An inspection device includes an acquisition unit that acquires a plurality of images, captured from a given height, of an inspection object controlled to move at a constant velocity, a comparison unit that compares movements of the inspection object in the images on the basis of the plurality of images, and a determination unit that determines the condition of the inspection object on the basis of a comparison result.

Methods and systems for determining metrology-like information for a specimen using an inspection tool are provided. One method includes determining first process information for first feature(s) formed in first area(s) on a specimen from output generated by output acquisition subsystem(s) that include an inspection subsystem. The method also includes determining second process information for second feature(s) formed in second area(s) on the specimen from the output and at least a portion of the first process information. At least a portion of the second process information is a different type of information than the first process information. At least a portion of a design for the second feature(s) is different than a design for the first feature(s), and the first area(s) and the second area(s) are mutually exclusive on the specimen.

An object is to provide a monitoring system capable of preventing the occurrence of a defect in paper by monitoring the device. The present invention is directed to a monitoring system A having a papermaking machine 1 for manufacturing paper X, an applying device 2 for applying a chemical solution to a site of the papermaking machine directly or indirectly in contact with the paper while the papermaking machine 1 is operated, a control panel 3 for setting an application condition of the applying device 2, a monitoring camera 4 for monitoring a monitoring target site, and a control device 5 connected to the monitoring camera 4 via a network. The monitoring target site is the site of the papermaking machine 1 directly or indirectly in contact with the paper X and/or the applying device 2, and the control device 5 has a computing unit S1 which converts a state of the monitoring target site into a numerical form by using video taken by the monitoring camera 4, a display unit S2 which displays detection data obtained by conversion into the numerical form at the computing unit S1, and a storage unit S3 which stores the detection data.

A method for quality inspection of laser material processing includes performing laser material processing on a workpiece and generating, by a sensor, raw image data of secondary emissions during the laser material processing of the workpiece. The method also includes determining a quality of the laser material processing by analyzing the raw image data of the secondary emissions.

An appliance for concurrent automated visual inspection of at least two items comprising: at least two inspection assemblies each comprising a camera assembly, wherein each one of the at least two items is inspected by one of the at least two Inspection assemblies; a controller in data communication with the at least two inspection assemblies, wherein the controller is a computing device, wherein the appliance is adapted to be automatically configured for inspecting the at least two items using the at least two inspection assemblies.

According to one embodiment, a determination method is provided. The determination method determines progress of a treatment of a side-product produced in a process of reacting a substance containing a halogen and silicon or reacting a substance containing silicon and a substance containing a halogen. The treatment of the side-product includes bringing the side-product into contact with a treatment fluid containing water to obtain a first solid matter. The determination method includes determining the progress of the treatment of the side-product based on a signal according to a chemical analysis of at least one of an Si-α bond (α is at least one selected from the group consisting of F, Cl, Br, and I) and an Si—H bond, of the first solid matter.

To calculate the properties of a resin composition in a short time and with high accuracy, a resin property value prediction apparatus includes an acquisition unit acquiring spectral data obtained by measuring a resin composition by a spectroscopic sensor in a process of performing a resin polymerization reaction in a batch type reaction tank and a calculation unit, using a learned model learned with spectral data obtained by measuring the resin composition in advance and a resin property value as training data, calculating the resin property value of the resin composition having the spectral data acquired by the acquisition unit.

A system includes a factory interface, an etching tool, and at least one measuring device. The factory interface is configured to carry a wafer. The etching tool is coupled to the factory interface and configured to process the wafer transferred from the factory interface. The at least one measuring device is equipped in the factory interface, the etching tool, or the combination thereof. The at least one measuring device is configured to perform real-time measurements of reflectance from the wafer that is carried in the factory interface or the etching tool.

A method is provided for predicting conjunct polymer concentration in spent ionic liquid during a continuous hydrocarbon conversion process.

An automated inline rip saw system utilizing x-ray and optical scanning techniques to identify and detect flaws within a piece of wood. The present system may further utilize a precision skewing unit which may reduce or eliminate errors while allowing for precision rip cuts to be performed. Further, the present automated inline rip saw system may utilize multiple independently controlled saw blades to perform precision cuts. Finally, the present inline rip saw system may allow for more accurate detection of flaws or undesirable inclusions within the wood earlier in the wood production process, including the ability to scan for, identify, and remove sap wood from green lumber.