A photographing condition determining method includes: photographing a part of a metal structure of a metal material subjected to predetermined sample preparation under a predetermined photographing condition; assigning, to pixels corresponding to one or a plurality of predetermined phases of the metal structure, labels of respective phases for a photographed image; calculating one or more feature values for a pixel to which a label of one of the assigned phases; classifying the phases of the metal structure of the image by inputting a calculated feature value to a model, which has been learned in advance using feature values assigned with labels of respective phases as input and labels of the respective phases as output, and acquiring a label of a phase of a pixel corresponding to the input feature value; and determining a photographing condition when other parts of the metal structure are photographed based on a classification result.

Some embodiments described herein relate to a method that includes separating an analyte-containing sample via electrophoresis in a capillary. The capillary is loaded with a chemiluminescence agent, such as luminol, that is configured to react with the analyte (e.g., HRP-conjugated proteins) to produce a signal indicative of a concentration and/or quantity of analyte at each location along the length of the capillary. A first image of the capillary containing the analytes and the chemiluminescence agent is captured over a first period of time. A second image of the capillary containing the analytes and the chemiluminescence agent is captured over a second, longer, period of time. A concentration and/or quantity of a first population of analytes at a first location is determined using the first image, and a concentration and/or quantity of a second population of analytes at a second location is determined using the second image.

The present invention relates to an optical nanostructure sensing device and an image analysis method. The image analysis method includes: illuminating a light beam from a predetermined incident angle onto a nanostructure pixel sensor; capturing images of the nanostructure pixel sensor when applying an analyte on the nanostructure pixel sensor; obtaining a relationship of periodic spacing and brightness from each of the images; and obtaining wavelength values from the relationship of periodic spacing and brightness at a predetermined brightness value; and determining a sensing process based on a wavelength shift of the wavelength values. The nanostructure pixel sensor includes a plurality of the nanostructure pixels, each of the nanostructure pixels includes periodic nanostructures, and the relationship of periodic spacing and brightness is based on the brightness of the nanostructure pixels having different periodic spacings.

Methods, apparatuses, and systems associated with a sample testing device are provided.

A method and device of thin film spectroellipsometric imaging are disclosed. The device comprises an illuminator to direct light through a polarization generator system toward an extended area of a sample; an imaging system to form images; a detection system to record in a plurality of spectral channels; a computer to display and analyze the recorded images; and at least one reference phantom with known optical properties to replace the sample for calibration. The method comprises directing light from an illuminator through a polarization generator system toward an extended area of a sample having a geometrical shape; forming images with an imaging system; adjusting a polarization generator system and a polarization analyzer system to obtain a series of polarimetric setups; recording the images with a detection system in a plurality of spectral channels; replacing the sample with at least one reference phantom; and analyzing the recorded images with a computer.

Technology described herein includes a method that includes obtaining an image of a fluid of a microfluidic analysis system. The microfluidic analysis system includes or receives a container that contains the fluid for measurement of analyte or quality determination. A region of interest (ROI) is identified based on the image. The ROI is a set of pixel values for use in the measurement of the analyte or the quality determination of the fluid, fluidic path, or measuring system. Identifying the ROI includes: determining an alignment of the container of the fluid with the imaging device based on the image, and identifying the ROI based on information about the measurement of the fluid or based on information about non-analyte features of the fluid. An analysis of the image of the fluid is performed using the set of pixel values of the ROI.

A turbidimeter (1) according to the present disclosure is for measuring turbidity of an object to be measured (S) and includes a light source (21) that irradiates an irradiation light (L1) towards the object to be measured (S), a light receiver (22) including a solid-state image sensor (222) that outputs a detection signal of light to be measured (L2) that includes transmitted light (L21) and scattered light (L22) based on the irradiation light (L1) irradiated towards the object to be measured (S), and a controller (31) that calculates a spatial distribution (D) of intensity of the light to be measured (L2) on a light-receiving surface (A) of the solid-state image sensor (222) based on a detection signal of the light to be measured (L2) and calculates the turbidity based on the calculated spatial distribution (D).

Certain implementations of the subject matter can be implemented as a method of screening demulsifiers for live crude oil-water emulsions. A live emulsion of a hydrocarbon sample and a water sample is flowed through a capillary viscometer. The live emulsion includes dissolved gases retrieved from a hydrocarbon-carrying reservoir. While flowing the live emulsion through the capillary viscometer, a demulsifier sample is flowed through the capillary viscometer. The demulsifier sample causes breakdown of the live emulsion. Using the capillary viscometer, change in a viscosity of the live emulsion over time resulting from the breakdown of the live emulsion due to the demulsifier sample is measured. Multiple images of the breakdown of the live emulsion over time are captured. A strength of the live emulsion is classified based, in part, on the change in the viscosity of the live emulsion over time and on the plurality of images.

Provided is a wafer inspection apparatus including a monochromator that extracts monochromatic light, a collimator that outputs the monochromatic light as parallel light, a first polarization assembly that polarizes the parallel light and radiates the polarized light to a wafer, an imaging optical system that condenses light reflected from the wafer, a spectroscope that splits the condensed light into a plurality of spectrums, a first lens that condenses the plurality of spectrums, a second polarization assembly that outputs the plurality of spectrums as a plurality of polarized lights having different diffraction orders and a difference of 90°, a second lens that condenses the plurality of polarized lights, a third polarization assembly that outputs common polarized light based on the plurality of polarized interfering with each other, a camera that generates a phase difference image based on the common polarized light, and a signal processor that analyzes the phase difference image.

A method of manufacturing a display device includes: providing a glass including an edge region and an inner region; arranging a light source under the glass; setting a center position of the light source to correspond to an inside of the edge region or an inside of the inner region of the glass; directing light into the glass by using the light source; and detecting a defect in the edge region of the glass by receiving light passing through the glass by using a detection camera.