A scanning illuminating device includes an emission center from which radiation is emitted in an illuminating sector. A cylindrical ring is centered on the source and is rotatably movable about a first axis. The ring includes a plurality of slits regularly distributed about its axis of rotation and having the same angular amplitude . A cylinder portion is centered on the source and is rotatably movable about a second axis crossing the first axis at the center and forming a nonzero angle therewith. The cylinder portion includes a slit having an angular amplitude . A first device control of the rotation of the ring, defining an elementary angular step as such that an integer N1 other than 1 meets the condition =N1.Math.. A second device controls the rotation of the ring portion defining an angular step such that an integer N2 other than 1 meets the condition =N2.Math..

The present specification relates to a method for localizing or tracking emitters in a sample, wherein the sample is illuminated with an intensity distribution of an illumination light comprising a local minimum, wherein light emissions of a measuring emitter induced or modulated by the illumination light are detected, and wherein a position of the measuring emitter is estimated based on the detected light emissions and assigned positions of the local minimum, wherein the estimated position of the measurement emitter is corrected based on calibration data dependent on a speed and/or an acceleration of a measurement scanning movement of a scanning device, or wherein an actuation signal of the scanning device is adapted based on calibration data, wherein the calibration data comprise localization data of a calibration emitter obtained by means of at least one calibration scanning movement of the scanning device.

A subsurface defect detecting device for cylindrical components and method thereof are provided. The subsurface defect detecting device for cylindrical components includes: an electric rotating platform, a three-jaw chuck, a first linear supporting base, and a second linear supporting base. The three-jaw chuck is mounted on the electric rotating platform, and the three-jaw chuck is configured to fix a workpiece to be detected. The first linear supporting base and the second linear supporting base are arranged close to the electric rotating platform, and the first linear supporting base and the second linear supporting base are in contact with each other and are perpendicular to each other. The present disclosure achieves optimal laser ultrasound detection angles by incorporating a moving device, determining the appropriate laser ultrasound detection angle for cylindrical components with different curvature radii, thereby reducing the impact of uneven surfaces on the detection results.

Apparatus and associated methods relate to autonomous devices configured to map surface topologies of airfoils of gas turbine engines. The autonomous device moves across the airfoil while remaining coupled thereto while sensing the surface topology of the airfoil using an optical gel sensor via an array of airfoil contacting members. The optical gel sensor includes an optical gel, having nominally planar opposite surfaces defining a nominal gel thickness extending over an image area. A lighting element illuminates the optical gel from an end of the flexible optical gel. A plurality of airfoil contacting members extend between the flexible optical gel and the airfoil, thereby distorting the flexible optical gel in response to changes in the surface topology of the airfoil. A two-dimensional imager images the flexible optical gel over the image area, thereby creating a two-dimensional image that is indicative of the surface topology.

According to an embodiment, an optical apparatus includes: an illumination portion, a light receiving portion, and a processor. The illumination portion is configured to illuminate an object with light. The illumination portion is configured to illuminate a first illumination point of the object with light having a first wavelength and illuminate a second illumination point different from the first illumination point of the object with light having a second wavelength. The light receiving portion is configured to move relative to the object while maintaining a positional relationship with the illumination portion and is configured to receive light that passed through the first illumination point of the object and light that passed through the second illumination point. The processor is configured to image the object by light reception signals of the light that passed through the first illumination point and the second illumination point.

The inventions provide microscopes for imaging samples within wells of multi-well plates. Microscopes of the disclosure include a beam homogenizer system that shapes a beam from a light source into a shape specific to the bottom of a well of a multi-well plate. In particular, microscopes of the disclosure can illuminate wells for imaging by passing light through a prism that is beneath the sample. The light enters the prism from the side and as refracted into the well at a steep angle such that the light only illuminates about a bottom ten microns of the well. The beam homogenizer shapes the light from the light source so that, instead of hitting the prism as a spot with an irregular shape, the light enters the prism in a substantially rectangular pattern with homogeneous optical power level over the pattern.

A method for determining the refractive index profile of a preform when the RIP is not substantially symmetrical. (i) The preform is scanned, starting with a first projection angle, and raw data are created representing the object through measured data. (ii) Optionally, the object is rotated and step (i) repeated iteratively until all projection angles have been scanned and all measured data have been created. (iii) The measured data are processed to form a sinogram and, if the optional step (ii) has been completed, the method proceeds to step (v). (iv) The object is rotated and steps (i) and (iii) are repeated iteratively until all projection angles have been scanned. (v) A 2D RIP is calculated. (vi) A line section of interest is selected within the 2D RIP. (vii) A fitting procedure is applied to the line section of interest. (viii) Finally, refractive index steps/gradients and dimensions are determined.

Provided is an image sensor including a plurality of pixels provided in an array, wherein each of the plurality of pixels includes a plurality of sub-pixels, and wherein the plurality of sub-pixels are provided such that electric charges, generated from pixels among the plurality of pixels provided perpendicular to a moving direction of an object, accumulate while moving in the moving direction of the object at a same speed as the object.

An apparatus for detecting matter including: a light source arrangement adapted to emit a first and a second set of light beams towards a first detection zone through which the matter is provided. A spectroscopy system adapted to receive and analyse light which is reflected and/or scattered by matter in the first detection zone. A laser triangulation system including, a laser arrangement adapted to emit a line of laser light towards a second detection zone. A camera-based sensor arrangement configured to receive and analyse light which is reflected and/or scattered by matter in the second detection zone. The received light of the spectroscopy system completely or partially intersects the received light of the camera-based sensor arrangement and/or the line of laser light.

The inventions provide microscopes for imaging samples within wells of multi-well plates. Microscopes of the disclosure include a beam homogenizer system that shapes a beam from a light source into a shape specific to the bottom of a well of a multi-well plate. In particular, microscopes of the disclosure can illuminate wells for imaging by passing light through a prism that is beneath the sample. The light enters the prism from the side and as refracted into the well at a steep angle such that the light only illuminates about a bottom ten microns of the well. The beam homogenizer shapes the light from the light source so that, instead of hitting the prism as a spot with an irregular shape, the light enters the prism in a substantially rectangular pattern with homogeneous optical power level over the pattern.