Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.

Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.

An example scan procedure generation system includes: a display; a processor; and a computer readable storage medium comprising computer readable instructions which, when executed, cause the processor to: output, via the display, a first visual representation of an arrangement of a radiation source, a radiation detector, a workpiece positioner, and a workpiece; and based on positions and orientations of the radiation source, the radiation detector, the workpiece positioner, and the workpiece, generate a scanning procedure for execution by a physical scanner having a physical radiation source, a physical radiation detector, and a physical workpiece positioner, wherein the generated scanning procedure comprises a plurality of movements of one or more of the physical radiation source, the physical radiation detector, and the physical workpiece positioner and a plurality of image captures to capture a plurality of scan images of a physical workpiece corresponding to the workpiece in the first virtual representation.

A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

The present invention relates to a method for manufacturing a sample for thin film property measurement and analysis, and a sample manufactured thereby and, more specifically, to: a method for manufacturing a sample capable of measuring or analyzing various properties in one sample; and a sample manufactured thereby.

The present invention relates to a method for manufacturing a sample for thin film property measurement and analysis, and a sample manufactured thereby and, more specifically, to: a method for manufacturing a sample capable of measuring or analyzing various properties in one sample; and a sample manufactured thereby.

An information acquisition method includes: executing a voxel defining process to divide an area in which a signal source is assumed to be present and define a voxel division V1 specifying resolution of an image; executing a data collecting process to acquire magnetic field data resulting from measurement of a magnetic field generated in the area; and executing a reconstructing process to estimate, by using a mathematical algorithm, a direction and strength of a current of a signal source at a location of each voxel based on the acquired magnetic field data. The reconstructing process includes: calculating a Gram matrix by using a voxel division V2 defined coarser than the voxel division V1; and reconstructing, by using the Gram matrix, a direction and strength of a current of a signal source in the voxel division V1.

An information acquisition method includes: executing a voxel defining process to divide an area in which a signal source is assumed to be present and define a voxel division V1 specifying resolution of an image; executing a data collecting process to acquire magnetic field data resulting from measurement of a magnetic field generated in the area; and executing a reconstructing process to estimate, by using a mathematical algorithm, a direction and strength of a current of a signal source at a location of each voxel based on the acquired magnetic field data. The reconstructing process includes: calculating a Gram matrix by using a voxel division V2 defined coarser than the voxel division V1; and reconstructing, by using the Gram matrix, a direction and strength of a current of a signal source in the voxel division V1.

A spent and/or decommissioned accumulator treatment plant and process, wherein a plurality of objects originating from separate waste collection of spent and/or decommissioned accumulators, nominally comprising lead-acid accumulators and accumulators and objects of a different type, are subject to an X-ray scan. If an analysis of the X-ray scan indicates that an object is not a lead-acid accumulator, and in particular is a lithium-ion battery or accumulator, it is deviated out of the treatment workflow, that comprises grinding the objects and separating lead from other materials.

A spent and/or decommissioned accumulator treatment plant and process, wherein a plurality of objects originating from separate waste collection of spent and/or decommissioned accumulators, nominally comprising lead-acid accumulators and accumulators and objects of a different type, are subject to an X-ray scan. If an analysis of the X-ray scan indicates that an object is not a lead-acid accumulator, and in particular is a lithium-ion battery or accumulator, it is deviated out of the treatment workflow, that comprises grinding the objects and separating lead from other materials.