The invention is directed to a method for elucidating the three-dimensional structure of compounds by X-ray diffraction (X-ray SCD) characterized in that the compound is co-analyte crystallized with tetraaryladamantanes according to general formula I Wherein R and R′ are identical or different residues selected from the group consisting of O-R1, S-R1, NHR1, NR1R2, F, Cl, Br or I and R1, R2 stand for identical or different, substituted on not substituted aliphatic or aromatic residues having 1 to 25 carbon atoms and the the three-dimensional structure of the compound is obtained by X-ray diffraction (X-ray SCD).

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A radio wave absorber including a magnetic powder and a binder, in which the magnetic powder is a powder of a hexagonal ferrite in which a ratio (σs/β) of a saturation magnetization as to a half-width β of a diffraction peak on a (107) plane is 240 emu.Math.g.sup.−1.Math.degree.sup.−1 or more, where the half-width β is determined by X-ray diffraction analysis.

A radio wave absorber including a magnetic powder and a binder, in which the magnetic powder is a powder of a hexagonal ferrite in which a ratio (σs/β) of a saturation magnetization as to a half-width β of a diffraction peak on a (107) plane is 240 emu.Math.g.sup.−1.Math.degree.sup.−1 or more, where the half-width β is determined by X-ray diffraction analysis.

A method of quantitatively analyzing a carbon based hybrid negative electrode including the steps of preparing a secondary battery including a carbon based hybrid negative electrode, where the carbon based hybrid negative electrode comprises a carbon based negative electrode active material and a non-carbon based negative electrode active material, measuring a lattice d-spacing of the carbon based negative electrode active material in the carbon based hybrid negative electrode during charging/discharging of the secondary battery using an X-ray diffractometer and then plotting a graph of a change in lattice d-spacing value as a function of charge/discharge capacity, detecting an inflection point of a slope of the graph during discharging; and then, quantifying capacity contribution of the carbon based negative electrode active material and the non-carbon based negative electrode active material in the total discharge capacity of the secondary battery by the inflection point of the slope of the graph.

A method of quantitatively analyzing a carbon based hybrid negative electrode including the steps of preparing a secondary battery including a carbon based hybrid negative electrode, where the carbon based hybrid negative electrode comprises a carbon based negative electrode active material and a non-carbon based negative electrode active material, measuring a lattice d-spacing of the carbon based negative electrode active material in the carbon based hybrid negative electrode during charging/discharging of the secondary battery using an X-ray diffractometer and then plotting a graph of a change in lattice d-spacing value as a function of charge/discharge capacity, detecting an inflection point of a slope of the graph during discharging; and then, quantifying capacity contribution of the carbon based negative electrode active material and the non-carbon based negative electrode active material in the total discharge capacity of the secondary battery by the inflection point of the slope of the graph.

Disclosed is a method of predicting cycle life of a secondary battery comprising a carbon-based hybrid negative electrode, including: measuring a lattice d-spacing of a carbon based negative electrode active material of a target carbon-based hybrid negative electrode using an X-ray diffractometer during charging/discharging of a target secondary battery, and plotting a graph of changes in lattice d-spacing value as a function of charge/discharge capacity (X axis); calculating a target slope difference corresponding to a difference in slope value changed with respect to an inflection point of the graph during discharging in the plotted graph; comparing the target slope difference with a reference slope difference; and predicting if the cycle life of the target secondary battery is improved compared to the reference secondary battery from a result of the comparison.

A thin film analyzing device includes a processing and analyzing chamber for performing processing and analyzing of a subject having a thin film on a substrate. The processing and analyzing chamber includes a sample holder arranged to hold the subject, an X-ray irradiation source arranged to irradiate the subject with X-rays, a fluorescent X-ray detector configured to detect fluorescent X-rays which are emitted from the subject, a diffracted/reflected X-ray detector configured to detect reflected X-rays and diffracted X-rays which are emitted from the subject, and a substrate remover arranged to remove the substrate.

A thin film analyzing device includes a processing and analyzing chamber for performing processing and analyzing of a subject having a thin film on a substrate. The processing and analyzing chamber includes a sample holder arranged to hold the subject, an X-ray irradiation source arranged to irradiate the subject with X-rays, a fluorescent X-ray detector configured to detect fluorescent X-rays which are emitted from the subject, a diffracted/reflected X-ray detector configured to detect reflected X-rays and diffracted X-rays which are emitted from the subject, and a substrate remover arranged to remove the substrate.

An object of the present invention is to provide a method of preparing a sample for crystallographic analysis used for structure determination based on the crystalline sponge method. The present invention provides a method of preparing a sample for crystallographic analysis used for structure determination based on the crystalline sponge method, the method including the steps: (A) forming an ionic pair of a target compound of analysis with a counterionic compound, and (B) soaking the ionic pair of the compounds into a crystalline sponge, wherein the target compound of analysis is a basic compound or an acidic compound.

An object of the present invention is to provide a method of preparing a sample for crystallographic analysis used for structure determination based on the crystalline sponge method. The present invention provides a method of preparing a sample for crystallographic analysis used for structure determination based on the crystalline sponge method, the method including the steps: (A) forming an ionic pair of a target compound of analysis with a counterionic compound, and (B) soaking the ionic pair of the compounds into a crystalline sponge, wherein the target compound of analysis is a basic compound or an acidic compound.