The present specification provides a detector for an X-ray imaging system. The detector includes at least one high resolution layer having high resolution wavelength-shifting optical fibers, each fiber occupying a distinct region of the detector, at least one low resolution layer with low resolution regions, and a single segmented multi-channel photo-multiplier tube for coupling signals obtained from the high resolution fibers and the low resolution regions.

The present specification provides a detector for an X-ray imaging system. The detector includes at least one high resolution layer having high resolution wavelength-shifting optical fibers, each fiber occupying a distinct region of the detector, at least one low resolution layer with low resolution regions, and a single segmented multi-channel photo-multiplier tube for coupling signals obtained from the high resolution fibers and the low resolution regions.

A cable inspection device non-destructively inspects a cable used for supporting a bridge. The cable inspection device includes a neutron source and a neutron detection device. The neutron source emits neutrons to the cable. The neutron detection device includes a detection surface arranged outside the cable, and detects target neutrons and measures the number of the detected target neutrons when neutrons are emitted to the cable. The target neutrons are among the neutrons released from the cable and incident on the detection surface, and each have an energy equal to or lower than a predetermined value that is lower than an energy of a fast neutron.

A cable inspection device non-destructively inspects a cable used for supporting a bridge. The cable inspection device includes a neutron source and a neutron detection device. The neutron source emits neutrons to the cable. The neutron detection device includes a detection surface arranged outside the cable, and detects target neutrons and measures the number of the detected target neutrons when neutrons are emitted to the cable. The target neutrons are among the neutrons released from the cable and incident on the detection surface, and each have an energy equal to or lower than a predetermined value that is lower than an energy of a fast neutron.

The present disclosure relates to methods of obtaining electron diffraction data of microcrystalline samples.

The present disclosure relates to methods of obtaining electron diffraction data of microcrystalline samples.

An object of the present invention is to provide a method of preparing a sample for crystallographic analysis used for structure determination of a compound having a nucleophilic group based on the crystalline sponge method. The present invention provides a method of preparing a sample for crystallographic analysis used for structure determination of a compound having a nucleophilic group based on the crystalline sponge method, the method including the steps: (A) derivatizing the nucleophilic group of the compound, and (B) soaking the derivatized compound into a crystalline sponge. The method of the invention allows the structure (particularly, absolute configuration) of a compound which is not amenable to structural analysis based on the crystalline sponge method to be quickly and precisely determined by a simple procedure.

An object of the present invention is to provide a method of preparing a sample for crystallographic analysis used for structure determination of a compound having a nucleophilic group based on the crystalline sponge method. The present invention provides a method of preparing a sample for crystallographic analysis used for structure determination of a compound having a nucleophilic group based on the crystalline sponge method, the method including the steps: (A) derivatizing the nucleophilic group of the compound, and (B) soaking the derivatized compound into a crystalline sponge. The method of the invention allows the structure (particularly, absolute configuration) of a compound which is not amenable to structural analysis based on the crystalline sponge method to be quickly and precisely determined by a simple procedure.

A device for measuring short-wavelength characteristic X-ray diffraction based on array detection, and a measurement and analysis method based on the device are provided. An array detector of the device only detects and receives a diffraction ray which is diffracted by a material of a to-be-measured part inside a sample and passes through a through hole of a receiving collimator, and rays passing through a positioning hole. The to-be-measured part inside the sample is placed at the center of the diffractometer circle of the device. The method is performed with the device. With the present disclosure, a diffraction pattern of a part inside the sample with a centimeter thickness, i.e. Debye rings, can be rapidly and non-destructively measured, thereby rapidly and non-destructively measuring and analyzing crystal structures, and its crystal structural change of the part inside the sample, such as phase, texture, and stress.

A device for measuring short-wavelength characteristic X-ray diffraction based on array detection, and a measurement and analysis method based on the device are provided. An array detector of the device only detects and receives a diffraction ray which is diffracted by a material of a to-be-measured part inside a sample and passes through a through hole of a receiving collimator, and rays passing through a positioning hole. The to-be-measured part inside the sample is placed at the center of the diffractometer circle of the device. The method is performed with the device. With the present disclosure, a diffraction pattern of a part inside the sample with a centimeter thickness, i.e. Debye rings, can be rapidly and non-destructively measured, thereby rapidly and non-destructively measuring and analyzing crystal structures, and its crystal structural change of the part inside the sample, such as phase, texture, and stress.