Provided are a processing method, a processing apparatus and a processing program which can perform pole figure measurement continuously without overlapping of an angle α in a pole figure with the small number of times of φ scan, thereby enabling the efficient measurement. The processing method for determining conditions of pole figure measurement by X-ray diffraction, includes the steps of: receiving input of a diffraction angle 2θ; and determining an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each φ scan for a rotation angle φ within a sample plane so as to make a range of an angle α continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the input angle 2θ, in which determining the angle ω and the angle χ is repeated.

An analytic method for improving the efficiency in identifying protein molecular effect information using low resolution x-ray crystallography, by selecting and imaging a protein sample with low resolution x-ray crystallography and assaying the data thus generated as to local ligand strain energy value, followed by calculating a real-space difference density Z for each element and compiling ZDD data therefrom, followed by determining the true protomer/tautomer state of the protein sample by calculating Score.sub.i according to the following equation so that the highest Score.sub.i signifies the molecular effect information:
Score.sub.i={((ZDD.sub.i−μ.sub.ZDD)/σ.sub.ZDD)+((SE.sub.i−σ.sub.SE)/σ.sub.SE)}.

An analytic method for improving the efficiency in identifying protein molecular effect information using low resolution x-ray crystallography, by selecting and imaging a protein sample with low resolution x-ray crystallography and assaying the data thus generated as to local ligand strain energy value, followed by calculating a real-space difference density Z for each element and compiling ZDD data therefrom, followed by determining the true protomer/tautomer state of the protein sample by calculating Score.sub.i according to the following equation so that the highest Score.sub.i signifies the molecular effect information:
Score.sub.i={((ZDD.sub.i−μ.sub.ZDD)/σ.sub.ZDD)+((SE.sub.i−σ.sub.SE)/σ.sub.SE)}.

An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of the angles about a center point of goniometer circles, the X-ray diffractometer having a pinhole member provided with a pinhole, the pinhole allowing X-rays diffracted from the sample to pass so that the diffracted X-rays pass through the center point of the goniometer circle, and other diffracted X-rays are shielded by the pinhole member.

The system for in-situ real-time measurements of microstructure properties of 3D-printing objects during 3-D printing processes. An intensive parallel X-ray beam (with an adjustable beam size) impinges on a printing object and is diffracted on a crystal lattice of the printing material. The diffracted radiation impinges on a reflector formed with an array of reflector crystals mounted on an arcuated substrate. The diffracted beams reflected from the reflector crystals correspond to the diffraction intensity peaks produced by interaction of the crystal lattice of the printing material with the impinging X-ray beam. The intensities of the diffraction peaks are observed by detectors which produce corresponding output signals, which are processed to provide critical information on the crystal phase composition, which is closely related to the defects and performance of the printing objects. The subject in-situ technology provides an effective and efficient way to monitor, in real-time, the quality of 3D-printing parts during the 3-D printing process, with a significant potential for effective process control based on the reliable microstructure feedback.

The system for in-situ real-time measurements of microstructure properties of 3D-printing objects during 3-D printing processes. An intensive parallel X-ray beam (with an adjustable beam size) impinges on a printing object and is diffracted on a crystal lattice of the printing material. The diffracted radiation impinges on a reflector formed with an array of reflector crystals mounted on an arcuated substrate. The diffracted beams reflected from the reflector crystals correspond to the diffraction intensity peaks produced by interaction of the crystal lattice of the printing material with the impinging X-ray beam. The intensities of the diffraction peaks are observed by detectors which produce corresponding output signals, which are processed to provide critical information on the crystal phase composition, which is closely related to the defects and performance of the printing objects. The subject in-situ technology provides an effective and efficient way to monitor, in real-time, the quality of 3D-printing parts during the 3-D printing process, with a significant potential for effective process control based on the reliable microstructure feedback.

An x-ray imaging apparatus includes an x-ray source module configured to output source x-rays, a pencil-beam-forming module having input and output ports, and a module engagement interface that enables a user to select aligned and non-aligned configurations of the source and pencil-beam-forming modules. In the aligned configuration, the pencil-beam-forming module is aligned with the source module to receive source x-rays at the input port and to output a scanning pencil beam through the output port toward a target. In the non-aligned configuration, the pencil-beam-forming module is not aligned with the x-ray source module to receive the source x-rays nor to output the pencil beam, but instead enables the source x-rays to form a stationary, wide-area beam directed toward the target. Example embodiments can be handheld, can enable both backscatter imaging and high-resolution transmission imaging using the same apparatus, and can be employed in finding and disarming explosive devices.

An x-ray imaging apparatus includes an x-ray source module configured to output source x-rays, a pencil-beam-forming module having input and output ports, and a module engagement interface that enables a user to select aligned and non-aligned configurations of the source and pencil-beam-forming modules. In the aligned configuration, the pencil-beam-forming module is aligned with the source module to receive source x-rays at the input port and to output a scanning pencil beam through the output port toward a target. In the non-aligned configuration, the pencil-beam-forming module is not aligned with the x-ray source module to receive the source x-rays nor to output the pencil beam, but instead enables the source x-rays to form a stationary, wide-area beam directed toward the target. Example embodiments can be handheld, can enable both backscatter imaging and high-resolution transmission imaging using the same apparatus, and can be employed in finding and disarming explosive devices.

A non-destructive inspection system 1 includes a neutron detecting unit 4 and an arithmetic unit 60. The neutron detecting unit 4 includes a collimator 30 and a neutron detector 20 integrated together. The collimator 30 has a wall defining a through passage P. The wall is made from a material that absorbs neutrons produced via an inspection object. The neutron detector 20 is capable of detecting neutrons that have passed through the collimator 30. The arithmetic unit 60 generates information on a position and composition of the inspection object, based on information on the neutrons detected by the neutron detector 20, positional information indicating the position of the neutron detecting unit 4, and posture information indicating the posture of the neutron detecting unit 4. The positional information and the posture information are detected by a position and posture detecting unit 5.

A non-destructive inspection system 1 includes a neutron detecting unit 4 and an arithmetic unit 60. The neutron detecting unit 4 includes a collimator 30 and a neutron detector 20 integrated together. The collimator 30 has a wall defining a through passage P. The wall is made from a material that absorbs neutrons produced via an inspection object. The neutron detector 20 is capable of detecting neutrons that have passed through the collimator 30. The arithmetic unit 60 generates information on a position and composition of the inspection object, based on information on the neutrons detected by the neutron detector 20, positional information indicating the position of the neutron detecting unit 4, and posture information indicating the posture of the neutron detecting unit 4. The positional information and the posture information are detected by a position and posture detecting unit 5.