition, the device also includes an evaluation unit for the real-time analysis of chemical, biological and explosive substances.

A scattered light polarimetry (LSP) sub-system of a hybrid system for characterizing stress in a chemically-strengthened (CS) substrate having a top-surface and a near-surface waveguide, includes a LSP light source system, an LSP light source actuator coupled to the LSP light source system, and an optical compensator within an optical path of a LSP laser beam emitted by the LSP light source system. The optical compensator includes a half-wave plate, a half-wave plate actuator, a diffuser, and a diffuser actuator. The LSP sub-system further includes a LSP detector system in optical communication with the optical compensator through an LSP coupling prism having a LSP coupling surface, a focusing lens and a focusing lens actuator, and a support plenum having a surface and a measurement aperture, the support plenum configured to support the CS substrate at a measurement plane at the measurement aperture, and to operably support the LSP coupling prism.