An apparatus can be used for inspecting printed images for a printing or finishing machine with continuously moved printed products. An illumination unit with a light source illuminates a recording region and an image capture apparatus with at least one camera, for example a line scanning camera, is set up to capture an image inside the recording region, which extends over the width of the printed product, wherein the image capture apparatus is set up to generate a multi-line partial image.

An apparatus can be used for inspecting printed images for a printing or finishing machine with continuously moved printed products. An illumination unit with a light source illuminates a recording region and an image capture apparatus with at least one camera, for example a line scanning camera, is set up to capture an image inside the recording region, which extends over the width of the printed product, wherein the image capture apparatus is set up to generate a multi-line partial image.

An optical scanning device includes a reflected-light passing unit having a passing region through which a portion of reflected light that is the scanning light reflected by the medium passes. An outer peripheral contour line of the passing region includes a contour curve configured with a set of points where coordinates in a direction orthogonal to a scanning direction are uniquely determined for the coordinates in the scanning direction. The contour curve renders a curve protruded toward the passing region. When a region in contact with the contour curve in the passing region is divided into a plurality of quadrilateral minute regions having equivalent areas and extending from the contour curve to a predetermined coordinate position in the scanning direction and are continuously arranged in the orthogonal direction, widths of the minute regions in the scanning direction are different for each location in the orthogonal direction.

An optical scanning device includes a reflected-light passing unit having a passing region through which a portion of reflected light that is the scanning light reflected by the medium passes. An outer peripheral contour line of the passing region includes a contour curve configured with a set of points where coordinates in a direction orthogonal to a scanning direction are uniquely determined for the coordinates in the scanning direction. The contour curve renders a curve protruded toward the passing region. When a region in contact with the contour curve in the passing region is divided into a plurality of quadrilateral minute regions having equivalent areas and extending from the contour curve to a predetermined coordinate position in the scanning direction and are continuously arranged in the orthogonal direction, widths of the minute regions in the scanning direction are different for each location in the orthogonal direction.

The invention relates to a method and arrangement for detecting free fiber ends in a paper surface. The method comprises illuminating a target sample (6) surface, which comprises free fiber ends, from at least two directions one at the time, with at least one light source (1). Original reflectance images are obtained for the target sample (6) surface with an imaging device (4), and a surface normal is estimated for each image pixel of the original reflectance image. Thus it is possible to reconstruct a reconstructed reflectance image from the estimated surface normals, and to compare the reconstructed reflectance image and the corresponding original reflectance image and to construct a difference image, where the differences represent shadow objects of the free fiber ends in a paper surface.

The invention relates to a method and arrangement for detecting free fiber ends in a paper surface. The method comprises illuminating a target sample (6) surface, which comprises free fiber ends, from at least two directions one at the time, with at least one light source (1). Original reflectance images are obtained for the target sample (6) surface with an imaging device (4), and a surface normal is estimated for each image pixel of the original reflectance image. Thus it is possible to reconstruct a reconstructed reflectance image from the estimated surface normals, and to compare the reconstructed reflectance image and the corresponding original reflectance image and to construct a difference image, where the differences represent shadow objects of the free fiber ends in a paper surface.

A web manufacturing supervision system for monitoring properties of a web being transported in a moving direction during a web manufacturing process, includes: a) a radiation source for illuminating a first spot on the web; b) a tunable first detector for capturing signal radiation emanating from the first spot within a signal wavelength band; the signal wavelength band being adjustable to one of at least a first wavelength band and a second wavelength band; c) a second detector for capturing reference radiation emanating from the first spot within a reference wavelength band; d) control means for alternatingly tuning the signal wavelength band to the first wavelength band and the second wavelength band and measuring the signal at both wavelength bands simultaneously.

A web manufacturing supervision system for monitoring properties of a web being transported in a moving direction during a web manufacturing process, includes: a) a radiation source for illuminating a first spot on the web; b) a tunable first detector for capturing signal radiation emanating from the first spot within a signal wavelength band; the signal wavelength band being adjustable to one of at least a first wavelength band and a second wavelength band; c) a second detector for capturing reference radiation emanating from the first spot within a reference wavelength band; d) control means for alternatingly tuning the signal wavelength band to the first wavelength band and the second wavelength band and measuring the signal at both wavelength bands simultaneously.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.