A system is disclosed for detecting holidays, e.g., defects, in surface coatings applied to metallic assets like a pipe. The system comprises a detection circuit with a test probe having a conductive tip which is moved along the coating during inspection and a DC voltage input signal generator which supplies a switched DC voltage input to the test probe. The detection circuit can be configured to operate using a low and/or high voltage switched DC input voltage signal. A measurement component comprising a sensing resistor and measurement tool is configured to measure a signal response of the detection circuit during inspection and detect holidays based on changes in the signal response caused by electrical properties of the coated surface. The detection circuit is configured such that the probe provides the only area of contact between the circuit and asset and enables detection of holidays without a separate ground connection.

An inspection system serves to qualify semiconductor structures. The inspection system has an ion beam source for space-resolved exposition of the structures to be qualified with an ion beam. The inspection system also includes a secondary ion detection device with a mass spectrometer. The mass spectrometer is configured to measure an ion mass to charge ratio in a given bandwidth.

A system is disclosed for detecting holidays, defects, in surface coatings applied to metallic assets like a pipe. The system comprises a detection circuit with a test probe having a conductive tip which is moved along the coating during inspection and a DC voltage input signal generator which supplies a switched DC voltage input to the test probe. The detection circuit can be configured to operate using a low and/or high voltage switched DC input voltage signal. A measurement component comprising a sensing resistor and measurement tool is configured to measure a signal response of the detection circuit during inspection and detect holidays based on changes in the signal response caused by electrical properties of the coated surface. The detection circuit is configured such that the probe provides the only area of contact between the circuit and asset and enables detection of holidays without a separate ground connection.

A method of producing a paper product by forming a paper web on a paper machine, the web including a plurality of sections, analyzing the web, marking the web, winding the web to form a parent roll after the web has been inspected and marked, assigning an action score to each section of the web, at least one action score having an action value, unwinding a web from a parent roll, reading at least one of a plurality of marks with a mark reading unit, obtaining the action score associated with a second one of the marks, calculating a distance between a mark read by the reading unit and the second one of the marks, changing at least one operational parameter of a converting line based upon the action score of the second of the marks when the distance is less than a threshold, and converting the paper web.

A method of producing a paper product by forming a paper web on a paper machine, the web including a plurality of sections, analyzing the web, marking the web, winding the web to form a parent roll after the web has been inspected and marked, assigning an action score to each section of the web, at least one action score having an action value, unwinding a web from a parent roll, reading at least one of a plurality of marks with a mark reading unit, obtaining the action score associated with a second one of the marks, calculating a distance between a mark read by the reading unit and the second one of the marks, changing at least one operational parameter of a converting line based upon the action score of the second of the marks when the distance is less than a threshold, and converting the paper web.

A measuring arrangement includes an electrostatic concentrator, a surface and an imaging sensor which are configured to detect particles.

A measuring arrangement includes an electrostatic concentrator, a surface and an imaging sensor which are configured to detect particles.

A vehicle scratch detection system includes a scratch detection element, disposed on a vehicle body and capable of detecting a scratch of the vehicle body, a control unit, configured to be capable of analyzing and processing detection information of the scratch detection element and determining information related to scratch, and an alarm device. The control unit is capable of triggering the alarm device to send an alarm signal according to a result of the analyzing and processing.

A vehicle scratch detection system includes a scratch detection element, disposed on a vehicle body and capable of detecting a scratch of the vehicle body, a control unit, configured to be capable of analyzing and processing detection information of the scratch detection element and determining information related to scratch, and an alarm device. The control unit is capable of triggering the alarm device to send an alarm signal according to a result of the analyzing and processing.

A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high-resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.