Patent classifications
G01N23/203
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
Charged particle assessment tools and inspection methods are disclosed. In one arrangement, a condenser lens array divides a beam of charged particles into a plurality of sub-beams. Each sub-beam is focused to a respective intermediate focus. Objective lenses downstream from the intermediate foci project sub-beams from the condenser lens array onto a sample. A path of each sub-beam is substantially a straight line from each condenser lens to a corresponding objective lens.
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIVE COMPOSITIONAL CHARGED PARTICLE IMAGING
Methods for drift corrected, fast, low dose, adaptive sample imaging with a charged particle microscopy system include scanning a surface region of a sample with a charged particle beam to obtain a first image of the surface region with a first detector modality, and then determining a scan strategy for the surface region. The scan strategy comprises a charged particle beam path, a first beam dwell time associated with at least one region of interest in the first image, the first beam dwell time being sufficient to obtain statistically significant data from a second detector modality, and at least a second beam dwell time associated with other regions of the first image, wherein the first beam dwell time is different than the second beam dwell time. The surface region of the sample is then scanned with the determined scan strategy to obtain data from the first and second detector.
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIVE COMPOSITIONAL CHARGED PARTICLE IMAGING
Methods for drift corrected, fast, low dose, adaptive sample imaging with a charged particle microscopy system include scanning a surface region of a sample with a charged particle beam to obtain a first image of the surface region with a first detector modality, and then determining a scan strategy for the surface region. The scan strategy comprises a charged particle beam path, a first beam dwell time associated with at least one region of interest in the first image, the first beam dwell time being sufficient to obtain statistically significant data from a second detector modality, and at least a second beam dwell time associated with other regions of the first image, wherein the first beam dwell time is different than the second beam dwell time. The surface region of the sample is then scanned with the determined scan strategy to obtain data from the first and second detector.
Back scattering inspection system and back scattering inspection method
The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
Back scattering inspection system and back scattering inspection method
The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
Apply multi-physics principle for well integrity evaluation in a multi-string configuration
The disclosure provides a well integrity monitoring tool for a wellbore, a method, using a nuclear tool and an EM tool, for well integrity monitoring of a wellbore having a multi-pipe configuration, and a well integrity monitoring system. In one example, the method includes: operating a nuclear tool in the wellbore to make a nuclear measurement at a depth of the wellbore, operating an EM tool in the wellbore to make an EM measurement at the depth of the wellbore, determining a plurality of piping properties of the multi-pipe configuration at the depth employing the EM measurement, determining, employing the piping properties, a processed nuclear measurement from the nuclear measurement, and employing the processed nuclear measurement to determine an integrity of a well material at the depth and within an annulus defined by the multi-pipe configuration.
MATERIALS CLASSIFIER
A method and apparatus for classifying and/or identifying materials by means of their spectral response to gamma radiation. Classification is carried out by irradiating multiple different samples with gamma radiation, detecting a spectral response in the backscatter direction, sorting the spectral response into energy bands and selecting a combination of energy bands to define a relationship that best distinguishes between clusters of spectral responses for different material classes. Two or more of the energy bands may overlap.
SNOW / WATER LEVEL DETECTION WITH DISTRIBUTED ACOUSTIC SENSING INTEGRATED ULTRASONIC DEVICE
Aspects of the present disclosure describe snow / water level detection using distributed fiber optic sensing / distributed acoustic sensing (DFOS/DAS) and an integrated ultrasonic device that advantageously operates over existing optical telecommunications facilities carrying live telecommunications traffic - or optical facilities deployed specifically for such detection. DFOS/DAS monitoring of snow / water level advantageously monitors large areas with high sensitivity while exhibiting robustness to changing environmental conditions and employs a remote (utility pole or other mounting) mounted ultrasonic sensor/transducer that provides snow / water level data in real-time as a coded vibrational signal.
SNOW / WATER LEVEL DETECTION WITH DISTRIBUTED ACOUSTIC SENSING INTEGRATED ULTRASONIC DEVICE
Aspects of the present disclosure describe snow / water level detection using distributed fiber optic sensing / distributed acoustic sensing (DFOS/DAS) and an integrated ultrasonic device that advantageously operates over existing optical telecommunications facilities carrying live telecommunications traffic - or optical facilities deployed specifically for such detection. DFOS/DAS monitoring of snow / water level advantageously monitors large areas with high sensitivity while exhibiting robustness to changing environmental conditions and employs a remote (utility pole or other mounting) mounted ultrasonic sensor/transducer that provides snow / water level data in real-time as a coded vibrational signal.
Method of examining a sample using a charged particle microscope
The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample; scanning said charged particle beam over said sample; and detecting, using a first detector, emissions of a first type from the sample in response to the beam scanned over the sample. Spectral information of detected emissions of the first type is used for assigning a plurality of mutually different phases to said sample. In a further step, a corresponding plurality of different color hues—with reference to an HSV color space—are associated to said plurality of mutually different phases. Using a second detector, emissions of a second type from the sample in response to the beam scanned over the sample are detected. Finally an image representation of said sample is provided.