An Integrated Circuit (IC) chip with a lab-on-a-chip, a method of manufacturing the lab-on-a-chip and a method of using the lab-on-a-chip for fluid flow analysis in physical systems through combination with computer modeling. The lab-on-a-chip includes cavities in a channel layer and a capping layer, preferably transparent, covering the cavities. Gates control two dimensional (2D) lattice structures acting as heaters, light sources and/or sensors in the cavities, or fluid channels. The gates and two dimensional (2D) lattice structures may be at the cavity bottoms or on the capping layer. Wiring connects the gates and the 2D lattice structures externally.

A non-contact, non-immersive method and apparatus are provided for accurately measuring quantitatively one or more elements in liquid metal or alloy samples using laser-induced breakdown spectroscopy (LIBS). The method is particularly useful for process and/or quality control within the metallurgy industry for accurately and very quickly measuring minor component or impurity elements in liquid metal in the production process, without touching the liquid metal and without the need for cooling and solidifying samples for analysis. In the method and apparatus a pre-determined distance is dynamically maintained between emission receiving optics and the surface of a liquid sample being analysed and the instrument does not come in contact with the liquid metal surface. Liquid samples are heated and/or maintained at a desired temperature. For many elements, values for limit-of-detection, measurement repeatability and accuracy about or below 1 ppm are achieved using this method.

An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.

An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.

Systems and methods for laser stimulated lock-in thermography (LLT) crack detection are provided. The system includes a spatial light modulator and a controller. The spatial light modulator reflects a laser beam to focus the laser beam onto a sample for detection of a crack, hole or scratch. The controller is coupled to the spatial light modulator and controls operation of the spatial light modulator to switch focus of the laser beam onto the sample between a plurality of LLT focus configurations for detection of the crack, hole or scratch on the sample. The method includes using a first one of the plurality of LLT configurations for coarse scanning of the sample to detect a crack, hole or scratch on the sample and, when a crack, hole or scratch is detected on the sample, switching to a second one of the plurality of LLT configurations for fine scanning of the crack, hole or scratch on the sample to determine one or more parameters of the crack, hole or scratch on the sample.

Systems and methods for laser stimulated lock-in thermography (LLT) crack detection are provided. The system includes a spatial light modulator and a controller. The spatial light modulator reflects a laser beam to focus the laser beam onto a sample for detection of a crack, hole or scratch. The controller is coupled to the spatial light modulator and controls operation of the spatial light modulator to switch focus of the laser beam onto the sample between a plurality of LLT focus configurations for detection of the crack, hole or scratch on the sample. The method includes using a first one of the plurality of LLT configurations for coarse scanning of the sample to detect a crack, hole or scratch on the sample and, when a crack, hole or scratch is detected on the sample, switching to a second one of the plurality of LLT configurations for fine scanning of the crack, hole or scratch on the sample to determine one or more parameters of the crack, hole or scratch on the sample.

Systems and methods for measuring the isotope ratio of one or more gaseous oxides produced during combustion of drugs, pharmaceuticals, or medicines aiming to detect counterfeit drugs, pharmaceuticals, or medicines based on comparison of the isotopic composition of the tested drugs, pharmaceuticals, or medicines with the isotopic composition of the authentic products.

A device may be provided for element analysis of materials by means of optical emission spectroscopy, particularly by means of laser-induced plasma spectroscopy, said device having: means for exciting a plasma from a partial quantity of a test sample made of the material to be analyzed; means for detecting and for spectral analysis of optical radiation emitted from the plasma; beam guidance means for guiding at least a part of the optical radiation emitted from the plasma to the means for detecting and spectral analysis; and means for flushing at least one partial region of the device with an inert gas, wherein the beam guidance means are at least one capillary tube, which additionally serves to guide the inert gas. A method may be provided for element analysis of materials by means of optical emission spectroscopy using the device.

A method and apparatus for monitoring and/or controlling the extent of denaturation and/or bond cleavages of proteins on any surface (e.g., biological tissues, biofilms, etc.). In one embodiment, a low power laser (e.g., a 5 mW, 362 nm diode laser) is directed through a biological sample to a photodetector. The sample is heated by a set of radiant heaters to between about 220° C. and about 250° C. in a time period of between 10 seconds to 60 seconds. The baseline transmissivity of the sample is monitored continuously throughout treatment of the biological sample via continuous monitoring of the signal voltage detected at the photodetector. Upon detection of increase in relative transmissivity in the biological sample, the heating treatment is concluded and the biological sample is removed for in situ protein identification as part of an imaging MALDI-MS measurement.

A particle sensor for detecting particles in a flow of a measuring gas for detecting soot particles in an exhaust gas channel of a burner or of an internal combustion engine. The particle sensor includes a device for generating or for supplying laser light, a device for focusing laser light, and a device for detecting or transferring thermal radiation. The particle sensor includes at least one optical access, which separates an area exposed to the measuring gas from an area facing away from the measuring gas not exposed to the measuring gas, the device for generating or supplying laser light and/or the device for detecting or for transferring thermal radiation being situated in the area facing away from the measuring gas, wherein the particle sensor removes a sub-flow from the measuring gas flow and supplies it to the laser focus and further fluidically shields the optical access from the sub-flow.