A manual system for non-destructive testing of a part to be tested includes a sub-system for acquiring non-destructive test data comprising a probe, a sub-system for tracking the position of the probe, and a sub-system for acquiring surface characterisation data of a test zone defined on the surface of the part. The system also includes a central sub-system for controlling the test data acquisition, surface characterisation data acquisition and position tracking subsystems as a function of the test zone covered by the probe manipulated by an operator, the central subsystem being able to synchronise the operation of the test data acquisition, surface characterisation data acquisition and position tracking subsystems and to pair the data produced by the test data acquisition, surface characterisation data acquisition and position tracking subsystems during their operation.

A reference chamber for a fluid sensor comprises a housing, a deflectable structure, which is arranged movably within the housing, a control device configured to drive the deflectable structure at a first point in time such that the deflectable structure assumes a defined position, and to drive the deflectable structure at a second point in time such that the deflectable structure moves out of the defined position and a movement of the deflectable structure in the housing is obtained. The reference chamber comprises an evaluation device configured to determine a movement characteristic of the movement of the deflectable structure on the basis of the moving into the defined position or on the basis of the moving out of the defined position and to determine an atmospheric property in the housing on the basis of the movement characteristic.

A reference chamber for a fluid sensor comprises a housing, a deflectable structure, which is arranged movably within the housing, a control device configured to drive the deflectable structure at a first point in time such that the deflectable structure assumes a defined position, and to drive the deflectable structure at a second point in time such that the deflectable structure moves out of the defined position and a movement of the deflectable structure in the housing is obtained. The reference chamber comprises an evaluation device configured to determine a movement characteristic of the movement of the deflectable structure on the basis of the moving into the defined position or on the basis of the moving out of the defined position and to determine an atmospheric property in the housing on the basis of the movement characteristic.

A gas sensor includes a multi-wafer stack of a plurality of layers and a measurement chamber. The plurality of layers includes a first layer comprising a sensor element that has a microelectromechanical system (MEMS) membrane; and a second layer comprising an emitter element configured to emit electromagnetic radiation. The measurement chamber is interposed between the first layer and the second layer. The measurement chamber is configured to receive a measurement gas and further receive the electromagnetic radiation emitted by the emitter element as the electromagnetic radiation travels along a radiation path from a first end of the measurement chamber to a second end of the measurement chamber that is opposite to the first end.

A gas sensor includes a multi-wafer stack of a plurality of layers and a measurement chamber. The plurality of layers includes a first layer comprising a sensor element that has a microelectromechanical system (MEMS) membrane; and a second layer comprising an emitter element configured to emit electromagnetic radiation. The measurement chamber is interposed between the first layer and the second layer. The measurement chamber is configured to receive a measurement gas and further receive the electromagnetic radiation emitted by the emitter element as the electromagnetic radiation travels along a radiation path from a first end of the measurement chamber to a second end of the measurement chamber that is opposite to the first end.

A variable value calculating process includes: measuring a propagation time of the propagation of an ultrasound wave through a measurement sector inside a housing; obtaining a temperature calculated value on the basis of the measured value of the propagation time and a reference distance for the measurement sector; obtaining a temperature measured value by measuring the temperature inside the housing; and obtaining a temperature replacement fluctuation value indicating a difference between the temperature calculated value and the temperature measured value. The variable value calculating process is executed for each of a plurality of temperature conditions under which the temperature of a reference gas inside the housing differs. A temperature compensation table in which the temperature of a gas to be measured is associated with a temperature compensation value relating to the temperature is obtained on the basis of the temperature replacement fluctuation values obtained under each temperature condition.

An ultrasonic-based welder qualification system is disclosed. The ultrasonic-based welder qualification system provides an inclusive inspection cabinet for welder qualification coupons with a development path for machine learning assisted analysis according to relevant codes/standards. Advanced Ultrasonic do not require permitting and the close loop system will provide pre-programmed procedures for auto-examination capabilities. The system can include a roller assembly for supporting a coupon, and a gantry assembly for positioning ultrasonic probes on the coupon. The gantry assembly can include vertical drive members and a horizontal drive member movable along the vertical drive members. The ultrasonic probes can be movably associated along the horizontal drive member. The system can utilize machine learning to analyze weld data for providing rapid weld qualification information. A portable cabinet can house all the components for providing rapid transport to sites.

A transducer system. The system comprises a transducer and circuitry for applying an excitation waveform to excite the transducer during an excitation period. The circuitry for applying has: (i) circuitry for applying a first waveform at a first frequency; and (ii) circuitry for applying a second waveform at a second frequency differing from the first frequency.

A transducer system. The system comprises a transducer and circuitry for applying an excitation waveform to excite the transducer during an excitation period. The circuitry for applying has: (i) circuitry for applying a first waveform at a first frequency; and (ii) circuitry for applying a second waveform at a second frequency differing from the first frequency.

An ultrasonic quality control as disclosed can inspect a quality of a piece and classify the piece automatically. The piece can be scanned, and an image formed from the scanning. A reference piece is also scanned, and a reference image is formed. A negative image of the reference image is formed, and an indication image is created by utilizing the image and the negative image. The indication image is filtered by utilizing several image filters, each image filter filtering all data of the indication image except an image filter specific indication level data. Further several indication levels data are provided from the image filter specific indication level data, and the piece can be classified utilizing the several indication levels data.