The present invention discloses a multi-channel aerosol scattering absorption measuring instrument, comprising a light path device, a detection device and a gas path device. The light path device supplies three different wavelengths of laser entering the detection device in sequence; the detection device is provided with photoelectric detectors at multiple angles for measurement, so as to reduce the measurement error of aerosol scattering coefficient; the gas path device comprises a sample loading unit, a calibration unit and a sample discharging unit; and a light source from the light path device and a gas flow from the gas path device enter the photoacoustic cavity of the detection device respectively and are detected by a control unit. The aerosol scattering absorption measuring instrument of the present invention is characterized by multi-channel, multi-angular, full-scale and direct measurement of scattering phase function and absorption coefficient of aerosol particles, combines the function of synchronously acquiring the optical parameters of an aerosol (such as scattering coefficient, extinction coefficient, visibility, transmittance, single scattering albedo, etc.), and achieves the integrated on-line detection of different optical parameters of an aerosol with high automation degree and good stability.

The present application relates to a method for detecting the stability of an X-ray photoelectron spectrometer, comprising: obtaining a first upper limit value and a first lower limit value of a rate of oxygen and nitrogen contents of a calibrating wafer having a silicon oxynitride film formed on its surface; measuring the calibrating wafer by the X-ray photoelectron spectrometer to obtain a first test value of the rate of oxygen and nitrogen contents; and when the first test value is between the first upper limit value and the first lower limit value, considering that the photoelectron spectrometer can accurately test the nitrogen content of the monitor wafer since the value of the nitrogen content of the monitor wafer obtained by the X-ray photoelectron spectrometer is within the normal fluctuation range, and determining that the X-ray photoelectron spectrometer is stable.

A computer-implemented method is described for generating event-averaged and time-resolved spectra, from a plurality of time-resolved spectra of charged particles emitted from a surface (3) of a sample (2), at which surface (3) an event is repeated cyclically, the method comprising the steps of receiving (101), from the charged particle analyser (1), the plurality of time-resolved spectra covering a plurality of events, obtaining (102) at least one selected part (9, 10) of the series of time-resolved spectra, matching (103) the at least one selected part (9, 10) with other parts of the series of time-resolved spectra to find similar parts, and thereby determining points in time for other events in the plurality of events, and generating (104) the event-averaged and time-resolved spectra of the event based on the series of time-resolved charged particle energy spectra and the determined points in time.

A computer-implemented method is described for generating event-averaged and time-resolved spectra, from a plurality of time-resolved spectra of charged particles emitted from a surface (3) of a sample (2), at which surface (3) an event is repeated cyclically, the method comprising the steps of receiving (101), from the charged particle analyser (1), the plurality of time-resolved spectra covering a plurality of events, obtaining (102) at least one selected part (9, 10) of the series of time-resolved spectra, matching (103) the at least one selected part (9, 10) with other parts of the series of time-resolved spectra to find similar parts, and thereby determining points in time for other events in the plurality of events, and generating (104) the event-averaged and time-resolved spectra of the event based on the series of time-resolved charged particle energy spectra and the determined points in time.

Provided are a high-energy and high-powered laser light source and a photoemission electron microscope using the laser light source. The laser light source 2 is intended for use in the photoemission electron microscope for emitting a quasi-continuous wave laser 7 and includes: a first laser light source 100 configured to emit a continuous wave coherent light 100a, an optical resonator 110 including an optical path in which the continuous wave coherent light 100a circulates and including a non-linear optical element 114 disposed on the optical path, and a quasi-continuous wave light source 120 configured to emit a quasi-continuous wave coherent light 120a having a wavelength shorter than that of the continuous wave coherent light 100a and having a near rectangular output waveform. When the quasi-continuous wave coherent light 120a is incident on the non-linear optical element 114 from outside the optical resonator 110 while the continuous wave coherent light 100a is entering the optical resonator 110 to circulate in the optical path, the quasi-continuous wave laser 7 having a wavelength shorter than that of the quasi-continuous wave coherent light 120a is emitted from the non-linear optical element 114.

Provided are a high-energy and high-powered laser light source and a photoemission electron microscope using the laser light source. The laser light source 2 is intended for use in the photoemission electron microscope for emitting a quasi-continuous wave laser 7 and includes: a first laser light source 100 configured to emit a continuous wave coherent light 100a, an optical resonator 110 including an optical path in which the continuous wave coherent light 100a circulates and including a non-linear optical element 114 disposed on the optical path, and a quasi-continuous wave light source 120 configured to emit a quasi-continuous wave coherent light 120a having a wavelength shorter than that of the continuous wave coherent light 100a and having a near rectangular output waveform. When the quasi-continuous wave coherent light 120a is incident on the non-linear optical element 114 from outside the optical resonator 110 while the continuous wave coherent light 100a is entering the optical resonator 110 to circulate in the optical path, the quasi-continuous wave laser 7 having a wavelength shorter than that of the quasi-continuous wave coherent light 120a is emitted from the non-linear optical element 114.

A method for measuring the chirality of molecules in a sample of chiral molecules, the sample including at least one chemical species, the method including the steps of: introducing the sample of chiral molecules into an ionisation area; ionising the molecules by electromagnetic radiation in the ionisation area; and detecting a distribution of electrons produced by ionisation and emitted at the front and back of the ionisation area relative to the axis, z, of propagation of the electromagnetic radiation; wherein the electromagnetic radiation is elliptically polarised, the ellipticity varying continuously and periodically as a function of time, the method further including a step of: determining the chirality of the molecules from the electron distribution detected continuously as a function of time. A system is also provided for measuring the chirality of molecules using such a method.

An input lens is provided which has a large acceptance solid angle for electrons. The input lens is for use in an electron spectrometer and disposed between an electron source producing electrons and an electron analyzer in the electron spectrometer. The input lens has a reference electrode at a reference potential, a slit, first through nth electrodes, where n is an integer equal to or greater than three, arranged between the reference electrode and the slit, and a second mesh attached to the first electrode. The first through nth electrodes are arranged in this order along an optical axis. The second mesh is at a potential higher than the reference potential.

An information processing apparatus includes information acquisition means configured to acquire quantitative information on a test substance, which is estimated by inputting spectrum information of a sample including the test substance into a learning model, and degree-of-contribution acquisition means configured to acquire a degree of contribution of the acquired quantitative information on the test substance.

An electron microscope includes: a laser light source configured to generate a CW laser; an irradiation lens system configured to irradiate a measurement sample with the CW laser; an energy analyzer configured to disperse, depending on energy, photoelectrons emitted from the measurement sample by irradiation with the CW laser; an energy slit configured to allow a photoelectron with a specified energy to pass, among the photoelectrons; an electron beam detector configured to detect the photoelectron passed through the energy slit; a first electron lens system configured to focus the photoelectrons emitted from the measurement sample onto the energy analyzer; and a second electron lens system configured to project the photoelectron passed through the energy slit onto the electron beam detector.