A defect inspection device is provided with an illumination optical system that irradiates light or an electron beam onto a sample, a detector that detects a signal obtained from the sample through the irradiation of the light or electron beam, a defect detection unit that detects a defect candidate on the sample through the comparison of a signal output by the detector and a prescribed threshold, and a display unit that displays a setting screen for setting the threshold. The setting screen is a two-dimensional distribution map that represents the distribution of the defect candidates in a three dimensional feature space having three features as the axes thereof and includes the axes of the three features and the threshold, which is represented in one dimension.

A method of synchronizing a line scan camera. The method comprises: obtaining line scan data of a region of interest (ROI) of a travelling surface from the line scan camera, the line scan camera being oriented perpendicular to a direction of travel of the travelling surface, the line scan data comprising a plurality of lines; identifying occurrences of a major frequency of a repeated texture on the travelling surface using characterized line scan data for each line in the plurality of lines of the line scan data; determining a period of the major frequency; and changing a line rate of the line scan camera when the determined period is different than a reference period.

An identification apparatus includes: a plurality of light capturing units including light-capturing optical systems configured to capture a plurality of Raman scattered light fluxes from a sample, an optical fiber unit configured to include a plurality of optical fibers configured to respectively guide the captured Raman scattered light fluxes and in which the optical fibers are bundled at emission end portions thereof; a spectral element configured to disperse the guided Raman scattered light fluxes; an imaging unit configured to receive the dispersed Raman scattered light fluxes; and a data processor configured to acquire spectral data of the Raman scattered light fluxes from the imaging unit and configured to perform an identification process. The Raman scattered light fluxes dispersed by the spectral element are projected so that a spectral image formed on a light-receiving surface of the imaging unit extends along a main scanning direction of the imaging unit.

Techniques for processing ore include the steps of causing an imaging capture system to record a plurality of images of a stream of ore fragments en route from a first location in an ore processing facility to a second location in the ore processing facility; correlating the plurality of images of the stream of ore fragments with at least one or more characteristics of the ore fragments using a machine learning model that includes a plurality of ore parameter measurements associated with the one or more characteristics of the ore fragments; determining, based on the correlation, at least one of the one or more characteristics of the ore fragments; and generating, for display on a user computing device, data indicating the one or more characteristics of the ore fragments or data indicating an action or decision based on the one or more characteristics of the ore fragments.

A method and system for optically inspecting parts are provided wherein the system includes a part transfer subsystem including a transfer mechanism adapted to receive and support a part at a loading station and to transfer the supported part by a split belt conveyor so that the part travels along a first path which extends from the loading station to an inspection station at which the part has a predetermined position and orientation for inspection. An illumination assembly simultaneously illuminates a plurality of exterior side surfaces of the part with a plurality of separate beams of radiation. A telecentric lens and detector assembly forms an optical image of at least a portion of each of the illuminated side surfaces of the part and detects the optical images. A processor processes the detected optical images to obtain a plurality of views of the part which are angularly spaced about the part.

In an alternative embodiment the method and system for optically inspecting headed manufactured parts employ an inclined split track to cause the part to traverse an inspection station by gravity feed. The part is inspected for conformity to dimensional and visual standards and sorted under control of a processor based on images of the part obtained from occluded light and reflected light while the part is within the inspection station.

Method and system for inspecting a manufactured part supported on an optically-transparent window of a rotary actuator at an inspection station are provided. The window rotatably supports the part in a generally vertical orientation at which a bottom end surface of the part has a position and orientation for optical inspection. An illuminator is configured to illuminate the bottom end surface of the part through the window with radiant energy to obtain reflected radiation signals which are reflected off the bottom end surface of the part. The reflected radiation signals travel through the window. A lens and detector assembly is configured to form a bottom image from the reflected radiation signals at a bottom imaging location below the window and is configured to detect the bottom image. The window is made of a material which is substantially transparent to the radiant energy and the reflected radiation signals.

Provided is an image sensor including a plurality of pixels provided in an array, wherein each of the plurality of pixels includes a plurality of sub-pixels, and wherein the plurality of sub-pixels are provided such that electric charges, generated from pixels among the plurality of pixels provided perpendicular to a moving direction of an object, accumulate while moving in the moving direction of the object at a same speed as the object.

The invention relates to a device for providing stopper elements that are sorted in order to feed a downstream workstation. The devices comprising a lifting means; a means or referencing said stopper elements one by one, located downstream from the lifting means; a conveyor for bringing the referenced elements to said workstation, positioned at the outlet of said referencing means; a vision means for verifying the conformance of said elements in an inspection zone extending at the level of the referencing means and/or of the conveyor; and a means for expelling those elements that do not conform located downstream of said vision means. The inspection zone comprises at least two successive sections each including a distinct color. The invention also relates to a corresponding method.

The image inspection device includes a reference height setting part configured to set a reference height as a reference of vibration component estimation, a vibration estimation part configured to estimate a vibration component in an inspection environment, based on the two-dimensional profile generated by the two-dimensional profile generation part and the reference height set by the reference height setting part, a profile correction part configured to remove, from the two-dimensional profile, the vibration component estimated by the vibration estimation part, a three-dimensional data generation part configured to generate three-dimensional data of the inspection object from a plurality of the two-dimensional profiles from which the vibration component is removed by the profile correction part, and an inspection part configured to conduct outer appearance inspection of the inspection object, based on the three-dimensional data generated by the three-dimensional data generation part.

A method of observing and analyzing optical singularities includes illuminating an outside of a container by using a light-emitting surface of axial symmetry around a vertical axis (Z) parallel to the axes of symmetry of the containers, with a property of the emission that is detectable by the acquisition system(s) varying along a generator line of the light-emitting surface. For containers of low transmittance, taking the view image of the container portion by the image acquisition device receiving light beams comes from a portion of the light-emitting surface situated on the same side of the container. For containers of high transmittance, taking the view of the container portion by the image acquisition device receiving light beams comes from a portion of the light-emitting surface that is diametrically opposite relative to the container.