Method, systems, and techniques for determining the age of an underground space are provided. In some embodiments, determining the age of an underground space comprises taking soil samples from a plurality of surface locations within a second underground space, analyzing the soil samples from the plurality of surface locations to determine an amount of a chemical compound for each soil sample, and determining an age of the second underground space using one or more relationships based on amounts of the chemical compound measured in a plurality of soil samples taken over a period of time in a first underground space and a baseline amount of the chemical compound at one or more locations remote from both the first underground space and the second underground space.

A process for quantifying the amount of unbound metal and bound metal in solution is provided. A process for quantifying the amount of bound metal amino acid chelate and free ligand in a solid (e.g., dry mixture such as an animal feed) is also provided.

A process for quantifying the amount of unbound metal and bound metal in solution is provided. A process for quantifying the amount of bound metal amino acid chelate and free ligand in a solid (e.g., dry mixture such as an animal feed) is also provided.

Methods and systems for conducting tomographic imaging microscopy of a sample with a high energy charged particle beam include irradiating a first region of the sample in a first angular position with a high energy charged particle beam and detecting emissions resultant from the charged particle beam irradiating the first region. The sample is repositioned into a second angular position such that the second region to be different than the first region, and a second region of the sample is irradiated. Example repositioning may include one or more of a translation of the sample, a helical rotation of the sample, the sample being positioned in a non-eucentric position, or a combination thereof. Emissions resultant from irradiation of the second region are then detected, and a 3D model of a portion of the sample is generated based at least in part on the detected first emissions and detected second emissions.

Methods and systems for conducting tomographic imaging microscopy of a sample with a high energy charged particle beam include irradiating a first region of the sample in a first angular position with a high energy charged particle beam and detecting emissions resultant from the charged particle beam irradiating the first region. The sample is repositioned into a second angular position such that the second region to be different than the first region, and a second region of the sample is irradiated. Example repositioning may include one or more of a translation of the sample, a helical rotation of the sample, the sample being positioned in a non-eucentric position, or a combination thereof. Emissions resultant from irradiation of the second region are then detected, and a 3D model of a portion of the sample is generated based at least in part on the detected first emissions and detected second emissions.

A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

A sample holder unit 400 capable of quickly and easily soaking a sample in a crystalline sponge, and of quickly and accurately performing single-crystal X-ray structure analysis, is provided. The sample holder unit comprises a sample holder 214 and an applicator 300. The applicator 300 comprises an opening 302 and a storing space in which the sample holder is stored; a seal part 304 provided on a contact surface with the sample holder stored in the storing space; and a pull-out prevention part 305 that prevents the sample holder from being pulled out from the opening 302, the pull-out prevention part engaged with the sample holder stored in the storing space.

The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.

A residual stress measurement method of a curved surface block includes steps of: locating a point at which a to-be-detected curved surface of a curved surface block has a highest curvature as a to-be-detected point; applying an instrument integrating an X-ray light resource and a detector, measuring the to-be-detected point by using an X-ray diffraction theory, and analyzing and calculating, in combination with a sin.sup.2 Ψ method, a strain value measured by using the instrument; and calculating, in combination with material property measurement data of the curved surface block material, a residual stress by introducing a curved surface block residual stress calculation model.

A residual stress measurement method of a curved surface block includes steps of: locating a point at which a to-be-detected curved surface of a curved surface block has a highest curvature as a to-be-detected point; applying an instrument integrating an X-ray light resource and a detector, measuring the to-be-detected point by using an X-ray diffraction theory, and analyzing and calculating, in combination with a sin.sup.2 Ψ method, a strain value measured by using the instrument; and calculating, in combination with material property measurement data of the curved surface block material, a residual stress by introducing a curved surface block residual stress calculation model.