A substance detection sensor includes a first light source, a second light source, and a substance detector. The first light source irradiates a detection area including a plurality of target areas with reference light having a first wavelength through surface irradiation using optical scanning. The second light source irradiates the detection area with first measuring light having a second wavelength different from the first wavelength through the surface irradiation using the optical scanning. The substance detector detects a specific substance in the detection area based on reflection light of the reference light from the first light source and reflection light of the first measuring light from the second light source.

A gas concentration measuring device that can accurately superimpose and display a gas concentration image and a background image so that a gas concentration distribution on the background image can be grasped at a glance. The gas concentration measuring device 1 includes an imaging camera 20 that captures an image of a background 100, a light source 12 that emits constant light to the background, a light receiver 14 that receives light of the light source 12, a gyro sensor 30 for detecting an irradiation spot of the light of the light source 12, and a control device 40 that generates a background image based on an image capturing result of the imaging camera 20, creates a gas concentration distribution based on a light receiving result of the light receiver 14 and a detection result of the gyro sensor 30, and superimposes the gas concentration distribution on the background image.

An appearance inspection apparatus includes a shape measurement unit configured to measure the three-dimensional shape of a weld and a data processor configured to process sample shape data and shape data acquired by the shape measurement unit. The data processor includes a first learning data set generator configured to generate a plurality of first learning data sets based on the sample shape data, a second learning data set generator configured to generate a plurality of second learning data sets based on the first learning data sets, a determination model generator configured to generate multiple types of determination models using the second learning data sets, and a first determination unit configured to determine whether the shape of the weld is good or bad based on the shape data and one of the determination models.

Provided is a method for removing character background in a color image that obtains an image for printing evaluation by removing a background design of a character from the color image of a printed object on which the character has been printed. The method includes separating a color input image into a character part and a background part, calculating a discriminant function for separating pixels of the character part and pixels of the background part based on pixel values, and generating a background-removed image by removing the background part from the input image by using the discriminant function. Moreover, an installation adjustment method of a line camera including adjusting, based on a signal acquired by capturing an installation adjustment chart fixed to the inspection drum, an installation position of the line camera that acquires an image of a large-size printed object arranged on an inspection drum, is executed by using an installation adjustment chart wherein a plurality of patterns formed by white background and black vertical lines are arranged by shifting in a vertical direction so that the vertical lines continue horizontally only in a predetermined rectangular region that is elongated in a scan line direction of the line camera.

Disclosed herein is a method for inspecting a transparent film. The method comprises irradiating an inspection target with light using a polarizer, receiving light that is reflected by the inspection target and passes through an analyzer by a line scan camera, synthesizing an amplitude and a phase of wavelength of the light into an intensity of light, comparing the intensity of the light with predetermined intensities of light for inspection targets having different thicknesses; and detecting a defect of the inspection target based on the compared intensity with the predetermined intensities. It can be determined whether there is a transparent film, and the thickness of the transparent film can be measured in a large area. The inspection is carried out in real-time after the transparent film is formed, such that if a defect is generated, it can be fed back immediately to thereby reduce defects. In this case, the processing cost can be saved.

The invention discloses a new apparatus to photograph glasses in multiple layers for taking high quality photo images with scratch, crash, black/white defect, lack, crack, pin-hole, concave edge and raised edge, bubble and smudge defects on the surface-layer, backside-layer or/and mid-layer of the glasses. The invention also introduces flexible and expendable photographing hardware architecture that will meet various customers inspecting defects requirements and speed requirements.

An optical scanning system adapted to scan a sample on a chip is provided. The optical scanning system includes at least one optical scanning head, at least one scanning light source, a light receiving device and a processor. Each of at least one optical scanning head includes a focusing light source, a first optical guiding structure, and a control unit. The first optical guiding structure is configured to guide the focusing light emitted from the focusing light source to travel to the sample, and the first optical guiding structure is configured to guide the at least one scanning light emitted from the at least one scanning light source to the sample to generate a secondary light. The control unit is configured to control the first optical guiding structure to keep the focusing light and at least one scanning light focusing on a surface of the chip. The light receiving device receives the secondary light and generates a scanning electronic signal. The processor is electrically coupled to the light receiving device to dispose the scanning electronic signal.

A wire melting trace photographing apparatus according to an embodiment includes a wire fixing member connected to one side of a wire including a melting trace and fixing the wire, and a photographing member capable of photographing the melting trace in a circumferential direction of the wire. A deep learning-based electric wire-melting trace determination apparatus according to an embodiment includes an image obtaining unit configured to obtain a wire image for each rotation angle, a trained model application unit configured to calculate a determination probability of the wire image for each rotation angle, a melting trace analysis unit configured to analyze information related to a determination probability of a melting trace included in the wire, and a melting trace determination unit configured to determine the melting trace included in the wire according to a set determination condition.

A terahertz scanning reflectometer system is described herein for in-situ measurement of polymer coating thickness, semiconductor wafer's surface sub-surface inspection in a non-destructive and non-invasive fashion with very high resolution (e.g., 25 nm or lower) and spectral profiling and imaging of surface and sub-surface of biological tissues (e.g., skin) in a non-invasive fashion.

A measurement device includes mechanical support elements (101-104) for supporting a sample well, other mechanical support elements (105-109) for supporting a measurement head (112) suitable for optical measurements, and a control system (111) configured to control the measurement head to carry out at least two optical measurements from at least two different measurement locations inside the sample well, where each measurement location is a center point of a capture range from which radiation is captured in the respective optical measurement. The final measurement result is formed from the results of the at least two optical measurements in accordance with a pre-determined rule. The use of the at least two optical measurements from different measurement locations reduces measurement variation in situations where the sample well (153) contains a piece (158) of sample carrier.