A radiation source applies radiation to a subject. A radiation generation apparatus controls the radiation source. A radiation imaging apparatus includes a pixel array including a plurality of image signal output pixels that outputs image signals based on the radiation applied from the radiation source and a plurality of dose detection pixels that detects a dose based on the radiation applied from the radiation source, and includes a control unit that controls driving of the radiation imaging apparatus and a radiation irradiation timing. The control unit includes a prediction unit that predicts an irradiation time from a result of detection of an integrated irradiation amount by the dose detection pixels, and a drive control unit that changes at least one of the number of frames to be captured and an offset correction processing method based on the prediction result.

A radiation detector including: a sensor substrate including a flexible base member and a layer provided on a first surface of the base member and formed with plural pixels that accumulates electrical charge generated in response to light converted from radiation; a conversion layer provided on the first surface side of the sensor substrate, the conversion layer converts radiation into the light; and an elastic layer provided on the opposite side of the conversion layer to a side provided with the sensor substrate, the elastic layer having a greater restoring force with respect to bending than the sensor substrate.

A radiation detector including: a sensor substrate including a flexible base member and a layer provided on a first surface of the base member and formed with plural pixels that accumulates electrical charge generated in response to light converted from radiation; a conversion layer provided on the first surface side of the sensor substrate, the conversion layer converts radiation into the light; and an elastic layer provided on the opposite side of the conversion layer to a side provided with the sensor substrate, the elastic layer having a greater restoring force with respect to bending than the sensor substrate.

A metrology method for use in determining one or more parameters of a patterned structure, the method including providing raw measured TEM image data, TEM.sub.meas, data indicative of a TEM measurement mode, and predetermined simulated TEM image data including data indicative of one or more simulated TEM images of a structure similar to the patterned structure under measurements and a simulated weight map including weights assigned to different regions in the simulated TEM image corresponding to different features of the patterned structure, performing a fitting procedure between the raw measured TEM image data and the predetermined simulated TEM image data and determining one or more parameters of the structure from the simulated TEM image data corresponding to a best fit condition.

A metrology method for use in determining one or more parameters of a patterned structure, the method including providing raw measured TEM image data, TEM.sub.meas, data indicative of a TEM measurement mode, and predetermined simulated TEM image data including data indicative of one or more simulated TEM images of a structure similar to the patterned structure under measurements and a simulated weight map including weights assigned to different regions in the simulated TEM image corresponding to different features of the patterned structure, performing a fitting procedure between the raw measured TEM image data and the predetermined simulated TEM image data and determining one or more parameters of the structure from the simulated TEM image data corresponding to a best fit condition.

A radiation imaging apparatus includes a detection unit configured to detect radiation emitted from a radiation irradiation unit, the apparatus comprises a processing unit configured to obtain dose distribution information regarding the radiation with which the detection unit is irradiated from the radiation irradiation unit. The processing unit corrects, using the dose distribution information, an image signal output from the detection unit.

A radiation imaging apparatus includes a detection unit configured to detect radiation emitted from a radiation irradiation unit, the apparatus comprises a processing unit configured to obtain dose distribution information regarding the radiation with which the detection unit is irradiated from the radiation irradiation unit. The processing unit corrects, using the dose distribution information, an image signal output from the detection unit.

The present invention provides a method of deterioration analysis that enables detailed analysis of the deterioration, especially of the surface, of a polymer material containing at least two diene polymers. The present invention relates to a method of deterioration analysis including: irradiating a polymer material containing at least two diene polymers with high intensity x-rays; and measuring x-ray absorption while varying the energy of the x-rays, to analyze the deterioration of each diene polymer.

The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies.

The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies.