The present disclosure discloses a silicon nanowire chip and silicon nanowire chip-based mass spectrometry detection method. The detection method includes the following steps: step 1 of manufacturing a silicon nanowire chip, comprising: subjecting a monocrystalline silicon wafer to a surface washing pretreatment, a metal-assisted etching and a post-alkali etching to obtain a silicon nanowire chip with a tip, and performing a surface chemical modification or a nanomaterial modification on the silicon nanowire chip; step 2 of evaluating mass spectrometry performance of the silicon nanowire chip; and step 3 of performing a tip-contact sampling and in-situ ionization mass spectrometry detection.

The present disclosure discloses a silicon nanowire chip and silicon nanowire chip-based mass spectrometry detection method. The detection method includes the following steps: step 1 of manufacturing a silicon nanowire chip, comprising: subjecting a monocrystalline silicon wafer to a surface washing pretreatment, a metal-assisted etching and a post-alkali etching to obtain a silicon nanowire chip with a tip, and performing a surface chemical modification or a nanomaterial modification on the silicon nanowire chip; step 2 of evaluating mass spectrometry performance of the silicon nanowire chip; and step 3 of performing a tip-contact sampling and in-situ ionization mass spectrometry detection.

A machine, article, process of using, process of making, products produced thereby and necessary intermediates. Illustratively, there can be a process that includes: ionizing at least some injected gas to form ions; confining, without using magnetic fields, at least some of said ions to produce confined ions; accumulating at least some of said confined ions to produce accumulated ions; cooling at least some of said accumulated ions to produce cooled ions; compressing, without using magnetic fields, at least some of said accumulated ions to produce compressed ions; accelerating at least some of said compressed ions to produce accelerated ions; ejecting at least some of said accelerated ions; and measuring at least one property of said ejected ions.

An analysis and observation device includes: a component analysis section that performs component analysis of an analyte; an output section that outputs one component analysis result to an analysis history holding section; the analysis history holding section that holds a plurality of component analysis results as an analysis history; and an identifying section that identifies a component analysis result similar to the component analysis result obtained by the component analysis section from among the plurality of component analysis results held in the analysis history holding section. The analysis history holding section holds the analysis history to which the component analysis result has been newly added according to the output of the component analysis result by the output section, and the identifying section identifies a component analysis result similar to the one component analysis result from among results of the component analysis performed by the component analysis section.

An analysis and observation device includes: a component analysis section that performs component analysis of an analyte; an output section that outputs one component analysis result to an analysis history holding section; the analysis history holding section that holds a plurality of component analysis results as an analysis history; and an identifying section that identifies a component analysis result similar to the component analysis result obtained by the component analysis section from among the plurality of component analysis results held in the analysis history holding section. The analysis history holding section holds the analysis history to which the component analysis result has been newly added according to the output of the component analysis result by the output section, and the identifying section identifies a component analysis result similar to the one component analysis result from among results of the component analysis performed by the component analysis section.

Disclosed is a method of desorbing an adsorbed material by subjecting to energy a diazirine adsorbed on a solid surface or a layer on the solid surface, which causes the diazirine to form a carbene and nitrogen gas; and using the energy of the resultant nitrogen gas to desorb the adsorbed material from the solid surface or a layer on the same. Also disclosed is a method of reacting the resultant carbene with (a) a material in the gas phase proximal to the first solid surface; (b) a material adsorbed on a second solid surface proximal to the first solid surface; or (c) a second solid surface proximal to the first solid surface.

Disclosed is a method of desorbing an adsorbed material by subjecting to energy a diazirine adsorbed on a solid surface or a layer on the solid surface, which causes the diazirine to form a carbene and nitrogen gas; and using the energy of the resultant nitrogen gas to desorb the adsorbed material from the solid surface or a layer on the same. Also disclosed is a method of reacting the resultant carbene with (a) a material in the gas phase proximal to the first solid surface; (b) a material adsorbed on a second solid surface proximal to the first solid surface; or (c) a second solid surface proximal to the first solid surface.

A photoionization detector (PID) is disclosed that includes an ionization chamber configured to allow a flow of a gas sample therethrough, the ionization chamber defining an ionization region and a detection region, a photoionization source configured to generate ionizing radiation for irradiating the flow of the gas sample in the ionization region, an electric-field ionization source configured to apply an ionizing electric field inside the ionization chamber to intersect the flow of the gas sample in the ionization region, the ionizing radiation and the ionizing electric field being configured to ionize the gas sample, and an ion detector configured to detect, in the detection region, an ionization current resulting from the ionized gas sample. The PID may also include an optical window, for example, made of a window material including sapphire, configured to allow at least part of the ionizing radiation to pass therethrough prior to entering the ionization region.

A photoionization detector (PID) is disclosed that includes an ionization chamber configured to allow a flow of a gas sample therethrough, the ionization chamber defining an ionization region and a detection region, a photoionization source configured to generate ionizing radiation for irradiating the flow of the gas sample in the ionization region, an electric-field ionization source configured to apply an ionizing electric field inside the ionization chamber to intersect the flow of the gas sample in the ionization region, the ionizing radiation and the ionizing electric field being configured to ionize the gas sample, and an ion detector configured to detect, in the detection region, an ionization current resulting from the ionized gas sample. The PID may also include an optical window, for example, made of a window material including sapphire, configured to allow at least part of the ionizing radiation to pass therethrough prior to entering the ionization region.

Provided herein is technology relating to predicting a subject's resistance or responsiveness to a decitabine based therapy and particularly, but not exclusively, to methods, compositions, and related uses for predicting a subject's resistance or responsiveness to a decitabine based therapy wherein the subject is diagnosed with chronic myelomonocytic leukemia.