Patent classifications
G01N23/20075
Preparing and analyzing solid form properties of a substance
In a method of analyzing solid form properties of a substance, which including the step of solidifying the substance, the solidified substance is obtained in one of a plurality of wells of a multi-well plate. In the multi-well plate the at least one of the plurality of wells has a bottom made of a thermoplastic polyimide. The method further includes analyzing the solidified substance in the well of the multi-well plate by X-ray diffraction. Thereby, the analysis includes providing X-ray through the solidified substance and a bottom of the well and evaluating the X-ray which passed the solidified substance and the bottom of the well. Such method and multi-well plate provide a durable and cost efficient system allowing a high quality analysis of solid form properties of the substance and an efficient and safe processing of the substance.
Imaging device, imaging method, and imaging system
The present invention discloses an imaging device, an imaging method, and an imaging system, belonging to the field of sample image data acquisition and imaging technology. The imaging device includes: a charged particle source, a convergence system, a scanning control system, a detection module, and a spectral analysis module disposed below the detection module, where the detection module includes a plurality of pixelated detector units; and the detection module is provided with a hole thereon. The diffraction pattern is obtained by using the detection module, and the spectral analysis module performs spectral analysis on a charged particle beam passing through the hole, so as to obtain the diffraction pattern and spectral signal simultaneously by one scanning. The imaging method of the present invention is based on a hollow ptychography method, which enables toper form imaging on the diffraction pattern obtained through the detection module, with good imaging effects.
Positive active material, positive electrode and lithium secondary battery containing the material, and method of preparing the material
A positive active material, including: a lithium transition metal composite oxide represented by Formula 1:
Li.sub.aNi.sub.bM1.sub.cM2.sub.dM3.sub.eO.sub.2Formula 1 wherein, in Formula 1, M1 comprises Co, Mn, or a combination thereof, M2 comprises Mg and Ti, M3 comprises Al, B, Ca, Na, K, Cr, V, Fe, Cu, Zr, Zn, Sr, Sb, Y, Nb, Ga, Si, Sn, Mo, W, Ba, a rare earth element, or a combination thereof, 0.9a1.1, 0.7b<1.0, 0<c0.3, 0<d0.03, 0e0.05, and 0.95(b+c+d+e)1.05, and a molar ratio of Ti:Mg in M2 is about 1:1 to about 3:1.
CRYSTALLINE FORM OF THE COMPOUND (S)-3-{4-[5-(2-CYCLOPENTYL-6-METHOXY-PYRIDIN-4-YL)-[1,2,4]OXADIAZOL-3-YL]-2-ETHYL-6-METHYL-PHENOXY}-PROPANE-1,2-DIOL
The present invention relates to a crystalline form of the compound (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1,2,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1,2-diol.
X-ray diffraction apparatus
An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.
Hydrocarbon conversion using UZM-50
A new aluminosilicate zeolite designated UZM-50, methods of making the zeolite, and its use as a catalyst in hydrocarbon conversion processes are described. This zeolite is represented by the empirical formula:
M.sup.+.sub.mR.sub.rAl.sub.1xE.sub.xSi.sub.yO.sub.z
where M is selected from the group consisting of hydrogen, sodium, potassium, magnesium, calcium or combinations thereof, R is the organic structure directing agent or agents derived from reactants R1 and R2 where R1 is an amine essentially incapable of undergoing pyramidal inversion and having 7 or fewer carbon atoms, and R2 is a dihaloalkane, and E is an element selected from the group consisting of gallium, iron, boron and mixtures thereof. UZM-50 has utility in various hydrocarbon conversion reactions such as conversion of an aromatic molecule to another aromatic molecule.
Crystalline metallophosphates, their method of preparation, and use
A family of crystalline microporous metallophosphates designated AlPO-90 has been synthesized represented by the empirical formula
R.sup.+.sub.rM.sub.m.sup.2+EP.sub.xSi.sub.yO.sub.z
where R is an organoammonium cation, M is a framework metal alkaline earth or transition metal of valence +2, and E is a trivalent framework element such as aluminum or gallium. The compositions are characterized by a new unique ABC-6 net structure, and have catalytic properties for various hydrocarbon conversion processes, and characteristics suitable for efficient adsorption of water vapor in a variety of applications, including adsorption heat pumps. A parameter data system comprising at least one processor; at least one memory storing computer-executable instructions; and at least one receiver configured to receive data of a parameter of a data of a parameter of at least one unit or stream in fluid communication with and downstream from or upstream to a conversion process comprising at least one reaction catalyzed by SAPO-90.
Single X-ray grating X-ray differential phase contrast imaging system
Single X-ray grating differential phase contrast (DPC) X-ray imaging is provided by replacing the conventional X-ray source with a photo-emitter X-ray source array (PeXSA), and by replacing the conventional X-ray detector with a photonic-channeled X-ray detector array (PcXDA). These substitutions allow for the elimination of the G0 and G2 amplitude X-ray gratings used in conventional DPC X-ray imaging. Equivalent spatial patterns are formed optically in the PeXSA and the PcXDA. The result is DPC imaging that only has a single X-ray grating (i.e., the G1 X-ray phase grating).
X-ray imaging system
An X-ray imaging system includes: an X-ray Talbot imaging device that has an object table, an X-ray source, a plurality of gratings, and an X-ray detector, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to acquire a moir image necessary for generation of a reconstructed image of the object; and a tester that is installed on the object table, holds the object, and loads a tensile load or a compressive load on the object, wherein the X-ray Talbot imaging device includes a hardware processor that causes a series of imaging to be performed to acquire the moir image, the tester includes: a base part; and a chuck, and an operation of the chuck is automatically controllable by the hardware processor in conjunction with the X-ray Talbot imaging device.
Temperature determination using radiation diffraction
A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.