A dynamic multi-wavelength and sample voltage atom probe tomograph feedback control system includes a pulsed radiation source, an ion detector, a high voltage supply, and an analyzer. The pulsed radiation source produces first coherent light and second coherent light. The ion detector receives first emitted ions and second emitted ions from the atom probe sample. The high voltage supply produces a high voltage bias. The analyzer receives the ion signal from the ion detector and dynamically produces first pulsed radiation source control signal, second pulsed radiation source control signal, and high voltage bias control based on the ion signal. The system dynamically adjusts the optical wavelengths and sample voltage in real-time with atom probe tomography feedback by using the ion signal from the ion detector to dynamically produce first pulsed radiation source control signal, second pulsed radiation source control signal, and high voltage bias control.

A dynamic multi-wavelength and sample voltage atom probe tomograph feedback control system includes a pulsed radiation source, an ion detector, a high voltage supply, and an analyzer. The pulsed radiation source produces first coherent light and second coherent light. The ion detector receives first emitted ions and second emitted ions from the atom probe sample. The high voltage supply produces a high voltage bias. The analyzer receives the ion signal from the ion detector and dynamically produces first pulsed radiation source control signal, second pulsed radiation source control signal, and high voltage bias control based on the ion signal. The system dynamically adjusts the optical wavelengths and sample voltage in real-time with atom probe tomography feedback by using the ion signal from the ion detector to dynamically produce first pulsed radiation source control signal, second pulsed radiation source control signal, and high voltage bias control.

Described are illumination control devices, for an analyser arrangement and method of using thereof. The analyser arrangement is configured to determine at least one parameter related to charged particles emitted from a sample. The illumination control device comprises an input for input electromagnetic radiation, and is configured to control the illumination of the sample to induce the emission of charged particles from the sample and to operate in at least a first mode and a second mode, wherein the illumination control device in the first mode, is configured to illuminate a first area of the sample with a first part of the input electromagnetic radiation and a second area part of the first area of the sample with a second part of the input electromagnetic radiation, and in a second mode, is configured to illuminate the second area of the sample with the second part of the input electromagnetic radiation.

Described are illumination control devices, for an analyser arrangement and method of using thereof. The analyser arrangement is configured to determine at least one parameter related to charged particles emitted from a sample. The illumination control device comprises an input for input electromagnetic radiation, and is configured to control the illumination of the sample to induce the emission of charged particles from the sample and to operate in at least a first mode and a second mode, wherein the illumination control device in the first mode, is configured to illuminate a first area of the sample with a first part of the input electromagnetic radiation and a second area part of the first area of the sample with a second part of the input electromagnetic radiation, and in a second mode, is configured to illuminate the second area of the sample with the second part of the input electromagnetic radiation.