Patent classifications
G01N2021/1765
INSPECTION APPARATUS, PTP PACKAGING MACHINE, AND METHOD FOR MANUFACTURING PTP SHEET
An inspection device includes: an illumination device that irradiates an object with near infrared light; a spectroscope that disperses reflected light from the object irradiated with the near infrared light; an imaging device that takes a spectroscopic image of the reflected light dispersed by the spectroscope; and a processor. The processor: obtains spectral data at a plurality of points on the object based on the spectroscopic image obtained by the imaging device; selects, as typical spectral data representing the object from among the spectral data at the plurality of points, one of: spectral data in which a luminance value in a predetermined wavelength is a median value; and spectral data in which a summation of luminance values in a predetermined wavelength range is a median value; and performs a predetermined analysis for the object based on the typical spectral data and detects a different type of object.
A DETECTION SYSTEM FOR DETECTING MATTER AND DISTINGUISHING SPECIFIC MATTER FROM OTHER MATTER
The present disclosure provides a detection system for detecting matter and distinguishing specific matter from other matter. The detection system comprises a spectral analysis system configured to at least assist in determining whether matter comprises the specific matter based on an intensity of light reflected from the specific matter. The spectral analysis system comprises a light source capable of emitting light having at least one known wavelength or wavelength range. Further, the spectral analysis system comprises an optical element for directing the emitted light towards the matter. The spectral analysis system also comprises a detector for detecting light reflected from the matter and a spatial analysis stem. The spatial analysis system is configured to at least assist in determining whether the matter comprises the specific matter based on a shape of the matter. The spatial analysis system comprising an image capturing device for capturing an image of the matter. Further, the spatial analysis system comprises an outcome determination system arranged to receive a first input from the spectral analysis system and a second input from the spatial analysis system, and determine an outcome providing an indication of whether the matter is specific matter based on the first and second inputs.
IMAGE CALIBRATION METHOD FOR IMAGING SYSTEM
An image calibration method for imaging system is provided, including: specifying a detection area located in an image capture scope and the detection area having a unit to be tested; capturing a detection image respectively when the detection area is located in at least two locations within the image capture scope; combining the plurality of detection images and calculating to obtain a calibration figure; and applying the calibration figure to a captured image to complete the calibration. In this way, the calibration figure that adapt to the luminescent type and size of the unit to be tested can be obtained.
SYSTEMS AND METHODS FOR DISCRIMINATION OF TISSUE TARGETS
Systems for and methods for detecting samples and other compounds of interest are disclosed herein. The system can include an illumination source that is configured to emit light in a variety of different wavelength bands, an optical filter, a camera chip, and an optical path configured to direct the light emitted by the first illumination source at a target and direct the light reflected from the target to the at least one camera chip. The illumination source and the optical filter are transitionable between a first tuning state corresponding to a target tissue and a second tuning state corresponding to a background tissue. The system can be configured to record images at the different tuning states and generate a score image corresponding to the target tissue based on the recorded images.
SYSTEM AND METHOD FOR SPECTRAL LIBRARY TRAINING
Techniques, devices and methods for discriminating a target from a background material without optimizing directly on the target are provided. The devices and methods can generate pass bands of single or multiple wavelengths of variable shape and intensity, and can also select and control the shape of the pass band profiles to improve the detection of targets of interest.
METHOD AND DEVICE FOR EVALUATING THE QUALITY OF A COMPONENT PRODUCED BY MEANS OF AN ADDITIVE LASER SINTERING AND/OR LASER MELTING METHOD
A method for evaluating the quality of a component produced by means of an additive laser sintering and/or laser melting method, in particular a component for an aircraft engine, includes at least the steps of providing a first data set, which comprises spatially resolved color values, which each characterize the temperature of the component at an associated component location during the laser sintering and/or laser melting of the component, providing a second data set, which comprises spatially resolved color values corresponding to the first data set, which color values each characterize the temperature of a reference component at an associated reference component location during the laser sintering and/or laser melting of the reference component.
DEVICE, USE OF THE DEVICE AND A METHOD FOR HIGH-CONTRAST IMAGING
The present invention relates to a device, use of the device and a method for high contrast imaging, particularly suitable for imaging of moving object of interest such as gas expanding from a gas jet or physical or chemical or biological processes in material.
The device for high-contrast imaging comprises a beam splitter for splitting a beam into a probe beam and a reference-beam, wherein the probe beam is directed to an object; a self-imaging system for receiving the probe beam from the object and imaging the object on itself while in a preferred embodiment, the system preserves the a reflected probe beam divergence. The beam interacts with the object at least twice; and the reflected probe beam is further directed to the splitter after the last interaction; and detection means receiving the probe beam from the splitter.
Scanning trajectories for region-of-interest tomograph
Apparatuses and methods for implementing scanning trajectories for ROI tomography are disclosed herein. An example method includes determining a first focus object distance based on a circumradius of a sample, the sample including a region of interest, determining a second focus object distance based on a radius of a smallest cylinder that contains the region of interest, determining a plurality of viewing angles from a plurality of possible viewing angles in response to the first focus object distance, where each viewing angle of the plurality of viewing angles has an associated focus object distance measured from the region of interest, and where the associated focus object distance of each of the plurality of viewing angles is less than the first focus object distance and greater than the second focus object distance, and scanning the region of interest using at least the plurality of viewing angles.
SAMPLE TESTING APPARATUS
An apparatus for performing an optical test of a sample comprises a receptacle for accepting a specimen slide, at least one illumination element, an optical lens, and image acquisition apparatus, all having fixed positioned relationships relative to said receptacle.
FOREIGN SUBSTANCE INSPECTION APPARATUS AND FOREIGN SUBSTANCE INSPECTION METHOD
Apparatus inspects the presence/absence of foreign substance on object having inspection region and non-inspection region arranged outside the inspection region. The apparatus includes sensor for illuminating the object and output, as image, result acquired by detecting light from region including the inspection region, and processor for detecting foreign substance based on inspection region image acquired by excluding non-inspection region image, which is image of the non-inspection region, from the image output from the sensor. The non-inspection region image includes first part generated by light from predetermined part of the non-inspection region of the inspected object and second part whose pixel value is continuous from pixel value of the first part and the processor specifies the second part based on fact that the pixel value of the second part is continuous from that of the first part.