A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.

An X-ray analyzer includes a sample container for accommodating a sample, a placement portion capable of placing the sample container thereon, an X-ray irradiation source for irradiateing the sample with X-rays from below the placement portion, a detector for detecting fluorescent X-rays generated from the sample below the placement portion, and a holder placed on the placement portion, and configured to accommodate the sample container. The placement portion has an opening. The sample container includes a container body for surrounding the sample, the container body beings having a shape opened downward, and a container film configured to close an opening of the container body and support the sample. The holder includes an enclosure cylinder having an outer shape larger than the opening, the to surround the sample container, and having a shape opened downward, and a holder film closing an opening of the enclosure cylinder.

An X-ray analyzer includes a sample container for accommodating a sample, a placement portion capable of placing the sample container thereon, an X-ray irradiation source for irradiateing the sample with X-rays from below the placement portion, a detector for detecting fluorescent X-rays generated from the sample below the placement portion, and a holder placed on the placement portion, and configured to accommodate the sample container. The placement portion has an opening. The sample container includes a container body for surrounding the sample, the container body beings having a shape opened downward, and a container film configured to close an opening of the container body and support the sample. The holder includes an enclosure cylinder having an outer shape larger than the opening, the to surround the sample container, and having a shape opened downward, and a holder film closing an opening of the enclosure cylinder.

A system and method for identifying lithology based on images and XRF mineral inversion solving the problem that conventional lithology identification relies on manual work, which is time-consuming, subjective and can cause misjudgment. The identification system includes an autonomous vehicle; an X ray fluorescence spectrometer probe, and tests surrounding rock element information; image collection device; and vehicle-mounted processor. The processor inverts the received surrounding rock element information into mineral information based on a Barthes-Niggli standard mineral calculation method; and receive surrounding rock images and a corresponding inclination angle thereof, convert the surrounding rock images into image information in a one-dimensional vector format, splice the image and mineral information which is in a one-dimensional format, and distinguish the spliced information based on a preset neural network to identify rock lithology.

A system and method for identifying lithology based on images and XRF mineral inversion solving the problem that conventional lithology identification relies on manual work, which is time-consuming, subjective and can cause misjudgment. The identification system includes an autonomous vehicle; an X ray fluorescence spectrometer probe, and tests surrounding rock element information; image collection device; and vehicle-mounted processor. The processor inverts the received surrounding rock element information into mineral information based on a Barthes-Niggli standard mineral calculation method; and receive surrounding rock images and a corresponding inclination angle thereof, convert the surrounding rock images into image information in a one-dimensional vector format, splice the image and mineral information which is in a one-dimensional format, and distinguish the spliced information based on a preset neural network to identify rock lithology.

An X-ray analysis system is provided with multi-source design and an X-ray analysis method is provided with multi-source design. According to the embodiments, the X-ray analysis system includes a ray source including a plurality of ray generating devices that generate a ray; a detector that detects a signal generated due to an analyzed object being irradiated by the ray from the ray source; and a controller that controls the ray source, so that two or more ray generating devices in the ray source simultaneously generate corresponding rays to irradiate the analyzed object.

An X-ray analysis system is provided with multi-source design and an X-ray analysis method is provided with multi-source design. According to the embodiments, the X-ray analysis system includes a ray source including a plurality of ray generating devices that generate a ray; a detector that detects a signal generated due to an analyzed object being irradiated by the ray from the ray source; and a controller that controls the ray source, so that two or more ray generating devices in the ray source simultaneously generate corresponding rays to irradiate the analyzed object.

An x-ray inspection apparatus may comprise an x-ray source, an x-ray detector, and a drive assembly. The drive assembly may be configured to lift a part carrier such that the part carrier is disengaged from a feed assembly and an object mounted on the part carrier is positioned between the x-ray source and the x-ray detector. The feed assembly may be configured to feed part carriers into and out of the x-ray inspection apparatus. The drive assembly may be further configured to subsequently lower the part carrier such that the part carrier is reengaged with the feed assembly.

An x-ray inspection apparatus may comprise an x-ray source, an x-ray detector, and a drive assembly. The drive assembly may be configured to lift a part carrier such that the part carrier is disengaged from a feed assembly and an object mounted on the part carrier is positioned between the x-ray source and the x-ray detector. The feed assembly may be configured to feed part carriers into and out of the x-ray inspection apparatus. The drive assembly may be further configured to subsequently lower the part carrier such that the part carrier is reengaged with the feed assembly.

According to one embodiment, a charged-particle measurement apparatus comprising: a plurality of gas detectors in each of which gas for detecting passage of a charged particle is enclosed; a trajectory calculator configured to calculate a trajectory of the charged particle based on detection signals outputted from the gas detectors and each of the parameters associated with the gas detectors; a measurer configured to measure an object based on the trajectory of the charged particle, the object being a measurement target; a signal intensity acquirer configured to acquire signal intensity of the detection signals; an operating state monitor configured to evaluate the operating states of the gas detectors based on the signal intensity corresponding to the gas detectors; and a parameter updating processor configured to update at least one parameter when at least one of the operating states of the gas detectors associated with this parameter changes.