The invention relates to a method in the preparation of samples for microscopic examination onto which a coverslip is applied. The method is notable for the fact that the coverslipping quality is checked automatically and at least partly optically. The invention further relates to an apparatus for carrying out the method, and to an apparatus for checking the coverslipping quality of samples onto which a coverslip is applied.

The invention relates to a method in the preparation of samples for microscopic examination onto which a coverslip is applied. The method is notable for the fact that the coverslipping quality is checked automatically and at least partly optically. The invention further relates to an apparatus for carrying out the method, and to an apparatus for checking the coverslipping quality of samples onto which a coverslip is applied.

The present disclosure relates to a method for inspecting a container body adapted and configured to hold substrates, comprising the steps of directing light from a light source onto a reflector element positioned within an interior space of the container body, such that the light is reflected to illuminate at least one interior surface of the container body, wherein the light is reflected by the reflector element in a diffuse manner and generating at least one image of the at least one interior surface by means of at least one camera, and evaluating the state of the container body on the basis of the at least one image.

A method and a device for determining a degree of thermal hair damage are provided. A method for determining a degree of thermal hair damage includes, during exposure of a hair sample of hair to UV or UV/VIS light, recording a spectrum of at least a portion of the UV or UV/VIS light that has interacted with the hair sample. Further, the method includes comparing at least a portion of the spectrum with a spectroscopic calibration model obtained using UV or UV/VIS spectra and degrees of thermal damage of a plurality of calibration hair samples. Also, the method includes determining the degree of thermal hair damage by using the comparison.

A method and a device for determining a degree of thermal hair damage are provided. A method for determining a degree of thermal hair damage includes, during exposure of a hair sample of hair to UV or UV/VIS light, recording a spectrum of at least a portion of the UV or UV/VIS light that has interacted with the hair sample. Further, the method includes comparing at least a portion of the spectrum with a spectroscopic calibration model obtained using UV or UV/VIS spectra and degrees of thermal damage of a plurality of calibration hair samples. Also, the method includes determining the degree of thermal hair damage by using the comparison.

An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.

In accordance with some embodiments of the present disclosure, an inspection method of a photomask includes performing a first inspection process, unloading the photomask from the inspection system, and performing a second inspection process. In the first inspection process, a common Z calibration map of an objective lens of an optical module with respect to the photomask is generated and stored, and a first image of the photomask is captured by using an image sensor while focusing the objective lens of the optical module based on the common Z calibration map. The photomask is unloaded from the inspection system. In the second inspection process, the photomask is loaded on the inspection system and a second image of the photomask is captured by using an image sensor while focusing an objective lens of an optical module based on the common Z calibration map generated in the first inspection process.

In a defect detection device (10), an input receiver (161) receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter (11, 12) induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer (15) optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner (164) determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector (165) selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.

In a defect detection device (10), an input receiver (161) receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter (11, 12) induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer (15) optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner (164) determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector (165) selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.

Systems and methods for determining a diagnosis of a screening system are disclosed. Such systems and methods include identifying defect results based on inline characterization tool data, identifying electrical test results based on electrical test data, generating one or more correlation metrics based on the defect results and the electrical test results, and determining at least one diagnosis of the screening system based on the one or more correlation metrics, the diagnosis corresponding to a performance of the screening system.