G01N23/223

LUBRICANT AND LUBRICATION COMPOSITION
20220403277 · 2022-12-22 · ·

The present invention relates to a lubricant containing molybdenum sulfide particles, and the molybdenum sulfide particles contain molybdenum disulfide having a 3R crystal structure. The present invention relates to a lubricating composition containing molybdenum sulfide particles, which are the lubricant, and a base oil which is a mineral oil, a synthetic oil, or a partially synthetic oil.

X-RAY COMPUTED TOMOGRAPHY APPARATUS AND IMAGE GENERATION METHOD
20220404295 · 2022-12-22 · ·

An X-ray computed tomography apparatus images a subject while relatively rotating an X-ray source and an X-ray detector, and the subject. The X-ray computed tomography apparatus includes a theoretical image calculation unit that calculates a theoretical image obtained by irradiating a test object for calibration with X-rays using a geometrical parameter indicating a positional relationship between the X-ray source and the X-ray detector, a correction amount calculation unit that calculates a correction amount based on an amount of deviation between the theoretical image of the test object for calibration and a fluoroscopic image obtained by irradiating the test object for calibration with X-rays, and an image correction unit that corrects a fluoroscopic image of the subject using the correction amount.

X-RAY COMPUTED TOMOGRAPHY APPARATUS AND IMAGE GENERATION METHOD
20220404295 · 2022-12-22 · ·

An X-ray computed tomography apparatus images a subject while relatively rotating an X-ray source and an X-ray detector, and the subject. The X-ray computed tomography apparatus includes a theoretical image calculation unit that calculates a theoretical image obtained by irradiating a test object for calibration with X-rays using a geometrical parameter indicating a positional relationship between the X-ray source and the X-ray detector, a correction amount calculation unit that calculates a correction amount based on an amount of deviation between the theoretical image of the test object for calibration and a fluoroscopic image obtained by irradiating the test object for calibration with X-rays, and an image correction unit that corrects a fluoroscopic image of the subject using the correction amount.

Formation and use of embedded solutions in nanoscale materials

Provided herein are methods and materials that allow targeting and imaging of interactions between probes and targets. In some embodiments, the probes include nanoscale materials with embedded solutions that can be used to measure physical enhancement by materials under X-ray irradiation. In some embodiments, the methods of the present invention include delivering a probe material to a target that can have a delivered donor material. In some embodiments, methods of the present invention include irradiating the target and determining an optical change in the probe characteristic of a physical enhancement.

Formation and use of embedded solutions in nanoscale materials

Provided herein are methods and materials that allow targeting and imaging of interactions between probes and targets. In some embodiments, the probes include nanoscale materials with embedded solutions that can be used to measure physical enhancement by materials under X-ray irradiation. In some embodiments, the methods of the present invention include delivering a probe material to a target that can have a delivered donor material. In some embodiments, methods of the present invention include irradiating the target and determining an optical change in the probe characteristic of a physical enhancement.

PATTERNED X-RAY EMITTING TARGET

The present invention is intended to provide improved patterned X-ray emitting targets as well as X-ray sources that include patterned X-ray emitting targets as well as X-ray reflectance scatterometry (XRS) systems and also including X-ray photoelectron spectroscopy (XPS) systems and X-ray fluorescence (XRF) systems which employ such X-ray emitting targets.

PATTERNED X-RAY EMITTING TARGET

The present invention is intended to provide improved patterned X-ray emitting targets as well as X-ray sources that include patterned X-ray emitting targets as well as X-ray reflectance scatterometry (XRS) systems and also including X-ray photoelectron spectroscopy (XPS) systems and X-ray fluorescence (XRF) systems which employ such X-ray emitting targets.

Apparatus and method for analysing and processing granular material

A method of analysing granular material in a slurry, the method comprising: compacting the granular material in the slurry to form one or more pucks; irradiating said pucks with X-Ray radiation and detecting X-ray energy transmitted through said one or more irradiated pucks; irradiating a reference material with X-Ray radiation, said reference material having known material characteristics and detecting X-ray energy transmitted through said reference material; comparing X-ray energy transmission through said one or more pucks with the reference material to compute, using a processing unit, one or more particle characteristics of the granular material in the one or more pucks.

Method and system for determining an exposure temperature of an engine component using lubrication fluid analysis

Systems and methods are provided for determining an exposure temperature in an engine. One or more particles filtered from lubrication fluid of an engine may be analyzed. The chemical composition of filtered particles may be compared to reference data which includes a relationship between chemical composition and exposure temperature. An estimate of the exposure temperature may be determined. An output may be generated based on the exposure temperature.

Method and system for determining an exposure temperature of an engine component using lubrication fluid analysis

Systems and methods are provided for determining an exposure temperature in an engine. One or more particles filtered from lubrication fluid of an engine may be analyzed. The chemical composition of filtered particles may be compared to reference data which includes a relationship between chemical composition and exposure temperature. An estimate of the exposure temperature may be determined. An output may be generated based on the exposure temperature.