Aspects relate to devices, systems, and methods for non-invasive testing. The device may include a cartridge that analyzes a nasopharyngeal swabbing sample. The device may also include first and second waveguides, where each waveguide is configured to propagate an electromagnetic (EM) wave.

Aspects relate to devices, systems, and methods for non-invasive testing. The device may include a cartridge that analyzes a nasopharyngeal swabbing sample. The device may also include first and second waveguides, where each waveguide is configured to propagate an electromagnetic (EM) wave.

The present disclosure describes a computer implemented method, a system, and a computer program product of determining intrinsic viscosity and Huggins constant of an unknown sample. In an embodiment, the method, system, and computer program product include receiving concentration detector signal values over time from a concentration detector corresponding to a series of aliquots of an unknown sample injected into an instrument chain, receiving specific viscosity values over time from a viscometer corresponding to the series of aliquots, calculating a total mass of each of the aliquots, calculating a first intermediate viscosity value of each of the aliquots, calculating a second intermediate viscosity value of each of the aliquots, and fitting the total mass, the first intermediate viscosity value, and the second intermediate viscosity value to a fitting, resulting in a calculated intrinsic viscosity of the unknown sample and a calculated Huggins constant of the unknown sample.

The present disclosure describes a computer implemented method, a system, and a computer program product of determining intrinsic viscosity and Huggins constant of an unknown sample. In an embodiment, the method, system, and computer program product include receiving concentration detector signal values over time from a concentration detector corresponding to a series of aliquots of an unknown sample injected into an instrument chain, receiving specific viscosity values over time from a viscometer corresponding to the series of aliquots, calculating a total mass of each of the aliquots, calculating a first intermediate viscosity value of each of the aliquots, calculating a second intermediate viscosity value of each of the aliquots, and fitting the total mass, the first intermediate viscosity value, and the second intermediate viscosity value to a fitting, resulting in a calculated intrinsic viscosity of the unknown sample and a calculated Huggins constant of the unknown sample.

A digital microfluidic (DMF) system, DMF cartridge, and method including integrated refractive index (RI) sensing is disclosed. The digital microfluidic DMF system and DMF cartridge may include, for example, a RI sensor (or sensor surface) directly in the droplet operations gap of a DMF cartridge. The digital microfluidic DMF system may include, for example, the DMF cartridge, one or more illumination sources, one or more optical measurement devices, and a controller. Additionally, a method of using the DMF system and DMF cartridge that includes integrated RI sensing is provided.

An optical probe for a bio-sensor selectively conjugated to a target analyte and configured to retro-reflect incident light thereto is disclosed. The optical probe for the bio-sensor includes: a transparent core particle; a total-reflection inducing layer covering a portion of a surface of the core particle, the inducing layer is made of a material having a refractive index lower than a refractive index of the core; a modifying layer formed on the total-reflection inducing layer; and an analyte-sensing substance bound to the modifying layer, the sensing substance is selectively conjugated to the target analyte. This optical probe may serve as an excellent optical probe for both a non-spectral light source and a spectral light source.

An electromagnetic wave detecting device comprising: an emission unit configured to emit electromagnetic waves having coherence; an electromagnetic wave modulating unit configured to modulate one or both of a phase and an amplitude of the emitted electromagnetic waves and to change a state of the modulation relative to an imaging target; and a post-modulation electromagnetic wave intensity detecting unit configured to detect an intensity of post-modulation electromagnetic waves, which are the modulated electromagnetic waves acquired by modulating the electromagnetic waves emitted from the emission unit using the imaging target and the electromagnetic wave modulating unit, using one pixel.

An electromagnetic wave detecting device comprising: an emission unit configured to emit electromagnetic waves having coherence; an electromagnetic wave modulating unit configured to modulate one or both of a phase and an amplitude of the emitted electromagnetic waves and to change a state of the modulation relative to an imaging target; and a post-modulation electromagnetic wave intensity detecting unit configured to detect an intensity of post-modulation electromagnetic waves, which are the modulated electromagnetic waves acquired by modulating the electromagnetic waves emitted from the emission unit using the imaging target and the electromagnetic wave modulating unit, using one pixel.

Described are systems and techniques directed to optical inspection of moving products (wafers, substrates, films, patterns) that are being transported to or from processing chambers in device manufacturing systems. Implementations include a system that has a first source of light to direct a first light to a first location on a surface of a product. The first light generates, at the first location, a first reflected light. The system further includes a first optical sensor to generate a first data representative of a first reflected light, and a processing device, in communication with the first optical sensor to determine, using the first data, a property of the product.

Described are systems and techniques directed to optical inspection of moving products (wafers, substrates, films, patterns) that are being transported to or from processing chambers in device manufacturing systems. Implementations include a system that has a first source of light to direct a first light to a first location on a surface of a product. The first light generates, at the first location, a first reflected light. The system further includes a first optical sensor to generate a first data representative of a first reflected light, and a processing device, in communication with the first optical sensor to determine, using the first data, a property of the product.