A device for determining a layer thickness in a multilayer film includes a radiation source configured to generate an electromagnetic primary radiation, a detector configured to detect an electromagnetic secondary radiation emitted by the multilayer film, the secondary radiation being induced by an interaction of the primary radiation with the multilayer film, and a first contact block transparent to the electromagnetic primary radiation and having a first contact surface for creating contact with the multilayer film. The radiation source is arranged on the first contact block in such a way that the electromagnetic primary radiation is guided from the first contact block onto the multilayer film.

An information processing apparatus includes a controller configured to execute first processing of providing an incentive to a first user who brings a first painting film to a predetermined base. The first painting film is a painting film including an easily peeling layer and that is peeled off from a first vehicle.

A laser irradiation apparatus includes: a laser generation apparatus configured to generate first laser light for performing heat treatment of an object to be processed; a measurement-laser emission unit configured to emit linearly-polarized second laser light toward an irradiation area on the object to be processed to which the first laser light is applied; a first polarizing plate configured to let, of the whole reflected light of the second laser light reflected by the object to be processed, a part of the reflected light that has a first polarization direction pass therethrough; and a measurement-laser detection unit configured to detect the reflected light that has passed through the first polarizing plate.

A sensing apparatus that senses structure of electrode of electrical battery. The electrode is arranged to have layers spatially adjacent thereto that provide a waveguide region that includes a surface of the electrode that changes in structure. The sensing apparatus includes a source of Terahertz electromagnetic radiation, and a coupling arrangement that couples Terahertz electromagnetic radiation from the source into the waveguide region. The Terahertz electromagnetic radiation interacts with features present at the surface. The sensing apparatus includes detector that receives Terahertz electromagnetic radiation that is reflected and/or transmitted through the waveguide region, and processes the Terahertz electromagnetic radiation to determine temporal changes therein that are indicative of dendritic growths occurring at the surface of the electrode or any manufacturing or structural faults.

Processes for rapidly and accurately measuring the coefficient of moisture expansion for materials, such as adhesives, are disclosed. A replication technique may be used to manufacture highly flat and smooth adhesive samples. Moisture is introduced in a controlled humidity atmosphere, distortion is monitored with an accurate laser interferometer (e.g., ˜1 nanometer (nm) accuracy), and measurements are correlated with moisture content change. Such processes decrease sample size by three orders of magnitude as compared with conventional techniques and have a smaller adhesive mass requirement, which enables measurement of expensive microelectronic adhesives that were previously cost-prohibitive to measure. Also, thinner films allow CME measurements of ultraviolet (UV) cured adhesives that would otherwise have depth of penetration issues. Furthermore, saturation occurs quickly, allowing pre-stabilization at room temperature, which enabled parametric studies as a function of processing or cure state. Additionally, testing occurs within hours versus months, enabling short lead times for root-cause investigations.

A resin composition quality controlling method includes a step of measuring a Raman spectrum of a resin composition composed of TiO.sub.2 particles dispersed in a base material mainly composed of a silicone rubber by irradiating the resin composition with laser, and a step of determining a concentration of the TiO.sub.2 particles in the resin composition based on an intensity of a fluorescence spectrum in the Raman spectrum.

A method includes: determining height Z1 of a focus by an optical microscope having autofocus function which uses irradiation light of wavelength λ0 to adjust the focus; determining a wavelength λ1 of irradiation light used for obtaining observation image of second thin film; obtaining observation image of second thin film by using irradiation light of the wavelength λ1, while altering heights of the focus with the Z1 as reference point; calculating standard deviation of reflected-light intensity distribution within the observation image, obtaining height Z2 of the focus corresponding to a peak position where standard deviation is greatest, and calculating a difference ΔZ between Z1 and Z2; correcting the autofocus function with ΔZ as a correction value; and using the corrected autofocus function to adjust the focus, obtaining the observation image of the second thin film, and calculating the film thickness distribution from the reflected-light intensity distribution within the observation image.

A method of determining information indicative of a material attribute of a composition, wherein the method comprises manufacturing the composition using a thermal manufacturing process, detecting detection data from the composition by low coherence interferometry during the manufacturing, in particular during said thermal manufacturing process, and determining the information based on the detected detection data.

The present invention is directed to a coated substrate including a substrate that is part of an aerospace, a wind turbine, or a marine structure; and an exterior coating on the substrate, the exterior coating including an icephobic or a low ice adhesion composition including an indicator that is an additive that is detectable or measurable as the exterior coating wears; wherein the indicator provides indicia of wear of the exterior coating; and a method of inspecting the exterior coating on the substrate.

In an method for inspecting the coating of an electronic component, wherein the electronic component includes at least one electrical resistance element and wherein the layer thickness of at least one coating is determined thermographically, it is provided as essential to the invention that the electrical resistance element is contacted electrically, an electrical voltage is applied to the resistance element, the temperature of the electronic component in the area of the resistance element is captured as a function of time, and a conclusion is drawn about the layer thickness of the coating of the electronic component in the area of the resistance element based on the temperature variation over time.