A system for measuring critical temperatures of superconducting components of a superconducting circuit housed in a cryogenic chamber with a controllable ambient temperature is described. The superconducting circuit can have a plurality of superconductor-resistor pairs connected in series. Each of the plurality of superconductor-resistor pairs can include a superconducting component and a resistor coupled in parallel with the superconducting component. The system can also include a resistance meter that measures a resistance of the superconducting circuit. The system further includes a controller that commands the cryogenic chamber to gradually sweep the ambient temperature. The controller can also record an instant ambient temperature as a critical temperature for a given superconducting component of a corresponding one of the plurality of superconductor-resistor pairs in response to detecting a change in a measured resistance across an input node and an output node of the superconducting circuit.

A system for measuring critical temperatures of superconducting components of a superconducting circuit housed in a cryogenic chamber with a controllable ambient temperature is described. The superconducting circuit can have a plurality of superconductor-resistor pairs connected in series. Each of the plurality of superconductor-resistor pairs can include a superconducting component and a resistor coupled in parallel with the superconducting component. The system can also include a resistance meter that measures a resistance of the superconducting circuit. The system further includes a controller that commands the cryogenic chamber to gradually sweep the ambient temperature. The controller can also record an instant ambient temperature as a critical temperature for a given superconducting component of a corresponding one of the plurality of superconductor-resistor pairs in response to detecting a change in a measured resistance across an input node and an output node of the superconducting circuit.

A method includes providing a length of pipeline that has a housing defining a central bore extending the length of the pipe and a space formed within the housing and extending the length of the pipe. At least one condition within the space is continuously monitored within the space to detect in real time if a change in the housing occurs.

A method includes providing a length of pipeline that has a housing defining a central bore extending the length of the pipe and a space formed within the housing and extending the length of the pipe. At least one condition within the space is continuously monitored within the space to detect in real time if a change in the housing occurs.

A testing system for causing a physical change in a crack tip region of a crack within a specimen. The testing system includes a load application system for applying a load to the specimen having the crack formed therein, an electrothermal system for applying an electrical current through the specimen and comprising a power supply and a controller operably coupled to the load application system and the electrothermal system. The load application system configured to perform a crack growth test on the specimen. A method of thermally influencing a crack tip region of a crack within a specimen includes applying at least one pulse of current to the specimen to generate flux tangentially around the crack within the specimen and at the crack up region and causing the crack tip region of the crack within the specimen to reach a predetermined activation temperature.

A testing system for causing a physical change in a crack tip region of a crack within a specimen. The testing system includes a load application system for applying a load to the specimen having the crack formed therein, an electrothermal system for applying an electrical current through the specimen and comprising a power supply and a controller operably coupled to the load application system and the electrothermal system. The load application system configured to perform a crack growth test on the specimen. A method of thermally influencing a crack tip region of a crack within a specimen includes applying at least one pulse of current to the specimen to generate flux tangentially around the crack within the specimen and at the crack up region and causing the crack tip region of the crack within the specimen to reach a predetermined activation temperature.

A system for measuring critical temperatures of superconducting components of a superconducting circuit housed in a cryogenic chamber with a controllable ambient temperature is described. The superconducting circuit can have a plurality of superconductor-resistor pairs connected in series. Each of the plurality of superconductor-resistor pairs can include a superconducting component and a resistor coupled in parallel with the superconducting component. The system can also include a resistance meter that measures a resistance of the superconducting circuit. The system further includes a controller that commands the cryogenic chamber to gradually sweep the ambient temperature. The controller can also record an instant ambient temperature as a critical temperature for a given superconducting component of a corresponding one of the plurality of superconductor-resistor pairs in response to detecting a change in a measured resistance across an input node and an output node of the superconducting circuit.

A system for measuring critical temperatures of superconducting components of a superconducting circuit housed in a cryogenic chamber with a controllable ambient temperature is described. The superconducting circuit can have a plurality of superconductor-resistor pairs connected in series. Each of the plurality of superconductor-resistor pairs can include a superconducting component and a resistor coupled in parallel with the superconducting component. The system can also include a resistance meter that measures a resistance of the superconducting circuit. The system further includes a controller that commands the cryogenic chamber to gradually sweep the ambient temperature. The controller can also record an instant ambient temperature as a critical temperature for a given superconducting component of a corresponding one of the plurality of superconductor-resistor pairs in response to detecting a change in a measured resistance across an input node and an output node of the superconducting circuit.

Identifying a stable phase of a binary alloy comprising a solute element and a solvent element. In one example, at least two thermodynamic parameters associated with grain growth and phase separation of the binary alloy are determined, and the stable phase of the binary alloy is identified based on the first thermodynamic parameter and the second thermodynamic parameter, wherein the stable phase is one of a stable nanocrystalline phase, a metastable nanocrystalline phase, and a non-nanocrystalline phase. In different aspects, an enthalpy of mixing of the binary alloy may be calculated as a first thermodynamic parameter, and an enthalpy of segregation of the binary alloy may be calculated as a second thermodynamic parameter. In another example, a diagram delineating a plurality of regions respectively representing different stable phases of at least one binary alloy is employed, wherein respective regions of the plurality of regions are delineated by at least one boundary determined as a function of at least two thermodynamic parameters associated with grain growth and phase separation of the at least one binary alloy.

Identifying a stable phase of a binary alloy comprising a solute element and a solvent element. In one example, at least two thermodynamic parameters associated with grain growth and phase separation of the binary alloy are determined, and the stable phase of the binary alloy is identified based on the first thermodynamic parameter and the second thermodynamic parameter, wherein the stable phase is one of a stable nanocrystalline phase, a metastable nanocrystalline phase, and a non-nanocrystalline phase. In different aspects, an enthalpy of mixing of the binary alloy may be calculated as a first thermodynamic parameter, and an enthalpy of segregation of the binary alloy may be calculated as a second thermodynamic parameter. In another example, a diagram delineating a plurality of regions respectively representing different stable phases of at least one binary alloy is employed, wherein respective regions of the plurality of regions are delineated by at least one boundary determined as a function of at least two thermodynamic parameters associated with grain growth and phase separation of the at least one binary alloy.